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Nova nano scanning electron microscopy

Manufactured by Bruker

The Nova Nano Scanning Electron Microscopy is a high-resolution imaging instrument designed for nanoscale analysis. It utilizes a focused electron beam to scan the surface of a sample, generating detailed images and data about the sample's topography, composition, and other characteristics.

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2 protocols using nova nano scanning electron microscopy

1

Microbial Carbonate Mineral Characterization

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The sediment samples collected from sabkhas, and mangrove forest had been analyzed initially to ensure the existence of high magnesium carbonate as a bulk in these sites. One g from each sediment sample was manually grounded and homogenized with a mortar and pestle, mixed evenly, and left to dry at 37 °C overnight. The dried samples were analyzed by XRD and SEM/EDS.
The minerals formed in pure bacterial cultures were extracted from the solid media. The bacterial biomass was stripped from the surface of the solid medium by slightly scraping the top layer with a sterile scalpel. The mineral crystals were washed three times with 15 mL distilled water. This process does not alter the shape of the crystals, as confirmed by optical microscopy before and after recovery [10] . The overnight dried samples at 37 °C, were analyzed by SEM/EDS and XRD techniques.
The SEM analysis was conducted utilizing a Nova Nano Scanning Electron Microscopy equipped with a Bruker EDX Detector with a magnification of 200,000X and a resolution of 5 nm. The EDS was obtained in accordance with the “ASTM standard method E1508–12a”, using a spot size of 5 and an accelerating voltage of 20 kV with an error rate of 4%. The PANalytical- multipurpose Empyrean X-ray diffractometer was used to determine the bulk mineralogical composition of the retrieved minerals.
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2

Mineralogical Characterization of Recovered Minerals

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The recovered minerals as described in section 2.5 were subjected to SEM/EDS and XRD analysis. The SEM was performed using Nova Nano Scanning Electron Microscopy equipped with Bruker EDX Detector with 5 nm resolution and a magnification of 200,000 × . The EDS was obtained following “ASTM standard method E1508–12a”, with spot size 5 at an accelerating voltage of 20 kV and 4% error.
The bulk mineralogical composition of the recovered minerals was determined using a PANalytical- multipurpose Empyrean X-ray diffractometer. Crystal Impact MATCH! Version 3.12 Software was used for the analysis of XRD spectra and semi-quantitively determination of amounts of formed minerals in each mixture.
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