The films were deposited at room temperature onto high-resistivity Si/SiO2 wafers by DC and RF magnetron sputtering. Base pressure of ≤1 × 10−6 Pa and Ar gas were used during the sputtering. The epitaxial growth and crystal structure of SAF films stack were investigated by cross-sectional scanning transmission electron microscopy (STEM) analysis using FEI Titan Themis 200 TEM. The microscope was operated at 200 kV accelerating voltage. To improve STEM imaging quality and reduce the effects of sample drift and scanning noise, the method of drift corrected frame integration was implemented. The atomic level distribution of elements crossing the interfaces in the films stack were probed by secondary electron mass spectrometry (SIMS) using PHI nano TOF II TOF-SIMS (ULVAC-PHI).
Titan themis 200 tem
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Titan Themis 200 TEM is a transmission electron microscope (TEM) produced by Thermo Fisher Scientific. It is designed to provide high-resolution imaging and analytical capabilities for materials science and nanotechnology research.
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2 protocols using titan themis 200 tem
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Characterization of Sputtered SAF Films
2
Characterization of Mn-ZnO2 Nanoparticles
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Transmission electron microscopic (TEM) imaging was taken with a Titan Themis 200 TEM (FEI, Hillsboro, USA) at an acceleration voltage of 200 kV. UV-vis-NIR absorption spectra were obtained with a multi-detection microplate reader (BioTek Instruments, Inc., Winooski, VT). The wide-angle powder X-ray diffraction (XRD) pattern was recorded using an X-ray diffractometer (Philips X'pert XRD system) with a Cu Kα (1.5406 Å) X-ray source at 40 kV and 40 mA and a scan rate of 5° (2θ)/min (scan range: 10-90°). The size of different nanoparticles was determined by dynamic light scattering (Zetasizer 3000HS; Malvern Instruments, Worcestershire, UK). The surface area and pore size of the nanoparticles were determined by using the Brunauer-Emmett-Teller (BET), nitrogen adsorption-desorption, and Barrett-Joyner-Halenda (BJH) methods (Micromeritics, ASAP 2020), respectively. The XPS measurements were performed using a PHI-5000 CESCA system (PerkinElmer) with the radiation from an Al Kα (1486.6 eV) X-ray source. For in vitro MRI imaging, Mn-ZnO2 nanoparticles with different concentrations (0, 0.1, 0.2, 0.4, and 0.8 mg/mL) were added into 200 μL tubes for MRI signal detection using an microMRI instrument (Bruker BioSpec 94/30 9.4 T MRI).
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