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Jem 2100 tem model

Manufactured by JEOL

The JEM 2100 is a Transmission Electron Microscope (TEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of materials at the nanoscale level. The JEM 2100 utilizes an electron beam to illuminate and interact with thin samples, allowing users to observe the internal structure and composition of materials with exceptional detail.

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3 protocols using jem 2100 tem model

1

TEM Characterization of Pd Nanoparticles

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Samples for examination by TEM were prepared by first dispersing 5 mg of the Pd nanoparticles in high purity ethanol using ultra-sonication. 40 mL of the black suspension was dropped on to a holey carbon film supported by a 300 mesh copper TEM grid before the solvent was evaporated. The sample was then examined using a JEOL JEM 2100 TEM model operating at 200 kV. Elemental analysis was performed using the mapping mode. Particle size analysis was carried out with ImageJ. 44
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2

TEM Sample Preparation Protocol

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Samples for examination by TEM were prepared by rst dispersing the catalyst powder in ethanol using ultra-sonication for 30 minutes. 40 mL of the suspension was dropped on to a holey carbon lm supported by a 300 mesh copper TEM grid before the solvent was evaporated. The samples for TEM were then examined using a JEOL JEM 2100 TEM model operating at 200 kV.
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3

Characterization of Pyrolysis Byproducts

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The pyrolysis gas/vapour collected by bubbling argon through pyrolysis oil was sampled using Tedlar® gas bags and analysed on the thermal desorption Gas chromatography-mass spectrometry (GC-MS) and Gas Chromatography -Flame Ionization Detector (GC-FID) to determine the presence of Benzene, Toluene, Ethylbenzene and Xylene (BTEX). The morphology of the obtained carbonaceous materials was analysed using an Auriga Cobra Focused-Ion Beam Scanning Electron Microscope (FIB-SEM). SEM Energy Dispersive Spectroscopy (EDS) was used for elemental analysis of the as-received CFA and its magnetic fraction. X-ray diffraction (XRD) patterns were obtained using a PANalytical X'Pert Pro powder diffractometer with Pixcel detector using Ni-filtered Cu-Kα radiation (0.154 nm) in the range of 2θ = 1-60°, and at a scanning rate of 0.1°s -1 . The Raman analysis was performed using Jobin-Yvon T64000 Raman spectrometer. Transmission electron microscope (TEM) images of the carbon materials were obtained using a JEOL-JEM 2100 TEM model.
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