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Invia qontor raman microscope

Manufactured by Renishaw
Sourced in United Kingdom

The InVia Qontor Raman microscope is a high-performance analytical instrument designed for material characterization. It offers advanced Raman spectroscopy capabilities, enabling the analysis of a wide range of samples at the micro- and nano-scale. The instrument combines a powerful Raman spectrometer with a state-of-the-art optical microscope, providing users with detailed insights into the chemical and structural properties of their materials.

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5 protocols using invia qontor raman microscope

1

Raman Analysis of Graphene Layers

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The growth quality of graphene layers is determined by performing Raman spectroscopy measurements. Raman spectra were obtained on a Renishaw inVia Qontor Raman microscope (Gloucestershire, UK) using a 532 nm laser for excitation. Raman mapping was constructed with Wire V5.0 software. Optical images were collected in a Keyence VHX 7000 series microscope.
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2

Raman Spectroscopy for Cellular Imaging

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Raman spectra and maps were acquired using a Renishaw InVia Qontor Raman microscope. The Raman microscope was calibrated to the 520 cm−1 mode from a silicon wafer prior to measurements each day. The excitation laser power was measured and adjusted to prevent differences in the laser power throughout the course of experiments. Raman measurements were made with a 532 nm laser, 1800 l/mm grating, and 0.1 second acquisitions. The measurements were made with either high (10 mW) or moderate (1 mW) laser power.
Raman maps of cells were acquired by point mapping in 1 micrometer steps in a x-y raster pattern, taking ~1–2 minutes per map. Volume maps were acquired with the same x-y resolution and a 2-micrometer z step. A 63x, 0.9 N.A. water dipping objective (Leica) was used. Dark field images were acquired in transmission using an oil dark field condenser (Olympus, U-DCW) and Type-F immersion oil (Olympus).
Data was exported from the Raman instrument’s WiRe software, converted into MATLAB files, and a publicly available peak fitting code for MATLAB31 was used to fit Raman peaks that did not overlap with background or other analytes. Peaks fit in the calibration experiments were fit in the cell maps to predict concentrations of lycopene and tween from point to point across the cell map.
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3

Raman Spectroscopy for Cell Imaging

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Raman measurements were obtained on two different Raman spectrometers. A custom Snowy Range IM-52 spectrometer with a 638 nm laser was used in calibration experiments. A Renishaw InVia Qontor Raman microscope with three excitation lasers (532 nm, 633 nm, and 785 nm) was used for Raman maps of cellular samples. A 63x dipping objective was used (LEICA 63x catalog # 506148​) for cell imaging experiments. Cell maps were acquired the same day, and the Renishaw spectrometer was calibrated with a silicon reference. There was no visible evidence of cell damage in the maps used (other maps with different acquisition parameters had resulted in visible rupture of cells). Raman maps were collected in the spectral range between 719.12 and 1816.9 cm−1 using a 1200 l/mm grating and a single 10 s accumulation per pixel. Confocal images were acquired with 5 mW power at the sample. Linefocus images were acquired with 10 mW power at the sample.
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4

Raman Imaging of LCO and LLZO:Al,Ta

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Raman spectroscopy was carried out
with a Renishaw inVia Qontor Raman Microscope equipped with a solid-state
532 nm excitation laser and a 2400 l mm–1 grating.
The output laser power was limited to about 2.5 mW to avoid material
degradation. Both materials, LCO and LLZO:Al,Ta, decompose during
exposure to high laser intensities.26 (link),39 (link),40 (link) For each sample, an area of 60 μm × 40
μm with a step size of 0.22 μm was mapped, leading to
49051 measurement points per sample.
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5

Characterizing Si Nanowires by SEM and Raman

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Scanning electron microscopy (SEM) images of Si nanowires were captured using a Leica Cambridge S360FE SEM at room temperature. The samples were 45°-tilted to obtain three dimensional (3D) images of the nanowires. The height of nanowires was calculated according to trigonometry identity (i.e., hactual=hSEM2 ). Raman spectroscopy was carried out using a Renishaw inVia™ Qontor Raman microscope with a laser wavelength of 532 nm and a 100× objective lens with numerical aperture of 0.85. The grating used in the measurements has a spectral resolution of 0.8 cm−1 while the effective pinhole has a diameter of ~20 µm.
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