Highscore 4.1 softwarefrom

The XRD analysis
was performed on a PANalytical Empyrean X-ray diffractometer equipped
with a 1.8 kW CuKα ceramic X-ray tube and PIXcel^3D 2 × 2 area detector, operating at 45 kV and 40 mA. Specimens
for the XRD measurements were prepared in a glovebox by dropping a
concentrated NCs solution onto a quartz zero-diffraction single crystal
substrate. The diffraction patterns were collected in air at room
temperature using a parallel beam geometry and symmetric reflection
mode. XRD data analysis was carried out using HighScore 4.1 software
from PANalytical. The Le Bail fit of the XRD pattern was performed
using the Fox program.^{52 (link),53 (link)}

The
XRPD analysis was performed on a PANanalytical Empyrean X-ray diffractometer,
equipped with a 1.8 kW Cu Kα ceramic X-ray tube, operating at
45 kV and 40 mA, and a PIXcel^3D 2 × 2 area detector.
To avoid the preferred orientation effect, the concentrated dispersions
of NCs were mixed with fumed silica powder prior to their deposition
on a zero-diffraction silicon substrate. All of the diffraction patterns
reported here were collected at room temperature under ambient conditions
using the parallel beam geometry and symmetric reflection mode. Postacquisition
XRPD data analysis was carried out using the HighScore 4.1 software
from PANalytical.