The WSe2 flakes were exfoliated from commercially available synthetic crystal, provided by HQ-graphene, using a standard low-tack dicing tape. The flake characterization was performed with a dimension edge AFM from Bruker in tapping mode. For the dry-transfer process we used thick (~10 μm) spin-coated poly-methyl methacrylate (PMMA) as transferring agent. After selecting the flake for transfer, PMMA was spin-coated on the sample and annealed at 165 °C on a hot-plate. We then diced the PMMA around the flake using a micro-engraver and, upon release of the WSe2/PMMA stack, we picked it up using a microneedle. The WSe2/PMMA stack was then transferred to the target substrate and aligned with respect to the buried program gate by a manual pick-and-drop process. Adhesion of the WSe2/PMMA stack was assured by 2 min hot-plate annealing at 190 °C. Finally PMMA was dissolved using dichloromethane (DCM) and the sample was cleaned with an hot acetone bath (~12 hours) to ensure the absence of PMMA residues.
Dimension edge afm
Manufactured by Bruker
Sourced in United States
The Dimension Edge AFM is an atomic force microscope (AFM) designed for high-resolution imaging and characterization of surfaces and nanoscale materials. It provides accurate topographical data and analysis of sample properties at the nanometer scale.
Automatically generated - may contain errors
Lab products found in correlation
Otespa r3, by Bruker (1 mentions)
Zetasizer nano series, by Malvern Panalytical (1 mentions)
Tensor 27 spectrometer, by Bruker (1 mentions)
Sta 6000, by PerkinElmer (1 mentions)
Uv 3600 uv vis nir spectrophotometer, by Shimadzu (1 mentions)
Alpha 2 ft ir spectrometer, by Bruker (1 mentions)
Evo ma10, by Zeiss (1 mentions)
12 protocols using dimension edge afm
1
Dry-Transfer of WSe2 Flakes
2
FTIR and AFM Analysis of CS/Au Bilayer Films
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FTIR spectra of CS/Au bilayer films prior to and after interactions with DA were recorded in an ambient atmosphere at room temperature with ALPHA II FTIR Spectrometer plus Platinum ATR Accessory in the range 400–4000 cm−1 with a spectral resolution of 1 cm−1. The surface morphology images and the roughness changes analysis of sensor films before and after introducing DA solution were observed at room temperature using Bruker Dimension Edge AFM in PeakForce Tapping mode with a scanning size of 5 μm × 5 μm. The cantilever spring constant is 0.4 N/m, and its dimensions are T (650 nm), L (115 µm), and W (25 µm). The radius of curvature of the AFM tip is <10 nm. The front side of the cantilever is without coating, while its back side is coated with reflective Al.
3
Quantifying Protein Transfer Using AFM
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Atomic force microscopy (AFM) was performed on a Dimension Edge AFM (Bruker S.A.S., France) in tapping mode. OTESPA-R3 (Bruker S.A.S., France) cantilevers with a spring constant of ~26 N/m were used for imaging. AFM image analysis was performed in Gwyddion v2.49. Mainly, the correction algorithms “remove polynomial background,” “align rows using various methods,” and “correct horizontal scars (strokes)” were applied for leveling. Background subtraction was performed by taking the signal of the glass coverslip not covered by protein as a reference. For quality assessment of protein transfer by printing, AFM images were converted to 16 Bit grayscale images and further analyzed in ImageJ. For this, regular arrays were selected within the printed patterns (Figure S1 ) corresponding to either regions with (“ON”) or without (“OFF”) stamp-surface contact. The mean gray values per pixel for each region, ION and IOFF, were used to calculate the contrast . In AFM image analysis, care was taken to perform the background subtraction the same way in all images to make contrast data comparable. Note though that contrast values are only intended as a means of relative comparison between samples and are no absolute indicator of pattern quality.
4
PEG Thin Film Characterization by AFM
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AFM images of PEG thin films adsorbed on Au, Au-CH3 and Au-NH2 were obtained using a Bruker Dimension Edge AFM coupled to the Nanodrive 8.1 controller. AFM tips were supplied by Veeco Instruments, Plainview, NY, USA. All experiments were performed in contact mode. Tips are made of silicon nitride (Si3N4) with a gold reflective coating on the back side. The cantilever geometry is triangular, the spring constant is 0.35 N/m, allowing high sensitivity, and the tip radius is around 2 nm, allowing high vertical and lateral resolution. Scan sizes were fixed at 90 µm × 90 µm and 10 µm × 10 µm, and the scan frequency (lines/s) was fixed at 1 Hz. The AFM raw signal was recorded in deflection mode. The reproducibility of the results was systematically checked.
5
Atomic Force Microscopy of AZO NPs-Induced Membrane Alterations
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The interaction of the NPs with the cell membrane, in particular morphological changes of SH-SY5Y cells membrane after interaction with AZO was investigated by AFM (Bruker dimension Edge AFM) using a silicon tip on nitride lever (70 kHz, scanasyst-air). All images, 256 × 256 pixels and line scan rate 0.300 Hz, were analyzed using NanoScope Analysis software.
The cells were seeded on coverslips and incubated for 48 h. A control group was separated and fixed, while the cells exposed to AZO NPs were allowed to interact for further 24 h using a 5 µg/mL solution of AZO NPs. After exposure, the media was removed, and cells were fixed in 10% buffered paraformaldehyde and dried with ethanol at increasing concentrations. Finally, analysis of all the cells (control and exposed groups) was performed using Atomic Force Microscopy to investigate morphology changes in the cells.
The cells were seeded on coverslips and incubated for 48 h. A control group was separated and fixed, while the cells exposed to AZO NPs were allowed to interact for further 24 h using a 5 µg/mL solution of AZO NPs. After exposure, the media was removed, and cells were fixed in 10% buffered paraformaldehyde and dried with ethanol at increasing concentrations. Finally, analysis of all the cells (control and exposed groups) was performed using Atomic Force Microscopy to investigate morphology changes in the cells.
6
Comprehensive Physicochemical Characterization of Materials
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Fourier transform infrared (FTIR) spectra were
recorded on a Bruker Tensor 27 spectrometer using the attenuated total
reflectance mode. The spectral width ranged from 400 to 4000 cm–1, with a resolution of 4 cm–1 and
an accumulation of 32 scans. A PerkinElmer STA 6000 simultaneous analyzer
was used for the thermal analysis. All samples were heated from 30
to 750 °C with a ramp of 20 °C/min in an air atmosphere.
A Malvern Zetasizer Nano series with a 4 mW 632.8 nm laser was used
to determine the average diameter and surface charge of the samples
in aqueous suspension (∼0.1 wt %) at pH 7. A JEOL 6480LV scanning
electron microscope and a Bruker Dimension Edge AFM was used to record
the micrographs. Samples for the scanning electron microscopy (SEM)
analysis were suspended in deionized water, and then a drop was placed
onto a carbon-coated copper grid under an air atmosphere until dryness
was achieved. In the case of atomic force microscopy (AFM), a diluted
solution of the sample was spin-coated at 3000 rpm for 20 s in a silicon
substrate (1–10 Ω cm) from the International Wafer Service,
Inc. A TriStar II 3020 surface area analyzer was used to determine
the specific surface area of the samples by applying the Brunauer–Emmett–Teller
(BET) method. The degassing temperature was set at 120 °C for
8 h under a N2 flow.
recorded on a Bruker Tensor 27 spectrometer using the attenuated total
reflectance mode. The spectral width ranged from 400 to 4000 cm–1, with a resolution of 4 cm–1 and
an accumulation of 32 scans. A PerkinElmer STA 6000 simultaneous analyzer
was used for the thermal analysis. All samples were heated from 30
to 750 °C with a ramp of 20 °C/min in an air atmosphere.
A Malvern Zetasizer Nano series with a 4 mW 632.8 nm laser was used
to determine the average diameter and surface charge of the samples
in aqueous suspension (∼0.1 wt %) at pH 7. A JEOL 6480LV scanning
electron microscope and a Bruker Dimension Edge AFM was used to record
the micrographs. Samples for the scanning electron microscopy (SEM)
analysis were suspended in deionized water, and then a drop was placed
onto a carbon-coated copper grid under an air atmosphere until dryness
was achieved. In the case of atomic force microscopy (AFM), a diluted
solution of the sample was spin-coated at 3000 rpm for 20 s in a silicon
substrate (1–10 Ω cm) from the International Wafer Service,
Inc. A TriStar II 3020 surface area analyzer was used to determine
the specific surface area of the samples by applying the Brunauer–Emmett–Teller
(BET) method. The degassing temperature was set at 120 °C for
8 h under a N2 flow.
7
Characterization of Graphene Quantum Dots and Polymer Films
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The FTIR spectra of the GQDs, PVA, and GQDs-PVA solutions were recorded using an ALPHA II FTIR Spectrometer (Bruker, CA, USA) in ATR mode. Then, the surface morphology of the GQDs, PVA, and GQDs-PVA thin films were examined by using the Dimension Edge AFM (Bruker, CA, USA) in intermittent mode, since this mode allows high resolution for fragile and thin samples. A UV-3600 UV-VIS-NIR spectrophotometer (Shimadzu, Japan) was used to measure the absorbance and band gap of all of the thin films.
8
AFM Imaging of DNA on Functionalized Mica
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All micas used in the current studies were modified on their surfaces with (3-aminopropyl)triethoxysilane (APS-micas) following reported procedures [23 (link)]. DNA samples for AFM examination were prepared in solutions at first that contained 20 mM Tris-HCl (pH = 7) and 0.1 to 0.01 μg/mL DNA. 5 μL to 10 μL of those DNA solutions was placed next in the middle of the newly prepared APS-mica plates (1 × 1 cm2), which were further kept at room temperature for 5 minutes. The surfaces of the APS-mica plates bound by DNA were then rinsed using distilled water for 3 times. AFM images of DNA molecules on the APS-mica plates were obtained in Tapping Mode on a Dimension Edge AFM (Bruker, Santa Barbara, CA) in connection with a Nanoscope VIII controller. Aluminum reflective coating cantilevers with nominal spring constants between 1 and 5 N/m were selected. Scan frequency was 1.9 Hz per line and the modulation amplitude was in a nanometer range. All DNA sample determinations were carried out in air at room temperature.
9
Analyzing Ceramic Surface Hardness Modifications
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To identify whether heat treatment resulted in a change in surface hardness, Vickers hardness measurements (1 Kgf /10 s) were performed on polished (POL) and polished heat-treated (POL-HT) surfaces using a Wilson® Vickers Micro-hardness Tester (Buehler, USA) (n=15). In addition, to identify whether heat treatment could modify radial and lateral surface cracks, a series of Vickers indents were generated on POL surfaces using different loads (0.5, 1 and 2 Kgf /10 s) and the radial crack lengths recorded (n=10 indents per load). Indented specimens (n=3) were subsequently heat treated and the radial crack lengths re-measured. Complementary characterization of ceramic surfaces using Atomic Force Microscopy (AFM) and SEM was carried out adjacent to the controlled indents before and after heat treatment to identify surface displacements which may potentially be associated with modification of lateral cracks and or the plastically deformed Vickers indentation zone. AFM was performed using a Dimension Edge AFM (Bruker, USA) using a monolithic silicon probe in tapping mode, a scan size of 30 × 30 μm and scan rate of 30 μm/s. SEM measurements were taken using a Zeiss EVO MA10 (Zeiss, Germany) on un-sputtered surfaces at numerous magnifications with an operating voltage of 5 kV.
10
DNA Imaging on Modified Mica Surfaces
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AFM examination was conducted following reported procedures and a specially prepared mica surface was selected as the substrates for DNA binding. Generally, the micas used in the our studies were modified on their surfaces with (3-aminopropyl) triethoxysilane (APS) [43 (link)]. Sample preparation procedures are described as follows: 5 μL to 10 μL of solutions containing 20 mM Tris-HCl (pH = 7), and 0.1 to 0.01 μg/mL DNA were dropped into the middles of the newly prepared APS-mica plates (1 × 1 cm2), which were further kept at room temperature for 5 min. Then, 10 mL of distilled water were then used to rinse the APS-mica plates that has been bound by DNA molecules for three times in order to remove the salt and buffer. Before scanning, the samples were placed in vacuum desiccator for 30 min. AFM images of DNA molecules on the APS-mica plates were obtained in Tapping Mode™ on a Dimension Edge™ AFM (Bruker, Santa Barbara, CA, USA) in connection with a Nanoscope VIII™ controller. Aluminum reflective coating cantilevers with nominal spring constants between 1 and 5 N/m were selected. Scan frequency was 1.9 Hz per line and the modulation amplitude was in a nanometer range. All DNA sample determinations were carried out in air at room temperature.
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