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Avatar 360 nicolet instrument

Manufactured by Thermo Fisher Scientific
Sourced in China

The Avatar 360 Nicolet instrument is a high-performance Fourier Transform Infrared (FTIR) spectrometer designed for a wide range of analytical applications. It features a highly versatile and modular design that allows for customization to meet specific user requirements.

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2 protocols using avatar 360 nicolet instrument

1

Characterization of Cu-TCPP Catalyst

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The X-ray diffraction (XRD, X’Pert PRO diffractometer, Cu Ka, Panalytical Company, Almelo, The Netherlands) was employed to characterize the crystal structure. A Fourier transform infrared (FT-IR) was analyzed on an Avatar 360 Nicolet instrument (Thermo Fisher Scientific, Shanghai, China). Scanning electron microscopic images and transmission electron microscopic images were measured using a Nova Nano SEM 450 system and the Tecnai G2 F30 system, respectively (FEI Company, Eindhoven, The Netherlands). A micromeritics ASAP 2020 analyzer (Norcross, GA, USA) was used to test Nitrogen adsorption–desorption isotherms.
A CHI 660E electrochemical workstation (Shanghai Chenhua Instrument Co., Ltd., Shanghai, China) was used for electrochemical measurements. The Cu-TCPP modified glassy carbon electrode (GCE, diameter: 3 mm), saturated calomel electrode (SCE), and platinum wire were used as the working electrode, reference electrode, and counter electrode, respectively.
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2

Comprehensive Material Characterization

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Fourier-transform infrared spectra were obtained on an Avatar 360 Nicolet instrument (Thermo Fisher Scientific, Shanghai, China) using KBr pellets with wave numbers from 4000 to 40 cm−1 and a resolution of 4 cm−1. UV-Vis absorption spectra were obtained with a S 3100 spectrophotometer (Mapada Instruments Co., Ltd., Shanghai, China). Thermogravimetry analysis was conducted using a NETZSCH TG 209F3 instrument (NETZSCH Scientific Instruments Trading, Ltd., Shanghai, China) under an N2 atmosphere, with a heating rate of 10 °C/min from ambient temperature to 700 °C. The morphologies were analyzed by scanning electron microscopy (SEM, VEGA-3, Tescan, Czech Republic).
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