The zircon grains for LA-ICP-MS U-Pb dating were separated using the conventional sieving, magnetic, and heavy liquid techniques, and then mounted on epoxy disks. Their internal structures were observed with a XM-26740PCLI cathodoluminescence (CL) spectrometer coupled to a JXA-8230 electron probe microanalyzer (JEOL Ltd., Tokyo, Japan) at the Okayama University of Science (OUS) before isotopic analysis (Fig. 6a ).
Jxa 8230 electron probe microanalyzer
Manufactured by JEOL
Sourced in Japan
The JXA-8230 is an electron probe microanalyzer (EPMA) manufactured by JEOL. It is designed for quantitative elemental analysis and mapping of solid samples at the micro- and nano-scale. The JXA-8230 utilizes an electron beam to generate X-rays from the sample, which are then detected and analyzed to determine the chemical composition of the material.
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Lab products found in correlation
4 protocols using jxa 8230 electron probe microanalyzer
1
Zircon Grains Separation and CL Imaging
2
Mineral Composition Analysis by EPMA
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Prior to LA-ICP-MS analyses, major and minor components in the magnetite grain (n = 6), coarse granular exsolutions (n = 2), and micrometer ilmenite lamellae (n = 4) were determined using EPMA. Experiments were carried out using a JEOL JXA-8230 Electron Probe Microanalyzer (EPMA) equipped with five wavelength-dispersive spectrometers (WDS) together with one energy-dispersive spectrometer (EDS) at the Laboratory of Microscopy and Microanalysis, Wuhan Microbeam Analysis Technology Co., Ltd. Iron, Ti, Mg, Mn, V, Si, Ca, Al, Cr, and Nb were analyzed using a focused beam (1 μm) at 20 kV and 20 nA. The peak overlap of Ti Kβ on V Kα and V Kβ on Cr Kα was corrected, and the correction strategy followed Yang et al. (ref. 9 ). Detailed operating conditions and involved standards for each element are available in ESI Table 1.†
3
Elemental Analysis of Melt Inclusions
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Major elemental compositions of melt inclusions and host olivine phenocrysts were analyzed with a JEOL JXA-8230 electron probe microanalyzer (EPMA) at the Key Laboratory of Submarine Geosciences and Prospecting Techniques, Ministry of Education, Ocean University of China, Qingdao. The operating conditions were 15 kV accelerating voltage, 20 nA beam current, and 2 μm beam diameter for melt inclusions and host olivines. Na and K were measured first with 10 s for the peak and 5 s for the background to minimize volatilization loss. Analytical precisions for major and trace elements were better than 1% and 5%, respectively.
4
Actuator Cross-section Microstructure Analysis
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The cross-sectional images of the EAP were captured using SEM and its elemental map was found using wavelength-dispersive X-ray spectroscopy (WDS). The actuators were frozen in liquid nitrogen and was fractured into two parts using a hammer. This method prevents distortion of the cross-sectional morphology caused by shear forces (Ferlita et al., 2008 (link)). SEM images which used secondary electrons (SE) were carried out using JEOL JSM-IT100 and images using backscattering electrons (BSE) in the composition (COMPO) mode were taken with JEOL JXA-8230 Electron Probe Microanalyzer.
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