Optistat dn 5
The Optistat DN-V is a cryogenic dewar from Oxford Instruments. It is designed to provide a controlled low-temperature environment for various experimental applications. The device utilizes liquid nitrogen to maintain a stable temperature, enabling researchers to conduct experiments at cryogenic temperatures.
5 protocols using optistat dn 5
Vacuum Deposition of Organic Light-Emitting Diodes
Optical Properties Characterization of Samples
spectra of all samples were measured using an absorption spectrometer
(V-630, JASCO, Tokyo, Japan). The fluorescence spectra, RTP spectra,
and RTP lifetime at RT were measured using a photonic multichannel
analyzer (PMA-12, Hamamatsu Photonics, Shizuoka, Japan) and monochromatic
light from the excitation unit of a fluorimeter (FP-8300, JASCO) as
the excitation source. Temperature-dependent measurements were achieved
by using a cryostat (Optistat DN-V, Oxford Instruments, Abingdon-on-Thames,
UK). The emission yield, including Φf(T) and Φp(T), was measured by the
method described in the Supporting Information of a previous report
by using an absolute luminescence quantum yield measurement system
(C9920-02G, Hamamatsu Photonics) (see
method with a subnanosecond transient absorption spectrophotometer
(picoTAS, Unisoku, Osaka, Japan) and a 355 nm Q-switched microchip
laser (PNV-M02510-1×X0, Teem Photonics, Meylan, France) (see
Organic Field-Effect Transistor and Photothermal Deflection Spectroscopy Characterization
were taken in a cryostat (Oxford Instruments, Optistat DN-V) under
vacuum (below 10–4 Torr) and dark conditions. During
OFET measurements, a Keithley 236 source measurement unit was used
to provide the source-to-drain bias, while a Xantrex XT 120-0.5 was
used to supply the gate voltage. The field-effect mobilities were
extracted from the saturation regime of transfer curves. In SPD measurement,
the samples were immersed into perfluorohexane as the deflection fluid
and irradiated by a 5 mW, 532 nm laser diode as the pump beam. The
pump beam was modulated by a mechanical chopper with specific frequencies
and focused by a convex lens. The deflection of a probe beam (2 mW
632 nm He–Ne laser) on the sample surface due to the released
heat was detected by a silicon PIN photoquadrant detector (TEMic).
A position sensor, together with a chopper, was connected to the Standford
Research SR830 lock-in amplifier to collect the data. The thermal
images were taken by an IR camera (Optris PI 400i). The surface morphology
of the thin films was probed by an atomic force microscope (AFM) (Veeco
Deltak 150 surface profiler) operating in tapping mode.
Cryogenic Absorption Spectroscopy
Fabrication and Characterization of Ti3C2Tx and Mo2C2Tx Films
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!