The X-ray diffraction (XRD, Bruker, Karlsruhe, Germany) patterns of Co3O4, AG, and the Co3O4/AG nanocomposite were recorded by a D8 Advance instrument (Cu Kα radiation, λ = 0.15418 nm) at the range of 10–80°, and the Raman spectra were acquired on an inVia Raman spectroscope (Renishaw, London, UK, Ar ion laser, λ = 514 nm) from 2400 to 200 cm−1. A Quanta FEG 250 scanning electron microscopy (SEM, FEI, Hillsboro, Oregon, USA) and one JEM-2100 transmission electron microscope (TEM, JEOL, Tokyo, Japan) were employed to observe the morphological structure. The N2 adsorption measurement was conducted on an Autosorb-iQ-MP instrument (Quantachrome, Norcross, GA, USA) at −196 °C. Meanwhile, the Brunauer–Emmett–Teller (BET) model was applied to evaluate the specific surface area of AG and the Co3O4/AG nanocomposite. The X-ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific, Waltham, MA, USA) analyses were measured by an Escalab 250Xi instrument (Al Kα radiation, 1486.6 eV) to confirm the chemical composition of samples. Lastly, the thermogravimetric (TG, Netzsch, Bavaria, Germany) analysis of the nanocomposite was studied on a STA409 PC thermogravimetric analyzer under air flow (30–700 °C, 10 °C min−1).
Invia raman spectroscope
Manufactured by Renishaw
Sourced in United Kingdom
The InVia Raman spectroscope is a high-performance analytical instrument designed for materials characterization. It utilizes Raman spectroscopy, a non-destructive technique, to provide detailed information about the chemical composition and structure of samples. The InVia system is capable of performing a wide range of applications, including materials science, pharmaceuticals, and life sciences research.
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Lab products found in correlation
K alpha, by Thermo Fisher Scientific (2 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Quanta 250 feg scanning, by Thermo Fisher Scientific (1 mentions)
Jem 2100 transmission, by JEOL (1 mentions)
D8 advance, by Renishaw (1 mentions)
Sta 409pc thermogravimetric analyzer, by Netzsch (1 mentions)
Peakfit v4, by Grafiti LLC (1 mentions)
Neon 40, by Zeiss (1 mentions)
Dm 2500 m microscope, by Leica (1 mentions)
Ultradry, by Thermo Fisher Scientific (1 mentions)
Dimension icon pt, by Bruker (1 mentions)
Axs d8 advance, by Bruker (1 mentions)
Tga sdta 851, by Mettler Toledo (1 mentions)
Titan cube g2 60 300, by Thermo Fisher Scientific (1 mentions)
Keithley 4200, by Tektronix (1 mentions)
S 4700, by Hitachi (1 mentions)
D max 2500v, by Rigaku (1 mentions)
Uv 3600 plus spectrophotometer, by Shimadzu (1 mentions)
Grand arm, by JEOL (1 mentions)
Asap 2020 accelerated surface area and porosimetry instrument, by Micromeritics (1 mentions)
11 protocols using invia raman spectroscope
1
Structural Characterization of Co3O4/AG Nanocomposite
2
Raman Spectroscopy of Graphene Samples
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Analysis of the graphene samples was carried out using an inVia Raman spectroscope (Renishaw, New Mills, UK). Raman spectra were collected using an argon laser with a wavelength λ = 532 nm, the exposure time was 10 s, and the signal was averaged from three repeated expositions per spot. The laser output power was 29.3 mW but during the raman spectra acquisition only 10% of the output power was used. Raman scattering was observed for the 1100–3100 cm−1 wavenumber range. The obtained raman spectra were processed using the PeakFit v4.12 software (Systat Software Inc., London, UK). Gauss–Lorentz curves were used for spectra deconvolution. Maximum intensities obtained from the deconvolution were taken for the calculation of characteristic peak ratios of graphene which were used in further analysis.
3
Comprehensive Characterization of Quantum Probes
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Characterization of quantum probe was done using FESEM, EDX, and TEM. Characterization of nano-dendrites was done with FESEM, EDX, TEM, XRD, and Raman spectroscopic analysis. Additional characterization for oxygen vacancies was carried out using XPS and EPR. Morphology of the samples was analyzed using FESEM images. Elemental analysis was done using XRD and EDX. Crystallite size and crystallinity of the particles was determined using XRD. Particle size was determined using TEM and phases of metal oxide were determined using XRD and TEM lattice spacing “d”. HRTEM analysis was done in order to get information about shape, size, and inter-planer distances of lattice of the quantum probe66 (link). Images were analyzed using the ImageJ software. The nanostructures formed were then examined using BWTEK Handheld NanoRam device and Renishaw inVia Raman spectroscope at 785 nm wavelength. Since our experiment was for cell lines in vitro, 785 nm was chosen for its compatibility for biological samples. Raman spectra of native sample and sample with nanostructures were obtained
4
Graphite Flake Functionalization and Characterization
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Natural graphite flake from Alfa Aesar-10 mesh, 99.9% (metal basis), furfuryl amine from Fluka. Ethanol, THF and acetone (technical grade), HCl (37%). XRD measurements were performed with AXS D8 Advance from Bruker, using cupper (K-alpha) radiation with a wavelength of 0.154 nm, 2θ angle from 20 to 80° in 0.02° steps and step time 3 s. TGA was carried out with TGA/SDTA851 from the Mettler Toledo device. The heating rate and Argon stream were 5 K per minute and 55 mL per minute, respectively. SEM images were taken by a “NEON 40” from Zeiss (Carl Zeiss Microscopy Deutschland GmbH). EDX was done in high current mode and the detector was an “UltraDry” from Thermo Fisher Scientific Inc. AFM device was “Dimension Icon PT” from Bruker. We used Peak Force Tapping in Air mode. Contact angles were measured by a Krüss Drop shape Analyzer 25e. All Raman investigations in this work were performed with a Renishaw In-Via-Raman spectroscope (Renishaw plc, United Kingdom) with Leica DM 2500 M microscope at a wavelength of 532 nm (He/Ne laser). The X-ray photoelectron spectroscope Omicron ESCA+, of the company Omicron Nanotechnology system, which is integrated with the PIA-SIS of the University of Paderborn, was used. It works with an aluminum Kα-X-ray source which delivers monochromatic radiation of 1486.7 eV.
5
Raman Spectroscopy of Carbon Nanomaterials
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Raman spectroscopy was carried out on a Renishaw inVia Raman spectroscope. The measured samples used in this project normally contained carbon nanotubes, graphene oxide, or reduced graphene oxide. The specimens were either in the solid state or dispersed in pure water (Milli‐Q) or a water/ethanol (1:1) mixture. During the measurement, carbon nanomaterials samples were deposited on an aluminum plate substrate. In some cases, silicon wafers or a glass lens were also used as the substrate. The input wavelength was set at 830 nm for SWNTs and their composite samples. For the hybrid 1 nanocomposite and its glucan derivative, spectra at 514 nm were also recorded. More than ten repeats were applied in the Raman spectroscopy measurements to achieve sufficient signal‐to‐noise ratios, and the beam was focused on at least three different positions across the specimen; these spectra were averaged to obtain representative peaks of the sample.
6
Characterization of Ag Nanoparticles on Graphene
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For the characterization of Ag nanoparticles on graphene, a Quanta 400F scanning electron microscope (FESEM) was used to obtain high-resolution images of the structures down to the nanoscale. A KLA-TENCOR P6 surface profiler was then used to measure the thickness of the Ag nanoparticles (Table 2 ), and a Renishaw InVia Raman spectroscope was used to measure the Raman spectra of the samples. Finally, CST Microwave Studio simulation software was used to simulate the absorption characteristics of the drawn samples.
Measurement of the height of the Ag nanoparticles deposited on the graphene surface using the surface profiler
| Height of Ag nanoparticles from graphene surfaces (nm) | Samples | |
|---|---|---|
| 2.5 min | 5.0 min | |
| 1st reading | 326.45 | 515.54 |
| 2nd reading | 156.98 | 416.01 |
| 3rd reading | 172.14 | 403.21 |
| 4th reading | 216.12 | 443.44 |
| 5th reading | 302.52 | 335.68 |
| Average | 234.84 | 422.78 |
7
Characterization and Sensing Properties of MoS2 Nanosheets
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The morphologies of the synthesized MoS2 nanosheets were investigated through transmission electron microscopy (TEM, Titan Cube G2 60-300, FEI company). X-ray diffraction (XRD, Rigaku) was conducted to identify the crystal phase of the synthesized MoS2 nanosheets with Cu–Kα radiation (λ = 1.5418 Å) at a current of 40 mA and voltage of 40 kV. For performing chemical-information Raman spectroscopy (inVia Raman spectroscope, Renishaw), X-ray photoelectron spectroscopy (XPS, K-alpha, Thermo Scientific) with an Al–Kα radiation (hν = 1486.6 eV) was used to examine the compositions of the MoS2 nanosheets. The morphological structures of the MoS2/SWCNT-based gas sensor samples were characterized by field-emission scanning electron microscopy (FE-SEM, Hitachi, S-4700) and energy-dispersive X-ray spectroscopy (EDS).
The electrical properties of the sensors were measured using a semiconductor parameter analyzer (Keithley-4200, Keithley Instruments, USA). NO2, CO, H2S, NH3, acetone, and ethanol gases were individually injected into the sensing chamber to analyze the resistance of the sensors toward them; the sensors were placed 2 cm from the gas inlet, and gas-sensing measurements were carried out at room temperature and under 25% relative humidity.
The electrical properties of the sensors were measured using a semiconductor parameter analyzer (Keithley-4200, Keithley Instruments, USA). NO2, CO, H2S, NH3, acetone, and ethanol gases were individually injected into the sensing chamber to analyze the resistance of the sensors toward them; the sensors were placed 2 cm from the gas inlet, and gas-sensing measurements were carried out at room temperature and under 25% relative humidity.
8
Multi-Technique Characterization of Materials
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Morphologic and EDS mapping images were collected using a Zeiss Ultra 55 field emission scanning electron microscope. TEM analyses were conducted with an FEI Tecnai G2 20 microscope at 200 kV. Atomic-resolution STEM-HAADF images and EELS spectra were obtained on an FEI Titan G2 60-300 STEM/TEM at 300 kV with a field emission gun or on a JEOL Grand ARM with double spherical aberration correctors. XRD patterns were collected using Rigaku D/MAX 2500 V with Cu Kα radiation (1.5418 Å). XPS analysis was performed on an ESCALab MKII spectrometer with Mg Kα X-ray as the excitation source. Raman spectroscopic characterizations (Renishaw inVia Raman spectroscope) experiments were performed using a 514 nm laser. N2 adsorption–desorption isotherms were recorded on an ASAP 2020 accelerated surface area and porosimetry instrument (Micromeritics), equipped with automated surface area. Barrett–Emmett–Teller methods were used to calculate the surface area. The XAS spectra of Fe and Cu K-edge were measured in a fluorescence mode at the beamline BL14W1 of the Shanghai Synchrotron Radiation Facility in China. The concentrations of ions were analyzed by a Shimadzu UV-3600 plus spectrophotometer. The detailed measuring processes are described in detail in the Supplementary Information.
9
Characterization of CGO and CGOA Materials
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The surface morphology of CGO and CGOA were characterized by a Quanta FEG 250 field emission scanning electron microscope (SEM, FEI, Hillsboro, OR, USA). The surface of all samples was coated with gold prior to SEM observation. The X-ray diffraction (XRD) patterns were performed on a D8 advance diffractometer (Bruker, Karlsruhe, Germany) with Cu Kα radiation source (λ = 0.15418 nm), and patterns were recorded at 2θ in the range of 10–30° with a scanning rate of 10°·min−1. Raman spectrum of CGOA was recorded from 2000 cm−1 to 900 cm−1, using a inVia Raman spectroscope (Renishaw, London, UK) with 633 nm laser excitation at room temperature. The surface functional groups of samples were determined by Fourier transform infrared (FT-IR) spectroscopy using a Nicolet Nexus 470 FT-IR Spectrometer ranging (Thermo Fisher Scientific, Waltham, UK) from 4000 cm−1 to 400 cm−1. X-ray photoelectron spectroscopy (XPS) analyses were also carried out on an Escalab 250Xi (Thermo Fisher Scientific, Waltham, UK) photoelectron spectrometer at ambient temperature.
10
Comprehensive Material Characterization
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Visible–near-infrared (Vis–NIR) spectra were recorded using an ultraviolet–visible–near-infrared (UV–Vis–NIR) spectrometer (UV-1800PC, AOE Instruments, Shanghai, China). Raman analysis, including OM, was performed using an in-Via Raman spectroscope with a 514 nm excitation line (Renishaw, Gloucestershire, UK). Chemical and morphological analyses were performed using SEM (TESCAN VEGA3, Brno–Kohoutovice, Czech Republic) and XPS (K-alpha (Al Kα), Thermo Fisher, Waltham, MA, USA).
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