Jsm 6360lv scanning electron microscope
The JSM-6360LV is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of samples. The JSM-6360LV features a low vacuum mode, which allows the observation of non-conductive samples without the need for complex sample preparation. The instrument is equipped with a tungsten electron source and can achieve a resolution of up to 3.0 nm.
Lab products found in correlation
34 protocols using jsm 6360lv scanning electron microscope
Microcapsule Morphology Analysis by SEM
Yeast Cell Adhesion Visualized by SEM
107 yeast/mL in RPMI 1640) was added to the wells of 24-well
polystyrene plate and incubated for 2 h at 37 ºC in a shaker at 120 rev/min. After 2
h, the medium was aspirated, and non-adherent cells were removed by washing twice
with PBS. Samples were fixed with 2.5% glutaraldehyde diluted in 0.1 M cacodylate
buffer (Sigma, St. Louis, Missouri, USA) and dehydrated with an ascending series of
alcohol solutions. Samples were kept in a desiccator until the bases of the wells
were removed for analysis. Prior to observation, the bases of the wells were mounted
onto aluminum stubs, sputter coated with gold and observed with a JEOL-JSM 6360 LV
scanning electron microscope (Jeol Ltd., Tokyo, Japan) at the Electron Microscopy
Center, State University of Paraná, Maringá, Brazil.
Scanning Electron Microscopy of RBL-2H3 Cells
SEM Imaging of Cell Morphology
Anther Development and Pollen Viability Analysis
SEM Analysis of Spore Morphology
Characterization of Agronomic Traits in F1 Hybrids
Thoracic Aorta Histological Analysis
Scanning Electron Microscopy of Fixed Cells
SEM Analysis of Optimized SLNs
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