All chemicals were obtained from commercial suppliers at analytical grade and used as received without further purification. Al(NO3)3 ∙ 9H2O, Ga(NO3)3 ∙ xH2O, Cr(NO3)3 ∙ 9H2O, aqueous HF, melamine, 1,10-phenanthroline, sulfur powder were obtained from Shanghai Aladdin Bio-Chem Technology Co., LTD. 1,4-benzene dicarboxylic acid was obtained from TCI Shanghai. Nafion solution was obtained from Sigma-Aldrich. Power X-ray diffractions (PXRD) patterns of the samples were collected on a D8-Advance Bruker AXS diffractometer with Cu kα (λ = 1.5418 Å) radiation at room temperature. Inductively coupled plasma mass spectroscopy (ICP-MS) measurements were carried on NexION 300 (PerkinElmer). The samples' morphologies were examined using a field emission scanning electron microscope (SEM, Hitachi, S-4800). Transmission electron microscopy (TEM) images were recorded on Tecnai F20 microscope. The aberration-corrected HAADF-STEM measurements were taken on a JEM-ARM200F instrument at 200 keV. X-ray photoelectron spectroscopy (XPS) measurements were performed by using a thermo ESCALAB 250 high-performance electron spectrometer using monochromatized Al Ka (hν = 1486.6 eV) as the excitation source. Al K-edge X-ray absorption spectroscopy (XAS) was conducted at beamline 02B02 of the SiP·ME2 platform at the Shanghai Synchrotron Radiation Facility (SSRF).
Axs d8 advance diffractometer
Manufactured by Bruker
Sourced in Germany, United States
The AXS D8 Advance is a versatile X-ray diffractometer designed for a wide range of applications. It features a modular architecture, allowing for customization to suit specific research and analytical needs. The core function of the AXS D8 Advance is to perform X-ray diffraction analysis, providing detailed information about the structural properties of materials.
Automatically generated - may contain errors
Lab products found in correlation
Axis ultra dld, by Shimadzu (2 mentions)
Nafion solution, by Merck Group (1 mentions)
Nexion 300, by PerkinElmer (1 mentions)
S 4800, by Hitachi (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
D500 diffractometer, by Siemens (1 mentions)
Escalab 250xi xps, by Thermo Fisher Scientific (1 mentions)
Labram hr800 raman spectrometer, by Horiba (1 mentions)
Tecnai g2 f20 tem, by Thermo Fisher Scientific (1 mentions)
Q200 differential scanning calorimeter, by TA Instruments (1 mentions)
Sta449f5 qms403d instrument, by Mettler Toledo (1 mentions)
Vertex70 ir spectrometer, by Bruker (1 mentions)
Av 400 model spectrometer, by Bruker (1 mentions)
Pyris diamond6000 tg dta, by PerkinElmer (1 mentions)
S 4800 scanning electron microscope sem, by Hitachi (1 mentions)
Fp 6500, by Jasco (1 mentions)
Regulus 8220, by Hitachi (1 mentions)
Jem 2100, by JEOL (1 mentions)
Escalab xi, by Thermo Fisher Scientific (1 mentions)
Jsm 7000f, by JEOL (1 mentions)
48 protocols using axs d8 advance diffractometer
1
Characterization of Al-Ga-Cr Metal Nitrates
2
Characterization of Magnetic Nanoparticles
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Structural studies were carried out at an XRD D8-Advance Bruker AXS diffractometer with Cu Kα radiation (λ = 1.54 Å). The Debye–Scherrer formula (Equation 1 ) was used to calculate the average crystallite size of NPs from the XRD peak of the (311) plane [30 (link)]:
where D is the average crystallite size, K = 0.94, λ = 1.54 Å is the X-ray wavelength, β represents the full width at half maximum (FWHM), and θ represents the Bragg's diffraction angle.
The surface morphology and major elemental composition were obtained by high-resolution transmission electron microscopy (JEM 2100F) and energy dispersive spectroscopy (TESCAN-VEGA3), respectively. The magnetic behavior was determined by using a physical property measurement system (Quantum Design, USA). The colloidal stability and hydrodynamic size of NPs were studied by using a Zetasizer Nano ZS (Malvern Instruments, 69 UK) and the uniform size distribution by gel electrophoresis (GE BIORAD). Drug attachment and drug release analyses were performed by using UV–vis spectroscopy (Thermo Scientific Evo 220).
where D is the average crystallite size, K = 0.94, λ = 1.54 Å is the X-ray wavelength, β represents the full width at half maximum (FWHM), and θ represents the Bragg's diffraction angle.
The surface morphology and major elemental composition were obtained by high-resolution transmission electron microscopy (JEM 2100F) and energy dispersive spectroscopy (TESCAN-VEGA3), respectively. The magnetic behavior was determined by using a physical property measurement system (Quantum Design, USA). The colloidal stability and hydrodynamic size of NPs were studied by using a Zetasizer Nano ZS (Malvern Instruments, 69 UK) and the uniform size distribution by gel electrophoresis (GE BIORAD). Drug attachment and drug release analyses were performed by using UV–vis spectroscopy (Thermo Scientific Evo 220).
3
Crystal Structure Determination via X-Ray Diffraction
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Tiny single crystals of each new compound were selected and studied at room temperature using X8 4 circles diffractometer equipped with a 2D CCD 4K detector and an Ag micro-source for (1) and ( 3) and an APEX DUO diffractometer equipped with a 2D CCD 4K detector using a Mo-Kα source and an optical fiber acting as collimator for (2). JANA2006 26 program was used to solve the crystal structure using the Charge Flipping algorithm and then to refine it. Powder X-ray diffraction data were collected at room temperature in the range of 2θ = 5 -120°, with 0.02 o step, 5 s counting time and using a D8 Advance Bruker AXS diffractometer in Bragg Brentano geometry equipped with a 1D LynxEye detector. Rietveld refinements were performed using TOPAS 27 .
4
X-ray Diffraction Analysis of Samples
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X-ray diffraction was performed using a D8 ADVANCE Bruker AXS diffractometer with Cu Kα radiation (λ = 1.5418 Å) in θ-θ geometry with a position sensitive LynxEye detector and a variable divergence slit. The samples were investigated with a scan speed of 1 s and an increment of 0.02°per step.
5
Powder X-ray Diffraction of Crushed Single Crystals
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The grown single crystals were crushed using an agate mortar and then used for the powder X-ray diffraction analysis performed at room temperature in the 2θ range of 10-60°with a scan step width of 0.02°using a D8 Advance Bruker AXS diffractometer (CuKα radiation, λ = 1.5418 Å). Difference of the XRD peak intensities between two patterns implies preferred orientation along [00l] as the XRD pattern was collected using crushed single crystals on a silicon crystal sample holder. A good coincidence between experimental and theoretical powder XRD patterns for the title compound is shown in Fig. 2.
6
Structural Analysis of Magnetic Nanoparticles
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The XRD analysis was performed by Bruker D8 Advance AXS Diffractometer, USA using Cu Ka radiation (K = 1.542 A) at speed 1° per min in 2Ɵ range of 7°-80° to study the crystal structure of magnetic nanoparticles of Fe3O4 and hydroxyapatite (HA).
7
Characterization of Nanocomposite Materials
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The chemical bonding that took place during the synthesis was characterized using a Bruker Tensor 27 Fourier-transform infrared (FTIR) spectrometer employing the KBr pellet method. A MIRA TESCANE scanning electron microscope operating at 15 kV was used for taking field-emission scanning electron microscopy (FESEM) images. A Bruker D8 Advance AXS diffractometer equipped with a Cu Kα radiation source (λ = 1.54 Å) operated at 40 kV and 40 mA in the 2Θ range of 10–80° at a scan rate of 0.05 degrees per second was used to record the X-ray diffraction (XRD) patterns of the nanocomposites. The XRD pattern of PGO was characterized using a D500 Siemens diffractometer equipped with a Cu Kα radiation source (λ = 0.154 nm) over a 2Θ range of 4–70°.
8
Structural Analysis of NiFe-LDH@EBP Composite
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X-ray diffraction (XRD) patterns of NiFe-LDH, EBP, and NiFe LDH@EBP were recorded on a Bruker AXS D8 Advance diffractometer with Cu Kα radiation (λ = 1.541874 Å). A field emission transmission electron microscope (JEM-2100F) was used to characterize the morphologies of NiFe-LDH, EBP, and NiFe LDH@EBP. Raman spectra of NiFe-LDH, EBP, and NiFe LDH@EBP were collected on a Lab RAM HR800 Raman spectrometer (HORIBA Jobin Yvon, France). The X-ray photoelectron spectra (XPS) of NiFe-LDH, EBP, and NiFe LDH@EBP were obtained using a Thermo Scientific ESCALAB 250Xi XPS using Al Kα radiation.
9
Investigating Discarded Chewing Gum Impact on Asphalt
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To further illuminate the effect of discarded chewing gum (DCG) with its possible existing fillers on the microcrystalline phase of base AP-5 asphalt, X-ray diffraction was carried out using a Bruker AXS D8 Advance Diffractometer (Bruker AXS GmbH D8 Advance, Karlsruhe, Germany) with CuKα radiation (λ = 1.54005 Å, 40 kV and 40 mA) at ambient temperature (ca. 25 °C). The diffraction (2θ) was monitored from 10° to 90° at a 1°/min scan rate with a 0.05 step size.
10
Structural Characterization of Titanium Phosphate Compounds
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Powder X-ray diffraction patterns were collected using an AXS D8 Advance
diffractometer (Cu Kα radiation; receiving slit, 0.2 mm;
scintillation counter, 40 mA; 40 kV) from Bruker Inc. The
morphology and structure of samples were analysed by a Hitachi S-4800 field
emission SEM and an FEI Tecnai G2 F20 TEM at an accelerating voltage of
200 kV. Thermal gravimetric analysis was performed on a Pyris Diamond
thermogravimetric/differential thermal analyser (Perkin-Elmer) to analyse the
cabon content in carbon-coated TiP2O7 and
NaTi2(PO4)3. X-ray photoelectron spectra
(XPS) were collected by a Shimadzu/Kratos AXIS Ultra XPS spectrometer. All
binding energies were referenced to the F 1s peak (from polyvinylidene
fluoride) of 688.2 eV.
diffractometer (Cu Kα radiation; receiving slit, 0.2 mm;
scintillation counter, 40 mA; 40 kV) from Bruker Inc. The
morphology and structure of samples were analysed by a Hitachi S-4800 field
emission SEM and an FEI Tecnai G2 F20 TEM at an accelerating voltage of
200 kV. Thermal gravimetric analysis was performed on a Pyris Diamond
thermogravimetric/differential thermal analyser (Perkin-Elmer) to analyse the
cabon content in carbon-coated TiP2O7 and
NaTi2(PO4)3. X-ray photoelectron spectra
(XPS) were collected by a Shimadzu/Kratos AXIS Ultra XPS spectrometer. All
binding energies were referenced to the F 1s peak (from polyvinylidene
fluoride) of 688.2 eV.
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