Jsm 7500f microscope

The actual loadings of Au in samples were measured by inductively coupled plasma optical emission spectrometry (ICP-OES, Spectro, SpectroBlue, Germany). The X-ray diffraction (XRD) patterns were obtained using Rigaku D/max-2500 (Rigaku, Japan) X-ray diffractometer (Cu Κα, λ = 1.5418 Å) to identify the crystal phase of catalysts. Scanning electron microscopy (SEM) images of the samples were got using a JSM-7500F microscope (JEOL, Japan). Transmission electron microscopy (TEM) and high resolution (HR) TEM images were obtained using a Tecnai G2F20 microscopy (FEI, Hillsboro, OR, USA) operated at 200 kV. Ultraviolet-Visible diffuse reflectance spectra (UV-Vis DRS) were collected using a SHIMADZU UV-3600 spectrophotometer (Shimadzu, Japan). The Fourier transform infrared spectra (FTIR) were recorded using a Nicolet MAGNA-IR 560 spectrometer (Nicolet, Wisconsin, USA). X-ray photoelectron spectra (XPS) were accepted using a Kratos Axis Ultra DLD Spectrometer (Kratos Analytical Ltd., Manchester, UK) with a monochromator of Al Kα source to determine the chemical states of Au and Fe. The H₂ temperature-programmed reduction profiles (H₂-TPR) were tested on a ChemiSorb 2720 (Micromeritics, Georgia, GA, USA) and the temperature programmed desorption profiles of ammonia (NH₃-TPD) were obtained using a chemBET TPD (Quantachrome, Florida, FL, USA).

SEM was performed using a JEOL JSM-7500F microscope. Contact angle measurements were conducted using a SurfaceTech GSA-X goniometer.

¹H-NMR spectra of the nucleating agents were recorded on a Bruker AVANCE-400 NMR nuclear magnetic resonance instrument (Shimadzu, Kyoto, Japan) which used chloroform as the solvent and tetramethylsilane (TMS) as the internal reference at room temperature. DSC studies were carried out using DSC 821e, (Mettler-Toledo, Zurich, Switzerland) under nitrogen atmosphere and the sample mass was kept at 8–10 mg. Each sample was heated to 300 °C and keep insulated for 5 min to eliminate the thermal history. Then the samples were heated and cooled at constant rates of 5/10/15/20 °C·min⁻¹, respectively. Field emission scanning electron microscopy was carried on FESEM, JSM-7500F microscope (JEOL, Akishima-shi, Japan). Thermogravimetric analysis (TGA) was performed on a Perkin-ElmerDiamond TGA calorimeter (Perkin-Elmer, Waltham, MA, USA) under a nitrogen purge stream at a flow rate of 20 mL·min⁻¹. Vacuum dried samples were subjected to be heated from 25 °C to 700 °C at the rate of 10 °C·min⁻¹. X-ray diffraction analysis was performed at room temperature by using an XRD D-8, (Brook, Karlsruhe, Germany). The experiments were operated from 2θ = 0° to 80° at a scanning rate of 2°·min⁻¹.

Powder XRD patterns were collected on a Rigaku X-ray diffractometer (MiniFlex600) with Cu Kα radiation. SEM images were obtained on Field-emission JEOL JSM-7500F microscope. TEM and HRTEM images were taken on Philips Tecnai G2 F20. ABF-STEM was performed on Titan Cubed Themis G2 300 (FEI) at an acceleration voltage of 200 kV. The XAS data were collected on BL14W1 beamline of Shanghai Synchrotron Radiation Facility and analyzed with software of Ifeffit Athena⁶² . ICP-AES measurements were conducted on a PerkinElmer Optima 8300. XPS was tested on a Perkin Elmer PHI 1600 ESCA system. Raman spectra were obtained on confocal Thermo-Fisher Scientific DXR microscope using 532 nm excitation. TGA was measured by a Netzsch STA 449 F3 Jupiter analyzer.

High resolution scanning microscopy was applied to determine the microstructure of the NLS and NLS+dodecyl. All sample was first lyophilized and suspended in water and then placed on a carbon-coated copper grid. The SEM images were obtained using a JEOL JSM-7500F microscope.

Au microwires were resuspended and sonicated in ethanol medium. And let it dry on an aluminium substrate at room temperature. Field emission scanning electron microscopy (FESEM) imaging was conducted by a JEOL JSM 7500 F microscope equipped with a cold field emission gun at an acceleration voltage of 15 kV. An in-lens detector collected secondary electrons and backscattered electrons signals and in-chamber multi-quadrant annular retractable solid-state detector, respectively. Element analysis was carried out using Zeiss Neon 40EsB (Carl Zeiss NTS GmbH, Oberkochen, Germany) at 20 kV equipped with energy dispersive x-ray spectroscopy, EDX (Inca software, Oxford Instruments). Image analysis on FESEM data was carried out using ImageJ 1.50i. Au microwires density was determined using the plugin ‘analyse particles’ function of ImageJ on a total of 20 SEM images of Au microwires samples. The aggregated size of Au microwires was calculated from a total of 2000 randomly picked aggregated Au microwires from FESEM images.