Nicolet 6700 ft ir

A Fourier transform infrared spectroscope (Nicolet 6700 FT-IR; Thermo Fisher Scientific, Agawam, MA, USA) was used to analyze the different compositions of wood flour and monosaccharides at a resolution of 4 cm⁻¹ with 32 scans.

FT-IR
spectra were obtained by an FT-IR spectrophotometer (Nicolet 6700
FT-IR, Thermo Scientific Inc., USA) using an attenuated total reflectance
(ATR) technique (Golden Gate, spectra Tech). Spectra were recorded
between 4000 and 525 cm^–1 with a spectrum resolution
of 4 cm^–1. All spectra were averaged over 10 scans.

The average hydrodynamic particle size and the size distribution were measured by dynamic light scattering (DLS) on a Nanosizer Nano Zetasizer instrument (Malvern Instruments, Malvern, UK), after the particles were dispersed in ethanol via ultrasonication for 30 min. The lateral diameter of the LDH nanoparticle was examined by scanning electron microscopy (SEM) on a JEOL 6300 SEM. LDH samples were dispersed in 75% ethanol solution via ultrasonication for 10 mins, and then, the SEM images were taken at 10–15 kV with magnifications of 20,000–80,000. Powder X-ray diffraction (XRD) patterns were recorded on a Rigaku Miniflex X-ray Diffractometer using Co Kα source (λ = 0.178897 nm) at a scanning rate of 0.02°/s (2θ) from 2θ = 2° to 2θ = 80°. Fourier transform infrared (FTIR) spectra were obtained on a Nicolet 6700 FTIR (Thermo Scientific, Waltham, MA, USA) in the range of 4000–400 cm⁻¹ by accumulating 32 scans at a resolution of 4 cm⁻¹. Inductively coupled plasma optical emission spectrometry (ICP-OES) was conducted on a Varian axial Vista CCD Simultaneous (Varian, Mulgrave, Australia) with the wavelength used for Mg and Al at 383.829 and 237.312 nm, respectively. The content of C, N and H was measured on a CHNS–O analyser (Flash EA 1112 Series, Thermo Scientific). The drug loading capacity was calculated as the drug mass divided by the LDH–drug complex mass.

Various analytical techniques were used to characterize the as‐prepared InVO₄. SEM (Hitachi S‐4100) was used to analyze the surface morphology of the material. Prior to SEM measurements, samples were mounted on a platform of carbon film, followed by platinum coating for 5 min with a magnetron sputter. TEM (JEM‐2100, JEOL, Japan) was used to study the detailed morphological and diffractions of InVO₄ hierarchical structures. X‐ray powder diffraction patterns were recorded using a Rigaku D/max‐2500 X‐ray diffractometer (Japan) with a Ni‐filtered Cu Kα radiation of (λ) 1.54178 Å. Fourier‐transform infrared spectroscopy/Attenuated total reflection (Thermo Nicolet 6700 FTIR), UV–visible diffuse reflectance spectroscopy (DRS) (TU−1901, Pgener al), and X‐ray photoelectron spectra (ESCA Lab 220i‐XL, VG Scientific XPS), were collected. For XPS, MgKα X‐ray was an excitation source with a base pressure of ≈3 × 10⁻⁹ mbar. Atomic force microscopy (AFM) analysis was performed by Bruker Corporation of Germany using a DI Multimode 8 scan microscope to measure the surface roughness of the materials.

¹H and ¹³C NMR spectra were measured at 600 MHz (Bruker AVANCE 600) with DMSO-d₆ as the solvent. High-resolution mass spectra were performed on a Shimadzu LCMS-IT-TOF mass spectrometer using electrospray ionization (ESI). Elemental analysis was performed on a Vario Micro cube elemental analyzer. Thermal property measurements were carried out on a TGA/DSC Mettler Toledo calorimeter equipped with an auto cool accessory. Impact and friction sensitivity measurements were made using a standard BAM Fall hammer and a BAM friction tester. X-ray powder diffraction (PXRD) analysis was performed on a Bruker D8 Advance X-ray powder diffractometer. FTIR spectra at different temperatures were recorded (transmission mode) using a NICOLET 6700 FTIR (Thermo, Waltham, MA, USA), with a deuterated triglycine sulfate (DTGS) detector. Raman measurements were performed with an FT-Raman spectrometer (DXR smart Raman). The heats of formation and detonation properties were calculated with the Gaussian 09 and Explo5 (version 6.02) software, respectively.

The characterization of CQDs was performed
by transmission electron microscopy (TEM) (S/TEM Titan 80–300
operated at 300 kV, Field Electron and Ion Company), combustional
elemental analysis (PerkinElmer 2400 Series II CHNS/O, PerkinElmer),
thermogravimetric analysis (TGA) (TGA 8000, PerkinElmer), Raman (inVia
Confocal Raman microscope, Renishaw), UV–Vis (HP 8452A UV–Vis
Diode Array Spectrophotometer, Hewlett Packard), fluorescence spectroscopy
(SpectraMax i3x, Molecular Devices and FluoroMax Plus, Horiba Scientific),
Fourier-transform IR (FT-IR) (Nicolet 6700 FT-IR, Thermo Fischer Scientific),
and X-ray photoelectron spectroscopy (XPS) (PreVac EA15, PreVac).
Additionally, by applying dynamic light scattering (DLS), nanoparticle
size and zeta-potential were determined (Zetasizer Nano S90, Malvern
Panalytical).