The PbTe structure was obtained by using the XRD–D8 Advance (Bruker, Karlsruhe, Germany) with Cu-Kα line wavelength 1.54 Å. The morphological study of the synthesized material under higher magnification was done by SEM from JEOL (JSM-6400, Tokyo, Japan) with an accelerating voltage of 20 kV of A1 and A5. The energy dispersive X-ray spectroscopy is used for the compositional analysis of the sample A1 and A5. For the FTIR analysis, JASCO FT/IR 6100 (Tokyo, Japan), with a range from 400 to 4000 cm−1 was used to find the presence of various modes in the material. Cyclic voltammetry (CV) measurements were carried out by K-Lyte 1.2 with the research applications of K-Lyte hardware (K-Lyte 1.2, from Knopy Techno Solutions, Kanpur, India). Seebeck coefficient measurements were done by a TEP unit TYPE-2, purchased from Borade Embedded Solutions, Kolhapur, India. Finally, for each sample, the pellets with dimensions 12 mm × 3 mm were prepared by a hydraulic press machine to find the thermo-emf of the synthesized material.
D8 advance xrd
The D8 Advance is an X-ray diffractometer (XRD) designed for a wide range of analytical applications. It provides high-resolution, high-speed data acquisition for phase identification, quantification, and structural analysis of solid materials.
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59 protocols using d8 advance xrd
Comprehensive Characterization of PbTe Samples
The PbTe structure was obtained by using the XRD–D8 Advance (Bruker, Karlsruhe, Germany) with Cu-Kα line wavelength 1.54 Å. The morphological study of the synthesized material under higher magnification was done by SEM from JEOL (JSM-6400, Tokyo, Japan) with an accelerating voltage of 20 kV of A1 and A5. The energy dispersive X-ray spectroscopy is used for the compositional analysis of the sample A1 and A5. For the FTIR analysis, JASCO FT/IR 6100 (Tokyo, Japan), with a range from 400 to 4000 cm−1 was used to find the presence of various modes in the material. Cyclic voltammetry (CV) measurements were carried out by K-Lyte 1.2 with the research applications of K-Lyte hardware (K-Lyte 1.2, from Knopy Techno Solutions, Kanpur, India). Seebeck coefficient measurements were done by a TEP unit TYPE-2, purchased from Borade Embedded Solutions, Kolhapur, India. Finally, for each sample, the pellets with dimensions 12 mm × 3 mm were prepared by a hydraulic press machine to find the thermo-emf of the synthesized material.
Crystallographic Analysis of AgNPs
X-Ray Diffraction Analysis Protocol
Multimodal Characterization of BN Nanoconjugates
reflectance Fourier-transform infrared (ATR–FTIR) spectra were
recorded on a Bruker’s Alpha spectrometer, utilizing a diamond
crystal as the refractive element. The spectra were acquired by averaging
256 scans at a resolution of 4 cm–1. Powder X-ray
diffraction (PXRD) was performed using a Bruker XRD D8 ADVANCE with
Cu Kα1 radiation. Data were collected with 2θ from 20
to 70°. Raman spectra were obtained using a WITec alpha300 Raman
spectrometer equipped with a 100× objective lens. A 532 nm wavelength
laser and a 600 g/mm grating were employed for excitation. Spectra
were acquired in the range of 500–3000 cm–1 with a 0.5 s integration time. The surface chemistry was analyzed
using an X-ray photoelectron spectroscopy (XPS) instrument (PHI VersaProbe
III). Monochromatized Al Kα X-ray (1486.6 eV) was employed to
collect the spectra. Spectra were obtained using CasaXPS software.
Dynamic light scattering (DLS) (Zetasizer Nano ZS, Japan) was used
to study the size distribution and zeta potential of BN nanoconjugates.
The shape and size of BN nanoconjugates was examined by scanning electron
microscopy (SEM, JEOL JSM 6301F) under an acceleration voltage of
5 kV. Transmission electron microscopy (TEM) was carried out using
a FEI Tecnai T20 transmission electron microscope under an acceleration
voltage of 200 kV.
Characterization of Carbon Dots
Characterization of Silver Nanoparticles and Microparticles
where D represents crystalline domain size perpendicular to the reflecting planes, λ is the wavelength of incident X-ray (1.5406 Å), β is the angular full width at half maximum in radians, and θ is the angle of diffraction also called Bragg’s angle [33 (link)].
X-ray Diffraction Analysis of Solid Samples
Comprehensive Characterization of Si@CAZ Composite
Nano-Engineered Herbal Extracts Characterization
DLS Nano Particle Analyzer (SZ-100) was employed to find the size of nanoparticles. FT-IR analysis was done with FT/IR-6300, JASCO. X-ray diffraction (XRD) was conducted by XRD D8 ADVANCE, Bruker. EDX-MAP, SEM, and TEM analysis were done by EDAS TESCAN, MIRA II, Leo 1430 VP, and TEM CM120, respectively.
XRD Analysis of Sodium Selenite and SeNP
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