Tecnai g2 f30 s twin tem

An X-ray diffraction (XRD) analysis of the catalysts was carried out at the XPert Pro MPD (PANalytical B.V., Almelo, The Netherlands) with Cu-Kα radiation generated at 45 kV and 40 mA. The morphologies of the catalysts were charactered by means of field emission scanning electron microscopy (FESEM, S-4800; Hitachi, Tokyo, Japan), which was operated at an accelerating voltage of 4 kV. The transmission electron microscopy (TEM) investigation was performed at the Tecnai G2F30 S-Twin TEM (FEI, Amsterdam, The Netherlands). The X-ray photoelectron spectroscopy (XPS) experiments were performed with a Thermo Scientific ESCA-Lab-200i-XL spectrometer (Waltham, MA, USA), which utilized monochromatic Al Alα radiation (1486.6 eV), and the C 1s and N 1s peak spectra were analyzed by using XPS Peak 4.1 software. To quantify the specific surface areas of examined catalysts, Brunauer–Emmett–Teller analysis was performed (BET, ASAT 2020M+C, Micromeritics, Micromeritics Instrument Co., Norcross, GA, USA), using the nitrogen adsorption and desorption isotherms at liquid nitrogen temperature (77 K). UV-Vis diffuse reflectance spectroscopy was recorded on a UV/Vis spectrophotometer (UV/Vis DRS, UV-2550, Shimadzu, Tokyo, Japan) over the wavelength range between 200 and 800 nm.

The morphology of the as-prepared nanostructures was studied with a S-4800 II field-emission scanning electron microscope (SEM) and a Tecnai 12 transmission electron microscope (TEM) (Philips). The high-resolution transmission electron microscope (HRTEM) image and selected area electron diffraction (SAED) image were captured by using a Tecnai G2 F30 S-Twin TEM (FEI). The chemical composition of the AuNPs–AgNWs was also analyzed by using a S-4800 II field-emission scanning electron microscope. The optical density (OD) at 450 nm of CCK-8 was measured by using a Cary UV-5000 spectrometer.

XRD patterns of the perovskite powders were analyzed by using filtered Cu-Kα radiation (λ = 1.5418 Å) on an X-ray diffractometer (Rigaku Smartlab). Detailed structural information was extracted from the XRD refinements. SAED patterns were collected at 200 kV on a TEM instrument (JEM-2100 UHR, JEOL, Japan). HAADF-STEM image and corresponding elemental mapping were taken at 300 kV on a Tecnai G2 F30 S-Twin TEM (FEI, America). SEM image was performed on a Hitachi S-4800 scanning electron micro-analyzer. BET method (Quantachrome Autosorb-iQ₃) was applied to obtain the specific surface areas of perovskite powders. Soft XAS spectra at O-K edge in TEY and FY modes were conducted at the TLS BL20A of the NSRRC in Taiwan. To calibrate the photon energy, a NiO sample was measured simultaneously for O-K edge.

Nuclear magnetic resonance (NMR) spectra were recorded in D₂O on Agilent Technologies 800/54 premium. Fourier transform infrared spectroscopy (FT-IR) was performed on Thermo Scientific Nicolet iS10 spectrometer. UV–vis absorption spectra were collected on Agilent Cary 60 spectrophotometer and Shimadzu UV-1900 spectrophotometer. The fluorescence spectra were measured on Hitachi F-7000. The fluorescence lifetime and quantum yield were recorded on an Edinburgh Instruments FLS980. Gadolinium in Gd@CDs was quantified by Thermo Fisher iCAP Qnova Series inductively coupled plasma mass spectrometry (ICP-MS). X-ray photoelectron spectroscopy (XPS) analysis was recorded by Kratos Axis Utra Dld. Raman spectra were measured on Labram Aramis with an excitation wavelength of 532 nm. The morphologies were observed with FEI Tecnai G2 F30 S-TWIN TEM. The hydrodynamic diameter and zeta potential of nanoparticles were measured by a PSS-Nicomp 380ZLS.

The UV-visible absorption spectra were recorded with an Agilent Cary UV-5000 UV-vis spectrophotometer (USA). Transmission electron microscopy (TEM) images were characterized by Tecnai 12 TEM (Philips, Netherlands). Scanning electron microscopy (SEM) images were obtained with an S-4800II field emission SEM (Hitachi, Japan). High-resolution TEM (HRTEM) images, high-angle annular dark-field scanning TEM (HAADF-STEM) images, and selected area electron diffraction (SAED) were captured by Tecnai G2 F30 s-twin TEM (FEI, USA). Raman spectra of test lines were obtained on an inVia micro-Raman spectrometer (Renishaw, UK).