A Cryo-TEM image was obtained according to a previous report [42 (link)] using a JEM-2100F field-emission TEM apparatus (JEOL Co., Ltd., Tokyo, Japan) with an accelerating voltage of 120 kV. For Cryo-TEM, 2 μL of the nanoparticle suspension (40 mM total lipids in Nuclease free water) was deposited onto a 200-mesh copper grid covered with carbon film (Nisshin EM Co., Ltd., Tokyo, Japan). After removing the excess liquid using filter paper, the sample was rapidly vitrified by immersion in liquid ethane using a Leica CPC cryo-preparation chamber (Leica Microsystems, Wetzlar, Germany). The grid with the vitrified thin film was placed on a sample holder that was maintained below −170 °C using liquid nitrogen. Images were recorded using a CCD camera.
Jem 2100f field
Manufactured by JEOL
Sourced in Japan
The JEM-2100F field emission scanning transmission electron microscope (FE-STEM) is a high-performance electron microscope designed for advanced materials analysis. It features a field emission gun and provides high-resolution imaging and analytical capabilities.
Automatically generated - may contain errors
Lab products found in correlation
Odyssey clx imaging system, by LI COR (2 mentions)
Fluorolog 3, by Horiba (2 mentions)
Uv 1800 spectrophotometer, by Shimadzu (2 mentions)
Nova 2300, by Thermo Fisher Scientific (2 mentions)
Nanoled, by Hamamatsu Photonics (2 mentions)
Pmt r928p detector, by Hamamatsu Photonics (2 mentions)
Fv1000 lsm confocal laser scanning microscopy, by Olympus (2 mentions)
Nano zsp, by Malvern Panalytical (1 mentions)
Gemini 500, by Zeiss (1 mentions)
Surpass electrokinetic analyzer, by Anton Paar (1 mentions)
Formvar carbon coated copper grid, by Ted Pella (1 mentions)
Lacey carbon grid, by Electron Microscopy Sciences (1 mentions)
Icon afm, by Bruker (1 mentions)
Quanta 3d, by Thermo Fisher Scientific (1 mentions)
8 protocols using jem 2100f field
1
Cryo-TEM Imaging of Nanoparticles
2
Multimodal Characterization of Nanostructures
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Transmission electron microscopy (TEM) images were obtained using a JEOL JEM-2100F field emission (FE) instrument. A drop of aqueous solution was dried on a carbon-coated grid, which had been made hydrophilic by glow discharge. SEM images were obtained using a FEI Nova 2300 field‐emission scanning electron microscope at an acceleration voltage of 10 kV. AFM imaging was performed on a Dimension 3000 using silicon cantilevers with a nominal spring constant of 40 N/m in light tapping mode. The extinction spectra of plasmonic nanostructures were obtained using a Shimadzu UV-1800 spectrophotometer. Fluorescence lifetime was measured using time correlated single photon counting (TCSPC implemented in Fluorolog-3, Horiba Jobin Yvon) with a 740 nm excitation source NanoLed® (impulse repetition rate 1 MHz) at 90º to the PMT R928P detector (Hamamatsu Photonics, Japan). Most of the fluorescence mappings were recorded using LI-COR Odyssey CLx imaging system. Luminex 200 system was employed to read the fluorescence signal from the microbeads. Cell imaging was performed using Olympus FV1000 LSM confocal laser scanning microscopy (785 nm excitation laser) under 40X water-immersion objective. Guava easyCyte was employed to acquire the flow cytometry data.
3
Comprehensive Characterization of Composite Membranes
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The SEM image was captured using SEM (Zeiss Gemini 500). The TEM image was captured using JEM 2100F field emission TEM (JEOL, Tokyo, Japan). The XPS was performed in ESCALAB 250Xi. The mechanical characterization of the composite membrane was conducted on a tensile-compressive tester (M5-2) with a loading rate of 1 mm/min. The membrane samples were cut into strips with a width of 2 mm and length of 8 mm. The Young’s modulus can be calculated by the slope of the linear region of the stress–strain curves and the toughness was determined by the area under the stress–strain curves. The reported tensile strength, modulus, and toughness were the averages of three samples. The Zeta potential of MXene was performed in solution system using a Zetasizer (Nano ZSP, Malvern Instruments Ltd., Malvern, UK) due to its good dispersibility in water. For the ANF, its DMSO dispersion is cast onto a silicon wafer and then immersed in water to form a free-standing nanofiber membrane. Zeta potential of the membrane system was measured by SurPASS Electro-kinetic Analyzer (Anton-Paar).
4
Characterization of Silica Nanoparticles
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The morphology of the produced silica NPs was investigated using a JEM-2100F field emission transmission electron microscope (JEOL, Tokyo, Japan). Also, the size of the prepared SiO2 NPs was about 69, 180, and 420 nm.
5
Multimodal Characterization of Nanostructures
6
Electron Microscopy Imaging of Extracellular Vesicles
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EVs were fixed with 1% glutaraldehyde solution for 5 min and washed with distilled water thrice. The fixed EVs were centrifuged at 13,000 × g for 3 min, based on previous protocols (Jung et al., 2020 (link)). Then, the supernatant was removed. Next, the samples were dehydrated in absolute ethanol for 10 min and placed on formvar‐carbon‐coated copper grids (TED PELLA, Inc., Redding, CA, USA). The grids were contrasted with 1% phosphotungstic acid for 1 min and then washed with distilled water thrice. The grids were dried off completely and then examined with a JEM‐2100F field‐emission electron microscope (JEOL Ltd., Japan). For cryo‐TEM, an aliquot of concentrated EVs was applied to the Lacey carbon grid (Electron Microscopy Science, Hatfield, PA, USA). The grids were stored in liquid nitrogen, transferred to a cryo‐specimen holder, and maintained at −180°C. Images were collected at a magnification of ×18,000 to ×29,000 on the Tecnai F20 Twin TEM operated at 200 kV.
7
Characterization of CNTs/Fe3O4-HPEI Nanocomposite
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Fourier transform infrared (FT-IR) spectra of CNTs/Fe 3 O 4 -HPEI was recorded on Nicolet Impact-420 Fourier transform infrared spectrometer in the range of 400 -4000 cm -1 . X-ray diffraction patterns were obtained by Bruker D8 Advance X-ray powder diffractometer using Kα (λ = 1.5404), the scanning range is 10 to 90 degrees. The morphology of CNTs/Fe 3 O 4 -HPEI was conducted by JEM-2100F field emission electron microscopy (TEM, JEOL, Japan). Thermogravimetric analyzer (TGA) measurement was performed by a TGA STA-409PC thermogravimetric analyzer under N 2 in the temperature range 30-800 ˚C with an increasing rate of 5 ˚C min -1 . The magnetic properties were measured using a vibrating specimen magnetometer (Squid-VSM) to the field strength of 20 KOe at room temperature.
8
Characterization of Carbide Nanomaterials
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Scanning electron microscopy (SEM, FEI Quanta 3D were employed to study the morphology and structure. Different carbides were dispersed in alcohol by sonication for 2 hr, and dropped onto a copper grid (2 μm) mesh size. The TEM and HRTEM images were observed under a JEOL JEM-2100F field emission TEM (200 kV). X-ray diffraction (XRD, Bruker D8) was performed to study the crystallinity, using Co as source (35 mV, 40 kV) for powder diffraction. X-ray photoelectron spectroscopy (CHI) was used to study the surface element component of samples. 2 mm Al monochromatic source was employed to first scan a 500eV-50eV survey of wide range spectrum, followed with specific high-resolution Mo_3d, W_4f, and C_1s orbital scanning. Atomic force microscope (AFM, Bruker Icon AFM) was employed to scan the thickness of carbide flakes and investigate the surface roughness. Dispersed carbide sheets on silicon wafer were pick under optical microscope, and mapped with a silicon carbide tip at standard tapping mode.
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