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Jem 2010

Manufactured by Bruker
Sourced in Japan

The JEM-2010 is a transmission electron microscope (TEM) manufactured by Bruker. It is designed to produce high-resolution images of thin samples by using a focused beam of electrons. The JEM-2010 allows for the observation and analysis of materials at the nanoscale level.

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4 protocols using jem 2010

1

Structural and Optical Characterization of Perovskite Nanocrystals

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Structural characterization of the as-synthesized nanocrystals was performed using both transmission electron microscopy (Jeol JEM-2010) and the X-ray diffraction (XRD Bruker D8 Advance). The concentrations of perovskite nanocrystals in toluene solution were determined by the mass of lead, which were measured by the inductively coupled plasma optical emission spectrometry (ICP-OES Optima 8000; Perkin-Elmer).
1PA spectra of the perovskite nanocrystals in solution phase (toluene) were measured using a Shimadzu UV1800 Ultraviolet –Visible spectrophotometer. A Shimadzu RF-5301pc spectrofluorophotometer was employed to record the one-photon-excited PL spectra of the nanocrystals in toluene. Measurements of the absolute PLQYs of the perovskite nanocrystals were performed using an Ocean-optics USB4000 spectrometer with a BaSO4-coated integrating sphere excited by laser beam at 400 nm.
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2

Comprehensive Characterization of N-Doped Carbon Porous Composites

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The microscopic morphologies and crystal structure of the NCPCs samples were characterized through scanning electron microscopy (SEM, JSM-6700), transmission electron microscopy (TEM, JEM-2010) and X-ray powder diffraction (PXRD, Bruker D8) between 10° and 70°, respectively. The structure effect of N-doping on the NCPC samples were characterized by the Raman spectrophotometer (Horiba JobinYvon Lab RAMHR800) at 633 nm. The pore structure of NCPC samples were analyzed by argon adsorption–desorption (BET, Micromeritics ASAP 2460, 87.28 K) experiments and the non-local density functional theory (NLDFT). The surface information for NCPCs samples were carried out by X-ray photoelectron spectroscopy (XPS, PHI 3057). The impurity contents for NCPCs samples were recorded by Thermogravimetric analysis (TGA, NETZSCH STA449F3 analyser).
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3

Comprehensive Materials Characterization

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All the samples were characterized by field-emission scanning electron microscopy (FESEM, JEOL, JSM-6304F) equipped with an energy dispersive X-ray spectroscopy (EDX), transmission electron microscopy (TEM, JEOL, JEM-2010) and X-ray diffraction (XRD, Bruker, D8-Advance Diffractometer, Cu Ka). The BET properties of the MS samples were carried out using a N2 adsorption-desorption at 77 K with a Quantachrome NOVA-3000 system.
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4

Characterization of Au@SiO2 Nanoparticles

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The morphologies and crystalline phase of Au@SiO2 NPs were analyzed using transmission electron microscopy (TEM, JEOL, JEM-2000 EX II, Japan), high-resolution TEM (HRTEM, JEOL, JEM-2010, Japan), and X-ray diffraction (XRD, Bruker D8-Advance X-ray powder diffractometer with Cu Kα radiation [λ=1.5406 Å]). The particle size distribution of the samples was determined using dynamic light scattering (DLS) at a scattering angle of 90° with a Zetasizer nano ZS90 (Malvern Instruments, Worcestershire, UK) at 25 °C.
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