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198 protocols using lambda 750

1

Characterization of LDH Reflectance by UV-Vis

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Ultraviolet-Visible (UV-Vis) spectroscopy Lambda 750S (PerkinElmer Company, Waltham, MA, USA) was adopted to characterize the reflectance of LDHs. Polytetrafluoroethylene (Aifusi Chemical Company Ltd., Yangzhong, China) was used as a standard in the UV-Vis experiment. The wavelength range was selected within the region of 200–800 nm.
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2

Comprehensive Characterization of CNC Buckypaper

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The morphologies of products were characterized using a field-emission scanning electron microscope (FE-SEM, NOVA NanoSEM 450) and a transmission electron microscope (TEM, JEOL JEM-2100). Energy-dispersive X-ray spectroscopy (EDX), high-resolution transmission electron microscopy (HRTEM), and element mapping of the samples were also carried out. X-ray photoelectron spectroscopy (XPS, VG ESCALAB 250Xi), X-ray diffraction (XRD, PANalytical BV Empyrean), Raman spectroscopy (Renishaw in via plus, 532.8 nm laser excitation) were used to characterize the chemical compositions and structures of the samples. The Brunauer–Emmett–Teller (BET) surface area measurement was recorded at 77 K (QUADRASORB SI-KR/MP, Quantachrome, USA). The mechanical property of the CNC Buckypaper characterized by a tensile machine Yl-S370, and the electrical property was monitored using an Agilent Technologies B2902A. The electrochemical measurements of the CNC paper were carried out using a CHI660E electrochemical workstation. Adsorption characteristics of methylene blue on CNC Buckypaper and CNC powder were measured by using a UV–Vis spectrophotometer (PerkinElmer, Lambda 750 s).
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3

Comprehensive Materials Characterization Techniques

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X-ray diffraction (XRD) was performed using a Rigaku-D/max 2500V using Cu Kα radiation. X-ray photoelectron spectroscopy (XPS) was performed using a Thermo instrument using Al Kα radiation. Scanning electron microscopy (SEM) was performed using a JEOL JEM-7100F. TEM was performed using a JEOL JEM-200CT at 200 kV accelerating voltage. The optical ability was examined using a UV-visible spectrophotometer (PerkinElmer Lambda 750S). ESR was measured using a Bruker model A300-10/12 spectrometer.
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4

Characterizing Bitumen Aging via UV Spectroscopy

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Transmittance of the third group was tested by UV spectrophotometry (Lambda 750S, PerkinElmer, Waltham, MA, USA). The wavelength scan ranged from 200–800 nm and the average spectrum was calculated. UV radiation with different wavelengths can be absorbed by bitumen because of its chemical bonds and transmittance may be reduced. After UV aging, the chemical bonds change, which results in changes in transmittance. Consequently, the transmittance tested by UV spectrophotometry could be used to characterize the aging degree.
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5

V-CNT Characterization Techniques

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The surface morphology
of the V-CNT was examined by field emission scanning electron microscopy
(Regulus 8200, Hitachi). The crystal structure was characterized by
an X’Pert Pro MPD X-ray diffractometer (Panalytical, Holland).
Optical absorption rate (A %) was recorded by a UV–vis–NIR
spectrometer equipped with an integrating sphere (Lambda 750s, PerkinElmer).
A contact angle detector (DSA 30, Krüss) was used to characterize
the surface-wetting property of the sample. The ion concentration
of water was tracked by inductively coupled plasma atomic emission
spectrometry (ICP-OES, ThermoFisher Scientific iCAP 7400).
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6

Characterization of ITO Thin Films for LED

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High-magnification scanning electron microscopy (SEM) images were obtained using a PHILIPS XL30S instrument with an accelerating voltage of 10 kV. The RI and layer thickness were measured using variable angle spectroscopic ellipsometry. The X-ray photoelectron spectroscopy (XPS) was performed using 8A beam line, Pohang Accelerator Laboratory (PAL) with a base pressure of 5 × 10−10 torr. The crystallinity of ITO films was identified using a Rigaku D/Max-2500 X-ray diffractometer. The UV-visible spectra were recorded on a Perkin Elmer Lambda 750S UV/VIS spectrophotometer with a wavelength range from 400 nm to 800 nm. Light output–current–voltage (LIV) characteristics of LED were measured using an Agilent B2902A precision source-measurement unit.
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7

Extensive Characterization of Nanomaterials

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The as-prepared products were characterized on an XRD (Bruker-D8 advance) equipped with a Cu Kα radiation source (λ = 1.5418 Å) at a scanning rate of 6 ° min−1; X-ray tube voltage and current were set at 40 kV and 40 mA, respectively. SEM, TEM, and HAADF-STEM images were taken with an FEI Nova NanoSEM NPE218, JEM-2100, and JEM-ARM200F, respectively. The samples were prepared by dropping ethanol dispersion of samples onto carbon-coated copper TEM grids using pipettes and dried under ambient condition. EELs were recorded using an FEI Talos F200X equipped with super-EDX and energy filter (Gatan GIF Quantum ER 965) operated at 200 kV under STEM mode. By using Gatan Quantum 965 with dual EELs capability, both low- and high-loss region were collected near simultaneously, which allows accurate measurement of chemical shifts as EELs SI analysis was carried out. XPS was performed on an AXIS ULTRA DLD X-ray photoelectron spectrometer. UV-Vis absorption spectrum was obtained from Lambda 750S (Perkin Elmer, Inc., USA). Elemental content was tested by EDX and ICP-optical emission spectroscopy (iCAP7600). Raman spectra were recorded by a DXR Raman spectrophotometer (Thermo Fisher Scientific) at an excitation radiation wavelength of 532 nm.
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8

Quantifying CHC and R848 in Dendrimer Formulations

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The UV–vis (Lambda 750 S, PerkinElmer) method was employed to ascertain the concentrations of CHC and R848 in G5‐CHC‐R, G5‐CHC, and G5‐R solutions. Different concentrations of free CHC (0.5, 1, 2, 4, 6, 8, 10, 12, 14, 16, 18, and 20 µg mL−1) or R848 (0.01, 0.02, 0.04, 0.06, 0.08 mg mL−1) were dissolved in DMSO/ DI water 8:2 (V/V), and the UV spectra at CHC 665 nm and R848 325 nm was measured. The content of CHC and R848 in G5‐CHC‐R, G5‐CHC, and G5‐R solutions was calculated by drawing the standard absorption curves. The drug loading efficiency (DLE) of CHC or R848 in G5 was calculated as follows: DLE (wt.%) = (loaded drug weight) / (total drug weight) × 100%
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9

Optical Spectrum Measurement of Origami Metamaterial

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The optical spectrum measurement of the origami metamaterial is conducted using the Perkin Elmer Lambda 750 S, operating under the wavelength range of 400−1000 nm. With the assistance of a 60 mm integrating sphere, transmittance and reflectance are simultaneously measured. Due to the limitation of the test fixture, the optical spectrum of a 1.5 × 1.5 cm² square planar state sample at normal incidence is measured as a representative measurement instead of the entire sample.
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10

Determining Semiconductor Band Gap

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Diffuse reflectance measurements were collected using a UV-visible near-IR spectrophotometer (PerkinElmer Lambda 750 S) using deuterium and tungsten lamps and equipped with a 100-mm integrating sphere. Diffuse reflectance data were converted into the Kubelka-Munk function, f(R),102 assumed proportional to the absorption coefficient throughout the visible region, which was used in the construction of a Tauc plot.103 ,104 The band gap was estimated by determining the x-axis intercept of a linear fit of the absorption edge. This was fitted by the plotting of a linear function passing through the two data points between which the largest gradient was observed.
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