Isr 2600plus
The ISR-2600Plus is a laboratory instrument manufactured by Shimadzu. It is designed to perform spectroscopic analysis. The core function of the ISR-2600Plus is to measure the reflectance or transmittance of samples across a range of wavelengths.
Lab products found in correlation
13 protocols using isr 2600plus
Comprehensive Material Characterization Protocol
Shimadzu UV-Vis Spectrophotometry Protocol
Optical Characterization of Turbid Phantoms
homogeneous model samples, made of polytetrafluoroethylene (PTFE),
polyethylene (PE), and polystyrene (PS), exhibiting different optical
properties (μa, μS′) in the
NIR spectral region (see
phantom structured as a layered turbid matrix made of PE (50 mm ×
50 mm × 3 mm each layer) and paracetamol (cylindrical shape radius
= 2, 3, and 5 mm, thickness = 3 mm) was used for mimicking the presence
of an inclusion (paracetamol) at depth in the turbid matrix (PE) (see
phantom was an assembly in order to permit the variation of the overall
thickness (t = 12, 18, 21, and 24 mm) and the amount
of the inclusion (m = 125, 250, and 500 mg of paracetamol).
The optical properties of the phantom matrix were characterized using
a benchtop spectrophotometer equipped with an integrating sphere (ISR-2600Plus,
Shimadzu). Diffuse reflectance measurements were performed from 700
to 1100 nm with a spectral resolution of 0.2 nm. From the spectral
reflectance of the sample (R(λ)), the Kubelka–Munk
model22 (link) was applied for evaluating the
scattering and absorption properties of the turbid matrix (i.e., k/s
Kubelka–Munk function23 ).
Quantification of ZnO Nanoparticles in Samples
Quantifying Au Nanoparticles on TiO2
Diffuse Reflectance Spectra Acquisition
UV-vis and Photoluminescence Characterization
Characterization of Au-CdS Nanocomposites
of Au and CdS were quantified by inductively coupled plasma spectroscopy
(ICPS-7500, Shimadzu). X-ray diffraction (XRD) analysis was carried
out with a Rigaku SmartLab X-ray diffractometer. Diffuse reflectance
UV–vis spectra of the samples were recorded on a UV-2600 spectrometer
(Shimadzu) with an integrating sphere unit (Shimadzu, ISR-2600Plus)
at room temperature. BaSO4 was used as a reference material
to evaluate the reflectance (R∞) of the samples. The reflectance was transformed to the Kubelka–Munk
function [F(R∞)] presenting the relative absorption coefficient by the equation F(R∞) = (1 – R∞)2/2R∞.43 (link) Transmission electron
microscopy (TEM) measurements were performed using a JEOL JEM-2100F
at an applied voltage of 200 kV. X-ray photoelectron (XP) spectroscopy
measurements were performed using a Kratos Axis Nova X-ray photoelectron
spectrometer with a monochromated Al Kα X-ray source (hν = 1486.6 eV) operated at 15 kV and 10 mA. The takeoff
angle was 90°, and multiplex spectra were obtained for Cd 3d
and Au 4f photopeaks.
Optical Properties of AuNPs-HAp Suspensions
The optical properties of the textile samples were analyzed based on the total reflectance spectra measured on a UV-Vis-NIR spectrophotometer (Shimadzu UV-2600i; Kyoto, Japan) coupled with an integration sphere (Shimadzu ISR-2600Plus; Kyoto, Japan) in the range between 220 and 1400 nm, with a spectral resolution of 5 nm. The color difference (ΔE) was determined by the Shimadzu Colour Analysis complementary software - LabSolutions UV-vis version 1.12, using as a reference the respective textile treated under the same conditions, but without the AuNPs-HAp. For every sample, the reflectance was measured at least 3 times, in different spots of the sample.
Spectrophotometric Analysis of Wire Coating
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