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Mfp 3d

Manufactured by Olympus

The MFP-3D is a versatile atomic force microscope (AFM) designed for high-resolution imaging and analysis of a wide range of samples. It provides precise measurements of surface topography, mechanical properties, and other material characteristics at the nanoscale level.

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Lab products found in correlation

2 protocols using mfp 3d

1

AFM Analysis of Modified Glass Samples

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Modified glass samples and unmodified controls were attached to glass microscope slides using double-sided adhesive tape and examined using an AFM microscope. All images were obtained using an Asylum Research atomic force microscope (MFP-3D). The MFP-3D was coupled to an Olympus IX50 inverted optical (IO) microscope to enable precise positioning of the AFM probe above the sample. The system is placed upon a TS-150 active vibration isolation table (HWL Scientific instruments GmbH, Germany), which was located inside an acoustic isolation enclosure (IGAM GmbH, Germany) to help eliminate external noise. All images were obtained in tapping mode using Olympus TR400PSA cantilevers. The cantilever spring constant was determined using the thermal noise method, which is software driven for the MFP-3D. Four areas from 3 samples of each modification were scanned in tapping mode over a 500-nm scan area.
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2

Atomic Force Microscopy Imaging of CNCs

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Atomic force microscopy (AFM) was performed with an Asylum Research MFP 3D mounted onto an Olympus IX 71 inverted fluorescence microscope. For images of CNCs, 100 µL of a 0.001 wt% aqueous suspension of CNCs was spin coated (3000 rpm, 1 min) onto an aqua regia-cleaned glass slide. The sample was scanned in intermittent contact mode in air, using Nanoworld SSS-NCH SuperSharp Silicon probes (nominal tip radius: 2 nm). Dried droplets were scanned in intermittent contact mode in air, using Olympus OMCL-AC200TS-R3 probes (nominal tip radius: <10 nm, and nominal spring constant: 9 N m -1 ) with 512 data points per line as well as 512 lines per scan following the CSA Z5100-17 standard [28] .
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