UV–vis–NIR absorption
spectra were recorded using an Agilent 8453 spectrophotometer. Transmission
electron microscopy was performed using a JEOL JEM 1010 microscope
operating at an acceleration voltage of 100 kV. EDX analysis was performed
using a JEOL 2100F field emission electron microscope equipped with
an energy-dispersive X-ray (EDX) spectrometer, operating at an accelerating
voltage of 200 kV. AFM images were collected on dry samples using
a Multimode 8 Nanoscope V (Veeco) in the tapping mode and an NCHV-A
cantilever (antimony (n)-doped Si, tip ROC < 10 nm, K = 40 N m–1, frequency 339–388 KHz). In
the case of hydrated samples, AFM images on were recorded using the
Peak Force QNM mode and a ScanAsyst-Fluid cantilever (silicon nitride,
tip ROC < 10 nm, K = 0.7 N m–1, frequency 150 KHz).
spectra were recorded using an Agilent 8453 spectrophotometer. Transmission
electron microscopy was performed using a JEOL JEM 1010 microscope
operating at an acceleration voltage of 100 kV. EDX analysis was performed
using a JEOL 2100F field emission electron microscope equipped with
an energy-dispersive X-ray (EDX) spectrometer, operating at an accelerating
voltage of 200 kV. AFM images were collected on dry samples using
a Multimode 8 Nanoscope V (Veeco) in the tapping mode and an NCHV-A
cantilever (antimony (n)-doped Si, tip ROC < 10 nm, K = 40 N m–1, frequency 339–388 KHz). In
the case of hydrated samples, AFM images on were recorded using the
Peak Force QNM mode and a ScanAsyst-Fluid cantilever (silicon nitride,
tip ROC < 10 nm, K = 0.7 N m–1, frequency 150 KHz).