Pw3040 60 x ray diffractometer

FESEM and EDS were conducted on A Hitachi S-4800 scanning electron micro-analyzer. TEM, HRTEM, and SAED images were acquired on a JEM-2100F field emission micro-analyzer at 200 kV. XRD was performed on a Philips PW3040/60 X-ray diffractometer equipped with Cu-Ka radiation. Ex situ Raman was conducted on a Renishaw in Via-Refles with a 532 nm laser as the exciting source. XPS was carried out on an ESCALab MKII X-ray photoelectron spectrometer using Al Ka X-ray radiation as the excitation source. In situ optical microscope pictures were captured by a BX53MRF-S optical microscope. O K-edge and Co K-edge XAS spectra were collected on the RapidXAFS 2 M (Anhui Absorption Spectroscopy Analysis Instrument Co., Ltd.), and the Si (533) spherically bent crystal analyzer with a radius of curvature of 500 mm was used for Co.

The specific surface areas
of the prepared materials were obtained via N₂ physisorption
experiments, degassing the samples at 150 °C for 20 h and then
measuring the isotherms on a Micromeritics 3Flex porosimeter at 77
K. Data were analyzed using a QuadraWin 5.05 software package applying
the Brunauer–Emmett–Teller (BET) model to the adsorption
isotherms for 0.05 < p/p₀ < 0.3. The porosity and pore distribution were calculated
by using the model of quenched solid density functional theory (QSDFT)
for N₂ adsorbed on carbon (assuming cylindrical pore shape)
at 77 K. A Philips model PW3040/60 X-ray diffractometer was used for
powder X-ray diffraction (XRD), applying Cu Kα radiation (λ
= 0.15418 nm). Elemental analysis (CHNS) was performed on a Vario
Micro device by combustion.