Fei nova nanosem 230
The FEI Nova NanoSEM 230 is a high-performance scanning electron microscope (SEM) designed for advanced materials characterization and nanoscale imaging. It features a field emission electron source, high-resolution capabilities, and a range of imaging modes to enable detailed analysis of a variety of samples.
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17 protocols using fei nova nanosem 230
Comprehensive Material Characterization Using XRD, FT-IR, and SEM
Structural and Compositional Analysis of Vascular Prosthesis
Samples of the vascular prosthesis were disintegrated in microtome (1 mg), dried 1 h at 70 °C under reduced pressure. Then, they were mechanically blended with 300 mg of the KBr, and disks were prepared at the pressure of a hydraulic press of 8 atm. under reduced pressure. The disk was disintegrated, and 280 mg of powder was dried again at the conditions described above [15 ]. After that, the KBr-disk was composed again. FTIR spectra of investigated samples were recorded on an FTIR (Spectro-Lab, Warszawa, Poland) spectrometer. The spectra were recorded in the range of wavenumber of 4000–650 cm−1, at the distribution of 4 cm−1. The background of the spectra was subtracted based on the individual peaks and on the group of peaks, using either the computer software of the instrument or Peak Fit for Windows. The peak areas were calculated using Voight’s or Lorentz’s function.
Characterization of Functionalized Graphene Oxide
Morphological Analysis of Tensile Fracture
Characterization of Material Morphology
Tooth Surface Characterization using FE-SEM
Comprehensive Characterization of Composite Materials
Ultrastructural Analysis of Cell Samples
Characterizing Hybrid Nanoparticle Stability
Morphological Analysis of LS-SNCs and U-LS-SNCs
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