Nano zs 90 nanosizer
The Nano-ZS 90 Nanosizer is a dynamic light scattering (DLS) instrument designed for the characterization of nanoparticles and macromolecules in liquid suspensions. The instrument measures the hydrodynamic size and size distribution of particles with a size range from 0.3 nanometers to 10 micrometers.
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10 protocols using nano zs 90 nanosizer
Nanoparticle Characterization by TEM, SEM, and Spectroscopy
Nanoparticle Characterization by Advanced Techniques
Curcumin-Paclitaxel Nanoparticle Production
The morphology of PC NDs was inspected by a transmission electron microscope (JEOL, Ltd., Japan) and a scanning electron microscope (FESEM, S4800, Hitachi Co. Ltd., Tokyo, Japan). Fluorescence spectroscopy was performed using a Shimadzu RF-5301 PC spectrophotometer. UV–vis absorption spectra were obtained using a Shimadzu 3100 UV–vis spectrophotometer. Fourier transform infrared (FTIR) spectra were performed with a Nicolet AVATAR 360 FTIR instrument. X-ray powder diffraction (XRD) investigation was carried out on a Rigaku X-ray diffractometer using Cu Kα radiation. A Nano-ZS 90 Nanosizer (Malvern Instruments Ltd., Worcestershire, United Kingdom) was used to determine the size distribution and zeta potential of PC NDs.
Characterization of Micelle Morphology
Nanoparticle Morphology Characterization
Characterization of Mesoporous Silica Nanoparticles
Comprehensive Characterization of Nanocarrier Formulations
Characterization of DTX-mPEG-PDLLA Micelles
Next, the particle size and zeta potential of DTX-mPEG-PDLLA were measured by Nano-ZS 90 Nanosizer (Zetasizer Nano; Malvern, Panalytical, United Kingdom) after dilution with distilled water. Some DTX-mPEG-PDLLA micelle suspension was dropped on the special copper net for the transmission electron microscope (TEM; Tecnai G2 Spirit BioTWIN, Huck Institutes of Life Sciences, University Park, PA, United States) and allowed to dry naturally. The morphology of DTX-mPEG-PDLLA was observed after the sample was prepared.
Comprehensive Characterization of Nanoparticles
Comprehensive Nanomaterial Characterization
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