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Tescan3vega

Manufactured by TESCAN
Sourced in Czechia

The TESCAN3VEGA is a versatile scanning electron microscope designed for high-resolution imaging and microanalysis. It features a stable electron optical column, advanced detector systems, and user-friendly software, enabling researchers to capture detailed information about the structure and composition of a wide range of materials.

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3 protocols using tescan3vega

1

Microstructural Analysis of Cement Composites

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Microstructural analysis of the obtained cement composites was carried out by means of a TESCAN3VEGA scanning electron microscope (Tescan, Brno, Czech Republic). In order to compare and determine the dispersion properties of the used oxides, the samples were analyzed for particle size distribution utilizing a Zetasizer Nano ZS device (Malvern Instruments Ltd., Malvern, UK). The apparatus employs the non-invasive back scatter technology (NIBS), which enables the examination of particle sizes in the range of 0.6–6000 nm.
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2

Scanning Microscopy of Cement Mortar Microstructure

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In order to establish the mechanism of contact zone formation, studies were run utilizing the scanning microscope: TESCAN3VEGA. To observe the microstructure of the cement mortars, the samples were crumbled in order to create pieces of approximately 1 cm2 area with flat surfaces. All the samples were 28 days old and dried for 24 h at a temperature of 105 °C.
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3

Scanning Electron Microscopy Analysis

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The morphology and the surfaces of the samples were examined using scanning electron microscopy by a TESCAN 3 VEGA scanning electron microscope secondary electron detector (Brno, Czech Republic). All prepared samples were analyzed using 20 kV operating voltage and different magnifications up to 6000×.
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