Jsm 7100f fesem
The JSM 7100F FESEM is a field emission scanning electron microscope (FESEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of samples. The JSM 7100F FESEM uses a field emission electron gun to generate a high-brightness, high-resolution electron beam that can be focused on the sample surface, enabling detailed topographical and compositional information to be obtained.
Lab products found in correlation
2 protocols using jsm 7100f fesem
Biofilm Characterization by SEM
Characterization of PLGA Nanocarriers
spectra of PLGA conjugates
containing VP were measured using a spectrophotometer (Cary 5000 UV–vis–NIR,
Varian Inc.). The size distribution and ζ potentials of the
PLGA samples were measured with a Zetasizer Nano Series instrument
(Malvern Instruments). The morphology of PLGA nanocarriers was determined
using transmission electron microscopy (TEM, Philips CM10) and scanning
electron microscopy (SEM, JEOL JSM 7100F FESEM).
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