Xrd 7000 x ray diffractometer
The Shimadzu XRD-7000 is an X-ray diffractometer. It is designed to analyze the crystalline structure of materials by measuring the diffraction patterns produced when X-rays interact with the sample.
Lab products found in correlation
25 protocols using xrd 7000 x ray diffractometer
X-ray Powder Diffraction Protocol
Multimodal Soil and Beverage Analysis
X-ray diffraction analysis of the BT samples was conducted on a Shimadzu XRD-7000 X-ray diffractometer (Shimadzu, Kyoto, Japan) [54 (link)]. Analysis conditions were as follows: Cu Kα radiation (1.54 Å), Ni filter, operating voltage of 40 kV, 30 mA, angle range of 3–70 degrees, and scan speed of 1 degree/min.
Thermal analysis of soils was carried out on an STA-409 PC Luxx derivatograph (Netzsch, Selb, Bavaria, Germany) [54 (link)]. Thermal analysis conditions were as follows: temperature range of 30–1000 °C, recording in an air atmosphere in platinum crucibles at a heating rate of 10 °C/min.
Cerium-based Photocatalyst Synthesis and Characterization
SEM (scanning electron microscopy) images were acquired using a Hitachi S4800 field-emission scanning electron microscope. XRD (X-ray diffraction) patterns were recorded using a Shimadzu XRD-7000 X-ray diffractometer equipped with a Cu Kr radiation source at a scanning rate of 1° min−1. PL (photoluminescence) spectra were recorded using a Hitachi F-4600 fluorescence spectrometer. UV-vis spectra and UV-vis diffuse reflectance spectra were recorded using an Agilent Cary 5000 spectrophotometer. XPS (X-ray photoelectron spectroscopy) spectra were recorded using a Thermo Fisher Scientific ESCALAB 250XI and the binding energies were calibrated by C 1s 284.8 eV. The BET surface area was estimated using a Micromeritics ASAP 2020 adsorption porosimeter based on the nitrogen isotherms at 77 K. TG (thermogravimetric) analysis was carried out using a NETZSCH TG 209 thermal analyzer at a heat rate of 5 °C min−1 in the air. Photoelectrochemical estimates were completed using a Chenhua CHI660E electrochemical workstation.
Characterization of Ag-NPs/Kaolin Composite
diffraction (XRD) patterns of kaolin and Ag-NPs/kaolin composite powders
were performed on an XRD-7000 X-ray diffractometer (Shimadzu, Japan)
using Cu Kα radiation (λ = 0.15406 nm) at a 40 kV generator
voltage and 30 mA generator current. The scanned 2θ range was
from 10° to 80°, and the scanning rate was 3°/min.
The UV absorption spectra were obtained on a Cary 60 UV–vis
spectrophotometer (Agilent Technologies, Santa Clara, California,
USA). Fourier transform infrared (FT-IR) spectra were recorded on
an FT/IR-6600 FT-IR spectrometer (JASCO International Co., Ltd., Tokyo,
Japan) between 4000 and 400 cm–1. Brunauer–Emmett–Teller
(BET) surface area, pore volume, and pore size measurements were done
using Quantachrome NovaWin-Data Acquisition and Reduction for NOVA
instruments 1994–2010, Quantachrome Instruments version 11.0
at 77.3 K. The BET model determined the surface areas of beneficiated
kaolin and Ag-NPs/Kaolin composite according to the BET isotherm at
a P/P0 ratio from 0.0458
to 0.297. The samples were exposed to an overnight drying process
at 90 °C to eliminate any volatile moisture and pollutants that
had been adsorbed. Scanning electron microscopy (SEM) images were
observed by JEOL NeoScope JCM-6000Plus Benchtop SEM (HITACHI, Japan)
at accelerating voltages of 10 and 15 kV.
X-ray Diffraction Analysis of Samples
were recorded on a Shimadzu XRD 7000 X-ray diffractometer at 40 kV
and 30 mA with Cu Kα radiation (λ = 0.154 nm) in the range
of 2θ = 5–35° for samples using a fixed time mode
at a scan speed of 2°·min–1 in steps of
0.02°.
Structural Characterization of Aerogels
Characterization of Non-activated and Acid-activated Clays
Crystallinity Assessment of AE-Loaded LCNPs
Characterization of Biosynthesized Silver Nanoparticles
Comprehensive Characterization of Adsorbent Materials
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