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Eos rebel xs

Manufactured by Canon
Sourced in Japan

The EOS Rebel XS is a digital single-lens reflex (DSLR) camera. It features a 10.1-megapixel CMOS image sensor, a 2.5-inch LCD screen, and the ability to capture high-definition video. The camera is designed for entry-level users and provides a range of automatic and manual shooting modes.

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5 protocols using eos rebel xs

1

Characterization of Cs-TiO2-CIP Nanocomposite

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The possible interactions between the components within the polymeric system were studied by Fourier transform infrared (FT-IR) spectroscopy via a KBr pellet procedure. FT-IR spectra of Cs, TiO2-NTs, CIP, and TiO2/CIP/Cs were recorded using a PerkinElmer Spectrum Version 10.03.06. The nanocomposite’s surface morphologies were investigated using the KYKY-EM3200 field-emission scanning electron microscope (FE-SEM) at an accelerated voltage of 25 KV. As part of our surface characteristics, we used a camera (Canon EOS Rebel XS, Tokyo, Japan) and a macro lens (105 mm F2.8 EX DG OS, Sigma, St. Louis, MI, USA) to collect ten sessile drop measurements from each group. Contact angle (CA) was measured using the 10 μL dH2O droplets’ profiles created using the software Digimizer, which produced the changed surfaces immediately after stabilization. Energy-dispersive X-ray spectroscopy (EDX) was performed to chemically analyze Cs coated TiO2-NTs’ surfaces (JEOL JSM-5910LV, Tokyo, Japan) using a scanning electron microscope.
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2

Surface Characterization of Stainless Steel Plates

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Column master, SS, SS-TiO2 coated and SS-TiO2 micropatterned plates were characterized using atomic force microscopy (AFM) (Nanosurf Easyscan 2, Nanosurf AG, Switzerland) in tapping mode performed with a NCLR (Nanosensors™, Switzerland) tip at a force constant of 48 N/m. Images post processing was performed using software AxioVision (V 4.9.1.0, Carl Zeiss Microscopy GmbH, Germany), software Image J 1.51 J43 (link), and software WSxM 5.044 (link).
SS316L surface properties were evaluated by AFM as described above and by contact angle measurement using distilled water. AFM images of 50 µm × 50 µm were used for surface roughness measurements with the arithmetic average of the roughness profile (Ra) calculated using software for AFM analysis (Gwyddion 2.34, Department of Nanometrology, Czech Metrology Institute, Czech Republic). Contact angle measurements followed the sessile drop method on 10 random plates from each group using a camera (Canon EOS Rebel XS, Japan) and a macro lens (105 mm F2.8 EX DG OS, Sigma, USA) with the angle values obtained using software Axio Vision. In addition, Energy-Dispersive X-Ray Spectroscopy (EDX) was used to chemically characterize SS polished and SS-TiO2 coated surfaces using a scanning electron microscopy (JEOL JSM-5910LV, Japan).
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3

Standardized Facial Photography Protocol

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At each visit, the front, left, and right lateral photographs were taken of the whole and lower face in normal daylight, with eyes closed (Canon EOS Rebel XS with a 50-mm lens and two flashes positioned on a Faraghan Medical System). All photos were standardized for light (using Gretag MacBeth Colour Checker Chart) and position (stereotaxic table; Eotech SA, Marcoussis, France).
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4

Comparative Anatomical Analysis of Vertebrate Specimens

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Anatomical terminology follows Mead & Fordyce (2009) and Godfrey, Geisler & Fitzgerald (2013) (link). All photographs were taken with a Canon EOS Rebel XS and 80 mm zoom lens.
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5

Surface Characterization of Experimental Samples

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The natural leaves, polished SS 316L plates and transferred plates from the three experimental groups were characterized by means of atomic force microscopy (AFM, Nanosurf Easyscan 2, Nanosurf AG, Liestal, Switzerland), to determine the surface roughness, and contact angle (CA) method to assess surface hydrophobicity. For AFM acquisition, a NCLR tip (Nanosensors™, Neuchâtel, Switzerland) in tapping mode at a constant force of 48 N/m was used. AFM images were processed using AxioVision software (V 4.9.1.0, Carl Zeiss Microscopy GmbH, Jena, Germany), Image J software (1.51 J, Laboratory for Optical and Computational Instrumentation, University of Winsconsin, Madison, WI, USA) [32] (link) and WSxM software (5.0, Nanotec Electronic and New Microscopy Laboratory, Madrid, Spain) [33] (link). 10 AFM images of 50 × 50 µm 2 per group were used to obtain the arithmetic average of the roughness profile (Ra) using the Gwyddion software (2.34, Department of Nanometrology, Czech Metrology Institute, Brno, Czech Republic). For surface hydrophobicity, the sessile drop method was used on 10 plates from each group. A camera (Canon EOS Rebel XS, Tokyo, Japan) and a macro lens (105 mm F2.8 EX DG OS, Sigma, Ronkonkoma, NY, USA) were used to obtain the images and the angle values were obtained using software AxioVision (V. 4.9.1.0).
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