were acquired on a JEOL JEM-1011 microscope equipped with a thermionic
gun at an accelerating voltage of 100 kV and on a JEOL JEM-1400Plus
microscope working at 120 kV. Selected area electron diffraction (SAED)
patterns were acquired on a JEOL JEM-1400Plus microscope. The samples
were prepared by depositing 3 μL of a diluted nanocrystal suspension
in trichloroethylene (TCE) onto 200-mesh carbon-coated copper grids
and letting it dry slowly. The indexation of SAED data was performed
with the help of the CaRIne Crystallography software suite via a simulation
of the reciprocal atomic lattice. HRSEM images were acquired on a
JEOL JSM-7500FA scanning electron microscope (SEM). Optical images
were acquired on a ZETA-20 true color 3D optical profiler.