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Diffuse gold integrating sphere

Manufactured by PIKE Technologies
Sourced in United States

The Diffuse Gold Integrating Sphere is a highly efficient and versatile device used for the measurement of optical properties. It consists of a spherical cavity with a highly reflective gold-coated interior, which helps to ensure uniform distribution of light within the sphere. The core function of this device is to provide an integrated, diffuse measurement of light, making it a valuable tool for a wide range of applications, such as spectroscopy, photometry, and radiometry.

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6 protocols using diffuse gold integrating sphere

1

FTIR Diffuse Reflectance Spectroscopy of Samples

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The mid-IR diffuse reflectance spectra of samples from 2.5 to 16.67 µm were measured by an FTIR spectrometer (model 6700, Thermo Fisher Scientific) accompanied by a diffuse gold integrating sphere (PIKE Technologies). Standard gold reference was chosen as the background of the measurement. Cyclability test is conducted in situ at ±0.6 V in two-electrode mode using the same FTIR for reflectance spectra measurement. A total of 107 cycles were performed.
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2

Optical and Thermal Characterization of Surfaces

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Optical characterization was conducted across UV to mid-infrared (MIR) wavelengths. The reflectivity (R) and transmissivity (T) were measured using a UV–VIS–NIR spectrometer (Lambda 1050, PerkinElmer, USA) in the range of 0.25–2.5 μm with an integrating sphere, while in the MIR range (2.5–25 μm) using a FTIR spectrometer (Nicolet iS50, ThermoScientific, USA) equipped with a diffuse gold integrating sphere (Pike Technologies, USA). The emissivity (ε) is equal to absorptivity, which is obtained from the equation ε = 1 – R – T.
The definition of average solar reflectivity ( R¯ solar) is given by: R¯solar=0.3μm2.5μmIsolar(λ)×Rsolar(λ)dλ0.3μm2.5μmIsolar(λ)dλ where λ is the wavelength, Isolar(λ) is the reference direct normal spectral irradiance ASTM G173 under air-mass 1.5, representing the global solar intensity, and Rsolar(λ) is the spectral reflectivity of the surface.
Definition of average atmospheric window emissivity ( ε¯ LWIR) is given by: ε¯LWIR=8μm13μmIBB(T,λ)×ε(T,λ)dλ8μm13μmIBB(T,λ)dλ where IBB(T, λ) is the spectral irradiance emitted by a blackbody at temperature T (here assumed to be 25 °C) shown in Fig. 4d, and ε(T, λ) is the spectral thermal emissivity of the surface.
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3

Comprehensive Material Characterization

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The MIR reflectance was measured by an FTIR spectrometer (Model 6700, Thermo Scientific) accompanied by a diffuse gold integrating sphere (PIKE Technologies). ATR-FTIR spectra were measured by the Nicolet iS50 FTIR Spectrometer. The visible and NIR reflectance was measured by UV-Vis-NIR spectrometers (Agilent, Cary 6000i and Jasco V-670) equipped with diffuse reflectance accessories. SEM images were taken by FEI Nova NanoSEM (5 kV). The contact angle was measured by a contact angle goniometer (Rame-Hart 290). The sample mass was measured by an analytical balance (Ohaus Pioneer, 0.0001g readability).
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4

Characterizing Material Optical Properties

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The SEM images were taken by FEI XL30 Sirion (5 kV). The IR properties were measured by an FTIR spectrometer (model 6700, Thermo Fisher Scientific) accompanied with a diffuse gold integrating sphere (PIKE Technologies). Unless specified, the incident angle to the sample is 12°. The FTIR was used to measure reflectivity (ρ) and transmissivity (τ), and the emissivity (ε) was calculated on the basis of ε = 1 − ρ − τ.
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5

Fabrication and Characterization of Photonic Structures

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The photonic structures were fabricated by electron beam deposition at Optiforms, on 500-um-thick, 100-mm-diameter, p-doped single-side-polished <100> crystalline silicon wafers, with resistivity 1–10 Ω cm (UniversityWafer 783). To block transmission in the wavelength range below silicon bandgap, the unpolished side of the wafers were coated with silver paste. In the wavelength range of 0.3−1.8 μm, the reflection spectra of the samples were characterized using a spectrophotometer (Agilent Cary 6000i) with an unpolarized light source and a high Lambertian reflectance standard (Labsphere SRS-99-020). A diffuse reflectance accessory (DRA 1800) with a 150-mm-diameter integrating sphere was used to collect both specular and diffuse components of reflection at an 8° angle of incidence. In the wavelength range of 4−25 μm, a Fourier transform infrared spectrometer (Thermo Scientific Nicolet 6700) with a diffuse gold integrating sphere (PIKE Technologies) was used to characterize the samples. The absorptivity/emissivity spectra were obtained by subtracting the reflectance from unity. A scanning electron microscope (Nova FEI 450) was used to image the cross sections of the stacks in Fig. 3a, b.
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6

Infrared Optical Property Analysis

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The IR reflectivity (ρ) and transmittance (τ) were measured using a FTIR spectrometer (Model 6700, Thermo Scientific) accompanied with a diffuse gold integrating sphere (PIKE Technologies). The IR emissivity (ε) was then calculated using equation ε = 100%−ρτ. The scanning electron microscope (SEM) images were taken by FEI Sirion (5 kV).
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