Titan themis g2 60 300

The TEM images were carried out on a Titan Themis G2 60-300 (Thermo Fisher, United States). Nitrogen physisorption isotherms were measured on a TriStar II 3flex instrument. XRD patterns were obtained utilizing a D8 ADVANCE (Bruker, Germany). XPS was performed by Thermo ESCALAB 250XI (Thermo Fisher, United States) with an X-ray source (Mg Kα hυ = 1486.6 eV). Raman spectra were measured by a Renishaw inVia Raman spectrometer (Thermo Fisher DXRxi). All the UV-vis absorption spectra were performed by a microplate reader (Tecan Spark, Switzerland). The ESR spectra were obtained from an ESR spectrometer (Bruker EMX plus, Germany).

The XRD characterization was measured using a D8 Advance X-ray diffractometer with a Cu Kα X-ray source. The Raman spectra were collected using a Renishaw INVIA micro-Raman spectroscopy system. The XPS measurement was performed using a VG MultiLab 2000 instrument. The SEM images were obtained using a JEOL JSM-7100F at an acceleration voltage of 20 kV. Elemental mapping was conducted by using an EDX-GENESIS 60S spectrometer. The Brunauer–Emmett–Teller (BET) and Barret–Joyner–Halenda (BJH) plots was performed from nitrogen adsorption isotherms collected at 77 K using a Tristar-3020 instrument. Transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), and energy dispersive X-ray spectroscopy (EDS) mapping images were taken by ThermoFisher Titan Themis G2 60-300. To explore the discharged product of the S/NCF electrode, the discharged cells were disassembled in the glovebox, and the corresponding S/NCF cathode was used for further characterizations. To investigate the morphology and structure of the Al anode surface in Al–Mo and Al–S cells, the resulting Al anode after cell disassembly was fully washed by hexane to remove the residual electrolytes. Time-of-flight-secondary ion mass spectrometry (TOF-SIMS) measurement was carried out using a PHI nanoTOF 3 to analyze the depth profiles of different secondary ions on the Al anode surface.

The selected small single crystals were shaped and reduced in size by focused ion beam (FIB) milling (Helios Nanolab G3 UC, FEI) for the structural characterization and in-situ TEM observation. in-situ TEM characterization for structural evolution was carried out by transmission electron microscopy (Talos F200s, FEI) and a double-tilt TEM-STM electrical holder provided by ZEPTools Technology Company. The atomic resolution HAADF-STEM images were obtained by a double C_S-corrected transmission electron microscopy (Titan Themis G2 60–300, FEI). A continuous series of drift-corrected images were averaged to reduce scanning noise and sample drift during the acquisition process.