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59 protocols using d8 advance xrd

1

Comprehensive Characterization of PbTe Samples

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The samples A1–A5 were characterized by SEM/EDS, x-ray diffraction (XRD), FTIR, and cyclic voltammetry (CV). These methods confirmed the composition of our samples.
The PbTe structure was obtained by using the XRD–D8 Advance (Bruker, Karlsruhe, Germany) with Cu-Kα line wavelength 1.54 Å. The morphological study of the synthesized material under higher magnification was done by SEM from JEOL (JSM-6400, Tokyo, Japan) with an accelerating voltage of 20 kV of A1 and A5. The energy dispersive X-ray spectroscopy is used for the compositional analysis of the sample A1 and A5. For the FTIR analysis, JASCO FT/IR 6100 (Tokyo, Japan), with a range from 400 to 4000 cm−1 was used to find the presence of various modes in the material. Cyclic voltammetry (CV) measurements were carried out by K-Lyte 1.2 with the research applications of K-Lyte hardware (K-Lyte 1.2, from Knopy Techno Solutions, Kanpur, India). Seebeck coefficient measurements were done by a TEP unit TYPE-2, purchased from Borade Embedded Solutions, Kolhapur, India. Finally, for each sample, the pellets with dimensions 12 mm × 3 mm were prepared by a hydraulic press machine to find the thermo-emf of the synthesized material.
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2

Crystallographic Analysis of AgNPs

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Crystallographic analyses of the AgNPs were performed using X-ray powder diffraction (XRD; XRD D8 Advance, Bruker, Madison, WI, USA) having Cu Kα (λ=1.540 Å) as a radiation source within 2θ=10–700 at the scan speed 0.4°/min. The obtained pattern from the XRD analysis was used to identify the chemical composition and crystalline structure of the compound. The chemical composition of nanoparticles was also assessed using energy-dispersive X-ray spectroscopy (EDS) (MIRA3; TESCAN).
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3

X-Ray Diffraction Analysis Protocol

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The XRD patterns were measured on XRD D8-Advance (Bruker, Germany), using Cu Kα (λ = 1.5405 Å) radiation with a constant voltage of 40 kV and diffraction angle 2θ scans from 10° to 80° [29 ].
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4

Multimodal Characterization of BN Nanoconjugates

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Attenuated total
reflectance Fourier-transform infrared (ATR–FTIR) spectra were
recorded on a Bruker’s Alpha spectrometer, utilizing a diamond
crystal as the refractive element. The spectra were acquired by averaging
256 scans at a resolution of 4 cm–1. Powder X-ray
diffraction (PXRD) was performed using a Bruker XRD D8 ADVANCE with
Cu Kα1 radiation. Data were collected with 2θ from 20
to 70°. Raman spectra were obtained using a WITec alpha300 Raman
spectrometer equipped with a 100× objective lens. A 532 nm wavelength
laser and a 600 g/mm grating were employed for excitation. Spectra
were acquired in the range of 500–3000 cm–1 with a 0.5 s integration time. The surface chemistry was analyzed
using an X-ray photoelectron spectroscopy (XPS) instrument (PHI VersaProbe
III). Monochromatized Al Kα X-ray (1486.6 eV) was employed to
collect the spectra. Spectra were obtained using CasaXPS software.
Dynamic light scattering (DLS) (Zetasizer Nano ZS, Japan) was used
to study the size distribution and zeta potential of BN nanoconjugates.
The shape and size of BN nanoconjugates was examined by scanning electron
microscopy (SEM, JEOL JSM 6301F) under an acceleration voltage of
5 kV. Transmission electron microscopy (TEM) was carried out using
a FEI Tecnai T20 transmission electron microscope under an acceleration
voltage of 200 kV.
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5

Characterization of Carbon Dots

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The fluorescence spectrophotometer (F-4500, HITACHI, Japan) and the UV-2450 spectrometer (Shimadzu, Japan) were selected to record the fluorescence spectra and the absorption spectra of carbon dots, respectively. The JEM 2100F STEM (JEOL, Japan) and the XRD (D8 Advance, Bruker, Germany) were used to record TEM image and XRD patterns of the carbon dots, respectively.
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6

Characterization of Silver Nanoparticles and Microparticles

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The optical absorption features of AgNPs and AgMPs were recorded in the range of 300 to 600 nm wavelength by UV-visible spectrophotometer (UV 1602 BMS spectrophotometer, Spain). The size and morphology of the samples were investigated using scanning electron microscopy (SEM) (TESCAN SEM, VEGA 3, Warrendale, PA, USA), operating at the voltage of 20 kV (maximum) with the counting frequency of 2368 cps (maximum). Chemical composition was confirmed by energy-dispersive X-ray (EDS) (Oxford Instruments, Concord, MA, USA) coupled with the SEM as plugin hardware. Magnified micrographs were taken up to the resolution of 10 µm in the scale bar. The samples for X-ray diffraction (XRD) analysis were performed by taking a small amount of solution and drying it on a quartz plate (XRD D8 Advance, Bruker GmbH, Germany). Furthermore, the crystallite parameters of prepared AgNPs and AgMPs were calculated using following Debye Scherrer’s relation,

where D represents crystalline domain size perpendicular to the reflecting planes, λ is the wavelength of incident X-ray (1.5406 Å), β is the angular full width at half maximum in radians, and θ is the angle of diffraction also called Bragg’s angle [33 (link)].
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7

X-ray Diffraction Analysis of Solid Samples

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The diffraction patterns of solid samples were recorded using X-ray diffractometer (Bruker XRD-D8 Advance, Karlsruhe, Germany) equipped with Cu as the anode material using a tube current of 40 mA and a tube voltage of 40 kV. The samples were continuously scanned from 5° to 50° (2θ) at a scanning rate of 0.2°/min.
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8

Comprehensive Characterization of Si@CAZ Composite

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The morphology and microstructure of all prepared samples were observed by using a field emission scanning electron microscope (FESEM, Hitachi-SU8010, North Avenue, Atlanta, GA, USA) and a high-resolution transmission electron microscope (HRTEM, JEM-2100 F, Verdun, France). The functional groups of sample material were characterized by using an MB154S-Fourier transform infrared (FTIR) spectrometer on a pressed KBr pellet with 0.5 wt% ratio of sample. The crystallographic structure of the as-prepared samples was detected on an X-ray Powder diffractometer (XRD-D8 Advance, λ = 1.5406 Å, Bruker, Billerica, MA, USA). The carbon mass fraction in Si@CAZ composite was determined by using a thermogravimetric analyzer (TGA, Netzsch STA 449 F3/F5, Woden, Australia) with a ramp rate of 10 °C min−1 within a temperature range of 30–900 °C in air atmosphere.
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9

Nano-Engineered Herbal Extracts Characterization

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The study on plants complies with local and national guidelines and regulations. Rosmarinus officinalis leaves were sourced from the natural environment of Isfahan, Iran, while Red ginseng roots were obtained from an herbal store. The precursor chemicals, palladium (II) chloride (PdCl2), and hexachloroplatinic acid hexahydrate (H2PtCl6·6H2O), as well as polyvinylpyrrolidone (PVP), were provided from Sigma-Aldrich, USA. Analytical grade HCl and sodium hydroxide (NaOH) were obtained from Merck Specialities Pvt Ltd, India. Cell culture-grade DMSO, MTT (dimethylthiazolyltetrazolium bromide), ethidium bromide, and phosphate buffer saline (PBS) were supplied from Sigma-Aldrich Co. in Canada (Oakville, ON). Beclin-1, LC3-II, and p62 were acquired from Cell Signaling Technology Co. in the USA (Beverly, MA). GAPDH was supplied from Santa Cruz Biotechnology Inc. (Dallas, Texas, USA).
DLS Nano Particle Analyzer (SZ-100) was employed to find the size of nanoparticles. FT-IR analysis was done with FT/IR-6300, JASCO. X-ray diffraction (XRD) was conducted by XRD D8 ADVANCE, Bruker. EDX-MAP, SEM, and TEM analysis were done by EDAS TESCAN, MIRA II, Leo 1430 VP, and TEM CM120, respectively.
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10

XRD Analysis of Sodium Selenite and SeNP

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The XRD patterns of sodium selenite and the optimum SeNP sample were obtained by XRD-D8 ADVANCE (Bruker, Germany) using Cu Ka 1.5406 A° radiation. The measurement was recorded over the range of 10–70 (2ϴ).
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