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Dualflex

Manufactured by Rigaku
Sourced in Japan

The Dualflex is a versatile X-ray diffractometer designed for phase identification and quantification, structural analysis, and materials characterization. It features a dual-beam configuration that allows for both reflection and transmission geometry measurements, providing flexibility in sample analysis. The Dualflex is capable of determining the crystal structure, phase composition, and other properties of a wide range of solid materials.

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5 protocols using dualflex

1

Single-Crystal X-Ray Diffraction of Compound 11

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Single-crystal X-ray diffraction data were collected at 100 K on an XtaLAB Synergy, Dualflex, Pilatus 300 K diffractometer apparatus (Rigaku Corporation, Tokyo, Japan) for compound 11. Using Olex2 [41 (link)], the structure was solved with the SHELXT [42 (link)] structure solution program using Intrinsic Phasing and refined with the SHELXL [43 (link)] refinement package using least-squares minimization. The CIF file containing full crystallographic data for compound 11 (CCDC 2278736) can be obtained free of charge from The Cambridge Crystallographic Data Centre via http://www.ccdc.cam.ac.uk/structures (accessed on 11 July 2023).
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2

Structural Analysis of Crystalline Compounds

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The crystallographic data were measured on a Bruker SMART APEX II CCD single crystal diffractometer with MoKα radiation (17, 9, 10, and 1214) and an XtaLAB Synergy, Dualflex, HyPix diffractometer from Rigaku with CuKα radiation (11). The data were refined by SHELXL,[28] and all non‐proton coordinate values and anisotropic temperature factors were refined by the full‐matrix least‐squares method. All proton positions in the structure were determined by theoretical calculation
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3

Single-Crystal X-Ray Analysis of 4B8M

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Crystallization of suitable crystals for single-crystal X-ray analysis was not an easy task due to the tendency of 4B8M to form syrup-like amorphous phase or ‘twinned’ crystals. Finally, after many attempts, acceptable quality single crystals were grown via slow evaporation of a glacial acetic acid.
X-ray data were collected on a Rigaku OD XtaLAB Synergy, Dualflex, Pilatus diffractometer using graphite monochromated CuKα radiation (λ = 1.54158 Å) at a temperature of 100 K, using Crysalis, structure determination and refinement by Olex2 [118 (link)]. The structure was solved with the XT [119 (link)] structure solution program using intrinsic phasing and refined with the XL [120 (link)] refinement package using least-squares minimization. A CIF file containing complete information of the studied structure was deposited with CCDC, deposition number 2158219 is freely available upon request from the Director, CCDC, 12 Union Road, Cambridge CB2 1EZ, UK (Fax: + 44-1223-336033; e-mail: deposit@ccdc.cam.ac.uk).
All molecular interactions in the crystals of 4B8M and YEPVIZ were identified by the PLATON [121 (link)] and Mercury [116 (link)] programs.
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4

Single Crystal Structure Determination

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Single crystals were obtained from dichloromethane/hexane. A suitable crystal was selected on a XtaLAB Synergy, Dualflex, HyPix diffractometer (Rigaku, Tokyo, Japan). The crystal was kept at 100 K during data collection. Using Olex2 [44 (link)], the structure was solved with the ShelXT [45 (link)] structure solution program using Intrinsic Phasing and refined with the ShelXL [46 ] refinement package using Least Squares minimisation.
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5

Crystal Structure Determination by X-Ray

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Crystal structures were determined by the Single Crystal X-ray analysis method. The crystals to be measured were selected from the product obtained by described synthesis. X-ray data were collected on the XtaLAB Synergy, Dualflex, Pilatus 300K diffractometer apparatus (Rigaku Corporation, Tokyo, Japan) equipped with the PhotonJet microfocus X-ray tube apparatus (Rigaku Corporation, Tokyo, Japan). Data reduction was performed with CrysAlisPro (Agilent Technologies UK Ltd., Yarnton, England) [25 ]. The structures were refined in ShelXL [26 (link)]. Molecular structures and packing diagrams were drawn using Mercury [27 (link)]. Molecular geometry parameters were computed with publCIF [28 (link)].
CCDC: Deposition Number 2090557-2090558 contains the supplementary crystallographic data for this paper. The data are provided free of charge by The Cambridge Crystallographic Data Centre via www.ccdc.cam.ac.uk/structures. Deposited: 06/17/2021.
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