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Jem 2800 transmission electron microscope

Manufactured by JEOL
Sourced in Japan

The JEM-2800 is a transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples. The JEM-2800 utilizes an electron beam to illuminate and interact with the specimen, generating detailed images and data.

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3 protocols using jem 2800 transmission electron microscope

1

Characterization of Gd@BSA Nanoparticles

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The high-resolution transmission electron microscopy (HRTEM) images of Gd@BSA NPs were recorded using a JEM-2800 transmission electron microscope (JEOL, Japan) at an accelerating voltage of 200 kV. Then, elemental mapping analysis of the prepared particles was performed by an energy-dispersive X-ray spectroscopy (EDX) detector attached to HRTEM. The hydrodynamic diameters and size distributions of the samples were measured using dynamic light scattering (DLS, Nanozetasizer from Malvern). The absorbance spectra were recorded on the UV-Vis-NIR spectrophotometer (UV2600, Shimadzu, Japan). The crystalline structure and phase purity analysis was performed by X-ray diffraction (XRD) using a Aeris X-ray benchtop diffractometer (Malvern Panalytical, Netherlands).
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2

Physicochemical Characterization of Nanomaterials

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Zeta potential analysis and dynamic light scattering (DLS) analysis were conducted on ZetaPlus 90 Plus/BI-MAS (Brook haven, USA). Transmission electron microscopic (TEM) images were captured on JEM-2800 transmission electron microscope (JEOL Ltd., Japan). MTT and ELISA assays were conducted on Victor X3 Multimode Plate Reader (PerkinElmer, USA). The gel electrophoresis was performed with Mini-Protean Tetra Cell and PowerPac™ Basic Power Supply (Bio-Rad, USA). The intracellular fluorescence images were acquired through TCS SP5 confocal laser scanning microscope (CLSM) (Leica, Germany). Flow cytometry was accomplished on Coulter FC-500 flow cytometer (Beckman-Coulter, USA). The UV–Vis absorption spectra were recorded with UV-3600N UV/VIS spectrophotometer (Shimadzu, Japan). The fluorescence spectra were recorded with F-4700 spectrofluorophotometer (Hitachi, Japan).
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3

Characterization of Novel Nanomaterials

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Fluorescence (FL) and UV-vis spectra were recorded on a Jasco FP-6500 fluorescent spectrofluorometer (Jasco, Japan) and Shimadzu UV-2550 spectrophotometer (Tokyo, Japan), respectively. FT-IR spectrum was recorded on a Nicolet 5700-IR spectrometer (Waltham, MA, USA). X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS) analysis were carried out on a Thermo ESCALAB 250XI X-ray photoelectron spectrometer (USA). TEM images were conducted on a JEM-2800 transmission electron microscope (JEOL Ltd., Tokyo, Japan). Fluorescence lifetime was measured using an FLS980 time-resolved spectrometer (Edinburgh, UK) with an excitation wavelength of 365 nm.
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