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Pw 1830 x ray diffractometer

Manufactured by Philips

The PW 1830 X-ray diffractometer is a laboratory instrument designed for the analysis of crystalline materials. It utilizes X-ray diffraction technology to obtain information about the atomic and molecular structure of a sample. The core function of this device is to measure the diffraction patterns produced when a sample is exposed to X-rays, providing data on the material's crystallographic properties.

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9 protocols using pw 1830 x ray diffractometer

1

Corrosion Monitoring and Patina Analysis of Bronze Artifacts

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The macrocouple current flowing between the gilding and the bronze is directly correlated by Faraday's Law, to the corrosion rate and is continuously monitored by means of a high precision Keithley 3706 multimeter. The same equipment has been used to measure the driving force for the galvanic corrosion and the electrical resistance of the artificial patina. The resolution of the multimeter is 0.01–100 μV in the 100 mV–300 V range, 0.1 μΩ–10 Ω in the 1 Ω–100 MΩ range and 1 pA–1 μA in the 10 μA–3 A range.
Stereomicroscopic observation of the patina and of the sensors surface has been performed using a Leica M205C stereomicroscope, equipped with a Leica DFC290 digital camera.
Infrared spectra of patinas were recorded in transmission mode, in the spectral range between 4,000 and 400 cm−1 with 4 cm−1 resolution, using a Thermo Electron Nicolet 6700 FTIR spectrometer.
A Philips PW1830X-Ray Diffractometer (XRD) with a PW3020 generator, in the Bragg-Brentano geometry and Thin Film, copper anticathode (Kα1 radiation;, was used for phase identification of patinas.
Environmental Scanning Electron Microscope (ESEM) was performed using a Zeiss EVO 50 EP instrument equipped with a LaB6 source and an Oxford INCA 200—Pentafet LZ4 X-ray spectrometer was used to observe patina morphology and to determine elemental compositions.
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2

Structural Analysis of Magnetite, Graphene Oxide, and Nanocomposites

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The crystalline structure of synthesized magnetite, graphene oxide nanosheets and GO/MNP nanocomposites were identified by Philips PW 1830 X-ray diffractometer (Philips, Eindhoven, the Netherlands) operating in Bragg-Brentano focusing geometry with CuKα radiation. Powder samples were used for the analysis and the crystallite size of the MNPs was determined from the broadening of the most intensive peak of the XRD pattern by using the Scherrer equation [45 ]. The morphology of the individual particles and the nanocomposite samples was studied by transmission electron microscopy using a Jeol JEM-1400+ device (JEOL Ltd., Tokyo, Japan) operating at 80 kV accelerating voltage. The primary particle size and the size distribution of MNPs were determined by JMicrovison software version 1.2.7 counting ~100 particles.
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3

Characterization of Nanoparticle Crystalline Phase

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The preliminary results regarding the crystalline phase of nanoparticles (NPs) were obtained from an X-ray diffraction study using a Philips PW 1830 X-ray diffractometer with a Cu-Kα radiation source. For the morphological analysis, transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) were performed, and selected area electron diffraction (SAED) patterns were obtained using a Tecnai G2 F20 electron microscope with a voltage of 200 kV.
The X-ray photoelectron spectroscopy (XPS) was recorded on a PHI 5000 Versa Probe-III. The Fourier transform infrared (FTIR) spectra (400–4000 cm−1 range) of as-prepared materials were recorded using a KBr disc with a RX-I FTIR spectrophotometer (PerkinElmer USA). The UV-Vis absorption and reflectance spectra in solutions (H2O) as well as solids (diffuse reflectance spectroscopy, DRS) were obtained using a UV-Vis spectrophotometer (UV-2450 PerkinElmer). The photoluminescence (PL) emission spectra of photocatalysts in solid and also in solution phase were measured by a Fluoromax 4P spectrophotometer (Horiba Jobin Yvon USA) at an excitation wavelength of 345 nm. The electrochemical impedance analysis and the Mott–Schottky plots were carried out by using cyclic voltammetry (CV) with an AUTOLAB 302N modular potentiostat.
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4

X-ray Diffraction Analysis of Samples

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WAXD patterns were obtained using a PW1830 X-ray diffractometer (Philips Co., Holland). The Cu Kα radiation (λ = 0.15418 nm) source was operated at 30 kV and 30 mA. All measurements were conducted at room temperature under atmospheric pressure. The scans were obtained between Bragg angles of 10–25° at a rate of 1.0° min−1.
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5

Comprehensive Characterization of Nanostructured Materials

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The morphologies of the samples were examined by scanning electron microscopy (SEM) using JEOL JSM-6700F at an accelerating voltage of 5 kV and transmission electron microscopy (TEM) on a JEOL 2010F microscope operating at 200 kV. The crystal phases of the samples were carried out using X-ray diffraction (XRD) performed on a Philips PW-1830 X-ray diffractometer with Cu kα irradiation (λ = 1.5406 Å). X-ray photoelectron spectroscopy (XPS) was measured on a PerkinElmer model PHI 5600 XPS system with a resolution of 0.3–0.5 eV from a monochromated aluminum anode X-ray source with Kα radiation (1486.6 eV). The Co/Ni molar ratio in the samples was determined by X-ray fluorescence spectroscopy (XRF) carried out on EAGLE III (EDAX Inc). Brunauer–Emmett–Tell (BET) surface area of the samples were obtained from nitrogen sorption isotherms at 77 K and were carried out on Micromeritics ASAP 2460 instrument.
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6

Synthesis and Characterization of TPO Derivatives

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Chemicals were purchased from Energy-Chemical, Sigma-Aldrich, J&K and used without further purification. Solvents and other common reagents were obtained from Sigma-Aldrich. Solvents were dried and distilled out before being used for the synthesis. 1H NMR and 13C NMR spectra were measured on a Bruker ARX 400 MHz spectrometer. High-resolution mass spectrometry (HRMS) were recorded on a GCT Premier CAB 048 mass spectrometer operating in MALDI-TOF mode. The starting materials and TPO derivatives were synthesized following the procedures described in the literature. Single-crystal X-ray diffraction measurements were conducted on a Bruker-Nonius Smart Apex CCD diffractometer with graphite monochromated Mo Kα radiation. Powder and film X-ray diffraction was performed using a Philips PW 1830 X-ray Diffractometer. The detail experimental procedure and synthetic methods are described in Supplementary information.
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7

Characterization of Titanium Dioxide Layers

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The crystal structure of the prepared titanium dioxide layers was determined using X-ray diffraction (XRD) using a PW1830 X-ray diffractometer (Philips, Amsterdam, Netherlands) with a CuKα radiation source (λ = 1.54056 Å) for 2θ = 10–70° with a step size of 0.05. Scanning electron microscope (SEM) images of the microstructure and morphology of the obtained material were taken with a TM-3000 SEM microscope (Hitachi, Chiyoda, Tokio, Japan). Optical photographs were obtained by means of a TPL Trino (Rhede, Germany) stereoscopic microscope equipped with a DLT-Cam PRO 5 MP camera (Mińsk Mazowiecki, Poland).
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8

Comprehensive Nanomaterial Characterization Protocol

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TEM and STEM observations were taken on a FEI Titan Cubed Themis G2300 transmission electron microscope with an acceleration voltage of 300 Kv. Carbon coated copper grids were dipped in the chloroform solutions to deposit the samples onto the films. UV-visible spectra were recorded on an HP8453 UV-visible spectrophotometer. X-ray powder diffraction (XRD) patterns were obtained by using a Philips pw1830 X-ray diffractometer. X-ray photoelectron spectroscopy (XPS) were obtained by using K-Alpha+. Dynamic light scattering (DLS) measurement was performed by NanoBrook ZetaPlus. Confocal images were taken using a Leica TSC SP8 confocal laser scanning microscope (Germany) with a 63× oil-immersion objective.
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9

Characterization of Biogenic Silver Nanoparticles

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A UV-vis spectrophotometer (Perkin Elmer, LS 55) was used to characterize the synthesized AME-AgNPs. The components in the extract were characterized using a Shimadzu FTIR Prestige 21 spectrophotometer (Shimadzu Corporation, Kyoto, Japan) in the KBr phase (1:100).1 (link),2 (link),5 (link) The spectrum was recorded in the range of 400–4000 cm-1. The XRD pattern of the synthesized AME-Ag NPs was constructed using spectral data collected with a Philips PW-1830 X-ray diffractometer. A scanning electron microscope (SEM) (JEOL, Japan) and energy dispersive X-ray spectroscopy system (EDAX Inc.) were used. The AgNPs were observed by transmission electron microscopy (TEM) (JEOL, Japan).
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