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Ar ion laser

Manufactured by Spectra-Physics
Sourced in Germany, Italy, United States

The Ar-ion laser is a type of gas laser that produces light in the visible spectrum, specifically in the blue-green region. It utilizes ionized argon gas as the active medium to generate laser output. The core function of the Ar-ion laser is to provide a stable and continuous-wave (CW) source of coherent light, which can be used in various scientific and industrial applications.

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4 protocols using ar ion laser

1

Visualizing PNIPAM Microgels by Optical and Confocal Microscopy

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PNIPAM microgels, in water suspension and at room temperature, were visualized with a differential interference contrast (DIC) filter under an optical microscope (Nikon Inverted Microscope Eclipse Ti-E, Nikon Instruments S.p.a, Florence, Italy) in transmission mode, by using a Plan Fluor 100.0x/1.30/0.20 oil immersion DIC H objective (Nikon), a DIC prism N2 (Nikon) and a Spectra Physics Ar+ ion laser (488 nm) as a light source. Fluorescent CS_05 and DC_05 microgels were characterized by confocal laser scanning microscopy (CLSM) by using the Nikon Inverted Microscope Eclipse Ti-E in confocal mode. The fluorescent probes covalently included in the microgels structures, Fluo-MA and Rhod-MA, were excited by the Ar+ ion laser (488 nm) (Spectra Physics, Santa Clara, CA, USA) and a Melles–Griot He–Ne laser (543 nm) (Lastek Pty Ltd, Thebarton, Australia), respectively. All images were captured using a Plan Fluor 100.0x/1.30/0.20 oil immersion objective and processed by using the EZ-C1 software (version 3.9, Nikon) and Image J freeware [45 ]. Fluorescent microgels were visualized in water suspension at room temperature, in the swollen state and in a 19.2% w/v PEG solution in the collapsed state under osmotic pressure application.
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2

Comprehensive Nanomaterial Characterization

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The image of the sample was measured on a Tecnai G2 transmission electron microscope operating at 200 kV. The UV-vis spectra were recorded on a Shimadzu UV-3600 spectrophotometer. A RS-2100 Raman spectrophotometer (Photon Design, Inc.) equipped with a CCD (Princeton Instruments) was used. Radiation with a wavelength of 514.5 nm from an Ar ion laser (Spectra Physics) was employed for the Raman excitation, with a power of 5 mW at the sample. The Raman band of a silicon wafer at 520.7 cm–1 was used to calibrate the spectrometer.
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3

Structural and Optical Characterization of SiNW

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Structural investigations of SiNW-based samples were carried out by using a field emission scanning electron microscope (FE-SEM, Carl Zeiss ULTRA 55, Carl Zeiss, Jena, Germany) and a transmission electron microscope (TEM, LEO912 AB OMEGA, Carl Zeiss, Jena, Germany). A Malvern Zetasizer Nano ZS instrument (Malvern Instruments Ltd., Malvern, England, UK) was used to determine the size and zeta potential (ζ) of SiNPs obtained from data of dynamic light scattering (DLS). The surface composition of nanoparticles was studied by using a Fourier-transform infrared (FTIR) spectrometer Bruker IFS 66v/S, (Bruker, Karlsruhe, Germany) with a germanium prism for attenuated total reflection. Before recording FTIR spectra, the suspensions were dried in air on the prism surface. The FTIR measurements were done at room temperature in vacuum at a residual pressure of 10−3 Torr.
Additionally, the suspensions of SiNPs were characterised by using PL spectroscopy by excitation with an Ar-ion laser (wavelength 364 nm, power 10 mW, spot diameter 1 mm, Spectra-Physics, Stahnsdorf, Germany). The PL signal was detected using a grating monochromator (MS750, SOLAR TII, Moscow, Russia) equipped with a CCD array. The measurements were carried out at room temperature in air.
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4

Optical Measurements of Nanodiamonds

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The
optical measurement
was performed using a home-built setup with a confocal microscope
configuration comprising an objective lens (100×, NA = 0.8).
An Ar-ion laser (Spectra physics, Stabilite 2017) with a wavelength
of 514.5 nm was used as the excitation light source. The measured
excitation power at the surface of the device was 100 μW. The
emission light was detected by an APD (Laser components, COUNT-10C-FC)
and counted by the single-photon counter (AUREA technology, SPD-TDC).
Noise analysis of the photoluminescence related to the blinking phenomenon
of nanodiamonds was performed using a vector signal analyzer (Hewlett
Packard, 89410A).
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