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Optistat dn 5

Manufactured by Oxford Instruments
Sourced in United Kingdom

The Optistat DN-V is a cryogenic dewar from Oxford Instruments. It is designed to provide a controlled low-temperature environment for various experimental applications. The device utilizes liquid nitrogen to maintain a stable temperature, enabling researchers to conduct experiments at cryogenic temperatures.

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5 protocols using optistat dn 5

1

Vacuum Deposition of Organic Light-Emitting Diodes

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Before devices fabrication, the ITO substrates with a sheet resistance of 15 Ω per square were cleaned by sequential ultra-sonication in detergent, deionized water, acetone, ethanol, and then exposed to UV-Ozone for 15 min. After being transferred into a vacuum chamber, all material layers were deposited by vacuum evaporation in a vacuum chamber with a base pressure of <3 ×  10−5 Pa. As for host-free sensitization, S-Cz-BN is doped into RTP-D2 to constitute a binary EML at a low content of 2 wt.%. The current density-voltage characteristics were performed using an HP4140B picoammeter. And the luminance and electroluminescence (EL) spectra were recorded by Minolta LS-110 Luminance meter and Ocean Optics USB-4000 spectrometer, respectively. EQE was calculated from the EL spectrum, luminance and current density assuming a Lambertian emission distribution. All the measurements were carried out at room-temperature under ambient conditions without device encapsulation. The temperature-dependent EL spectra were measured using a liquid nitrogen-cooled optical cryostat (Optistat DNV, Oxford Instruments) with an ITC503S temperature controller. The transient EL spectra were measured using KEYSIGHT DSO1012A oscilloscope, equipped with regulated DC power supply of LINI-UTP3313TFL-11 and VICTOR DDS signal generator counter.
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2

Optical Properties Characterization of Samples

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Absorption
spectra of all samples were measured using an absorption spectrometer
(V-630, JASCO, Tokyo, Japan). The fluorescence spectra, RTP spectra,
and RTP lifetime at RT were measured using a photonic multichannel
analyzer (PMA-12, Hamamatsu Photonics, Shizuoka, Japan) and monochromatic
light from the excitation unit of a fluorimeter (FP-8300, JASCO) as
the excitation source. Temperature-dependent measurements were achieved
by using a cryostat (Optistat DN-V, Oxford Instruments, Abingdon-on-Thames,
UK). The emission yield, including Φf(T) and Φp(T), was measured by the
method described in the Supporting Information of a previous report
by using an absolute luminescence quantum yield measurement system
(C9920-02G, Hamamatsu Photonics) (see section S4 in this article).11 (link) Φisc(RT) in benzene was determined by using the previously reported
method with a subnanosecond transient absorption spectrophotometer
(picoTAS, Unisoku, Osaka, Japan) and a 355 nm Q-switched microchip
laser (PNV-M02510-1×X0, Teem Photonics, Meylan, France) (see section S2 in this article).
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3

Organic Field-Effect Transistor and Photothermal Deflection Spectroscopy Characterization

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All OFET measurements
were taken in a cryostat (Oxford Instruments, Optistat DN-V) under
vacuum (below 10–4 Torr) and dark conditions. During
OFET measurements, a Keithley 236 source measurement unit was used
to provide the source-to-drain bias, while a Xantrex XT 120-0.5 was
used to supply the gate voltage. The field-effect mobilities were
extracted from the saturation regime of transfer curves. In SPD measurement,
the samples were immersed into perfluorohexane as the deflection fluid
and irradiated by a 5 mW, 532 nm laser diode as the pump beam. The
pump beam was modulated by a mechanical chopper with specific frequencies
and focused by a convex lens. The deflection of a probe beam (2 mW
632 nm He–Ne laser) on the sample surface due to the released
heat was detected by a silicon PIN photoquadrant detector (TEMic).
A position sensor, together with a chopper, was connected to the Standford
Research SR830 lock-in amplifier to collect the data. The thermal
images were taken by an IR camera (Optris PI 400i). The surface morphology
of the thin films was probed by an atomic force microscope (AFM) (Veeco
Deltak 150 surface profiler) operating in tapping mode.
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4

Cryogenic Absorption Spectroscopy

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Room temperature and 77 K absorption spectra were recorded using a Cary ultraviolet/vis spectrophotometer in the spectral range between 260 and 950 nm. For cryogenic measurements, samples suspended in a cryo-stable buffer consisting of 20 mM Tris–HCl, 80% glycerol (v/v) were cooled to 77 K in an Optistat DN-V optical cryostat manufactured by Oxford Instruments.
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5

Fabrication and Characterization of Ti3C2Tx and Mo2C2Tx Films

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Samples of Ti3C2Tx and Mo2C2Tx films were obtained by dripping ~0.2 mg mL−1 Ti3C2Tx and Mo2C2Tx aqueous solutions onto a CaF2 window and vacuum drying after 6 h. To avoid light-induced oxidation of the two samples, they were placed into a vacuum cell (Oxford instruments, Optistat DN-V) during measurement of the broadband IVS and pump-probe data.
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