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Quorum sc7620

Manufactured by Quorum Technologies
Sourced in United Kingdom

The Quorum SC7620 is a sputter coater designed for the deposition of conductive coatings on samples for scanning electron microscopy (SEM) and other analytical techniques. It features a compact benchtop design and automated operation.

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10 protocols using quorum sc7620

1

Energy Dispersive X-Ray Analysis of CSF

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The elementary analysis of CSF was performed using an energy dispersive X ray (EDX) analyzer (X‐Max N SDD EDX instrument, Oxford, UK). Oxford AZTEC software 2011 (Oxford Instruments, Abingdon, UK) was used to analyze results. Previous to analysis, the samples were metalized by coating with a thin gold layer (5 nm) using a Quorum SC7620 metalizer (Quorum Technologies, Brighton, UK) for 45 s at 12 mA under argon flux.
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2

Morphological Analysis of Hydrogel Microneedles

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The morphology of MNs was observed using SEM. The prepared hydrogel MNs were sequentially frozen at −20 °C and −80 °C for 6 h and then lyophilized for 12 h. The substrate was then pasted on the sample stage, and each sample was coated with gold-palladium in a sputter coater (Quorum SC7620; Quorum, Laughton, UK) for 45 s. SEM observations were then carried out on a Gemini300 instrument (ZEISS, Oberkochen, Germany).
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3

Scaffold Surface Morphology Analysis

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The surface morphology of the fabricated scaffolds was examined under a scanning electron microscope (EVA MA 10 ZEISS, Jena, Germany). The samples were gold (Au) and palladium (Pd) coated in a sputter coating machine (Quorum SC7620, Quorum Technologies Ltd., East Sussex, UK) for 120 s. The average pore sizes of each scaffold were measured using Analysis5, Olympus (Münster, Germany) software.
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4

Characterization of CS/R-VNRL and CS/RP-VNRL Composites

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The morphological properties of the CS/R-VNRL and CS/RP-VNRL composites (both before and after being biodegraded) were determined using SEM with energy dispersive X-ray spectroscopy (SEM-EDX; Quanta 450 FEI: JSM-6610LV, Eindhoven, The Netherlands) at 10 kV accelerating voltage. Prior to the SEM measurement, the specimens were coated with gold using a sputter coater (Quorum SC7620: Mini Sputter Coater/Glow Discharge System, Lewes, UK) at a power voltage of 10 kV and a current of 10 mA for 120 s, to increase electrical conductivity of the surface [33 (link),34 (link)].
Changes in the functional groups of the R-VNRL and RP-VNRL composites after the addition of CS were determined using FT-IR (Vertex 70, Bruker, San Jose, CA, USA), with wavenumbers in the range 500–4000 cm−1 [35 (link)].
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5

Scanning Electron Microscopy of Dressing Membranes

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At each time point, a 5 mm piece of the outer membrane of each dressing was obtained as centrally as possible. These pieces were fixed in 2.5% glutaraldehyde and 4% freshly prepared formaldehyde in 0.1 M HEPES buffer; for 2 h. The samples were then dehydrated in a graded (30–100%) ethanol series for 1 h and critical point-dried in CO2 using a Quorum K 850 (Quorum Technologies Limited, Lewes, UK). Finally, the samples were sputter-coated with gold–palladium alloy using a Quorum SC7620 (Quorum Technologies Ltd.) and observed with an FEI Quanta 250 scanning electron microscope (ThermoFisher Scientific, Paisley, UK).
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6

SEM Analysis of Mango Lenticels

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Scanning electron microscopy analysis of non-discolored and discolored lenticels was performed on peel parts of healthy and chilling-stressed ‘Keitt’ mango fruit 19 days after cold storage at 5 or 12°C. Samples were fixed in FAA then dehydrated in a graded ethanol series (50, 70, 90, 95, and 100% × 2), critical-point dried in a Quorum K850, and coated with gold palladium (Quorum SC7620 mini sputter coater). Images were taken with a JEOL JCM6000 benchtop scanning electron microscope.
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7

Scanning Electron Microscopy Sample Preparation

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One-quarter of each sample was taken from each group, including the positive control, and scanned using SEM (AURA 100, Saeron Technology, Korea). The samples were soaked in 100% ethanol for 10 min. The segments were sputter-coated with gold/platinum for 180 s in a coating machine (Quorum SC7620, Quorum Technologies, UK).
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8

Morphological Analysis of LS-FA Complexes

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Samples were mounted on aluminum stubs with sticky double-side carbon tape.
Excess powder was removed using high-pressure air. Samples were coated with gold palladium by a mini sputter coater (Quorum SC7620; Quorum Technologies Ltd, Laughton, UK). The morphology of LS-FA complexes was observed under an emission scanning electron microscope (JSM-6360LV, JEOL, Tokyo, Japan) in low vacuum mode at an accelerating voltage of 30 keV. The magnification of image was 10,000×.
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9

Scanning Electron Microscopy of Treated Scaffolds

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A Phenom XL Scanning Electron Microscope (PhenomWorld, Eindhoven, The Netherlands) was used in secondary electron detector (SED) mode to obtain images of untreated and PBPI3-treated scaffolds. The scaffolds were first coated with Au/Pd inside a sputter coater (SC7620 Quorum) with a coating thickness of 16 nm. Images were obtained at a voltage of 10 kV, a pressure of 1 Pa, and a working distance of 5 mm in SEM mode.
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10

Composite Material Characterization

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The density was determined based on Archimedes principle in accordance with ASTM D792. Hardness test was conducted using Instron A654 R Rockwell Hardness (Norwood, MA, USA) tester machine following ASTM D785-08 standard. The calculated density and hardness of composites are presented in Table 2. The morphologies of worn surfaces were examined by Hitachi TM3000 (Illinois, USA) scanning electron microscope (SEM). The specimens were plated with a platinum coating to render electrically conductive using SC7620 QUORUM (Quorum Technologies Ltd., East Sussex, UK) sputter coater machine.
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