Surface roughness of the spuncoat films was measured using atomic force microscopy (AFM, Dimension Icon, Bruker, Billerica, MA). Three film samples were analyzed with three spots per sample for a total of nine spots measured. The spot size was 50 μm × 50 μm, the scans were acquired with 256 samples per line, and images were analyzed with Nanoscope Analysis (Bruker). The root mean square (RMS) roughness was determined for each analyzed spot and the mean RMS roughness was 92.8 nm (S.D. = 10.7 nm, n = 9).
S 4700 2 fe sem
The S-4700-II FE-SEM is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples.
3 protocols using s 4700 2 fe sem
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