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Tecnai g2 f20 x twin tem

Manufactured by Thermo Fisher Scientific
Sourced in Netherlands

The Tecnai G2 F20 X-TWIN TEM is a high-performance transmission electron microscope (TEM) designed for advanced materials characterization. It features a field emission electron source, a unique X-TWIN lens system, and multiple detectors for versatile imaging and analytical capabilities.

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4 protocols using tecnai g2 f20 x twin tem

1

In Situ TEM Imaging of Structural Dynamics

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HR-TEM and DF-TEM experiments were conducted using FEI Tecnai G2 F20 X-TWIN TEM and FEI Titan 80-300 TEM, operated at either 80 or 300 kV. Acquisition times for DF-TEM images were 3 to 10 s. The spatial resolution of DF-TEM imaging is 1 nm. A Gatan 628-0500 in situ heating holder system was used to increase the sample temperature up to 900°C. All DF-TEM images were taken at the field of view where no image change was observed for more than 1-min exposure, preventing any change by the beam exposure during the measurement.
The angle-averaged spatial autocorrelation function 〈G(r)〉 of the DF-TEM images is the statistical correlation of two points separated by distance r and was calculated following the method of Giraldo-Gallo et al. (26 (link)). The characteristic length scale L from 〈G(r)〉 represents ξ in the disordered phase, although it approximately corresponds to the inverse square root of the paired dislocation density in the quasi-ordered crystalline phase. Each data point in Figs. 2 and 4 was calculated from the correlation functions of multiple (>10) images acquired from the membranes of the same thickness.
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2

Characterization of Magnetic Nanoparticles by TEM

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Transmission electron microscopy (TEM) (Hitachi HT7700 TEM) was used to characterize the PBNCs, 5 nm diameter SPIONS, and 10 nm diameter SPIONs. Small SPIONs (3 nm) were imaged using a FEI Tecnai G2 F20 X-Twin TEM. Sample preparation is described in the Supplementary Data. Size distribution of all particles was analyzed using ImageJ software (Figure S1). The size standard deviation of each population was divided by its respective mean to obtain the particle size coefficient of variation (Figure S2).
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3

Synthesis and Characterization of Ag@SiO2 Nanoparticles

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The reagents and solvents were used without further purifications: silver nitrate (AgNO3, 99%), trisodium citrate dihydrate (99%), (3-aminopropyl)triethoxysilane (99%), and sodium silicate solution (NaOH 10%, SiO2 27%) (Merck). All solutions were prepared with ultra-pure water (resistivity of 18.2 MΩ·cm) from Direct-Q 3UV (Merck, Darmstadt, Germany). Nanoparticles (NPs) were synthesized under microwave irradiation according to the previously published method [44 (link)]. Briefly, the bare silver-core NPs were prepared by the AgNO3 reduction with sodium citrate and capped with silica shell. Then, core-shell NPs were purified by a repeated centrifugation, supernatant removal, and resuspension. Figure 2 shows the Ag@SiO2 NPs images obtained by high-resolution transmission electron microscopy (HR-TEM). HR-TEM images were collected by an FEI Tecnai G2 F20 X-TWIN TEM (FEI, Netherlands) microscope with an accelerating voltage of 200 kV. The microscope was equipped with an EDX (EDAX) spectrometer and Gatan Orius CCD camera. The measurements were carried out in a bright-field regime.
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4

TEM Imaging of Nanomaterials

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Selected samples were imaged with a transmission electron microscope (FEI Tecnai™ G2 F20 X-Twin TEM) equipped with a field-emission gun electron source. TEM samples were prepared by suspending a few milligrams of the sample in 1-2 mL of acetone, ultrasonicating for 20 min, then drop-casting them onto holey carbon Cu TEM grids. The grids were then mounted on a Gatan double-tilt holder at room temperature or a Gatan double-tilt liquid nitrogen cryo-TEM holder at 77 K. Energy filtered images were acquired at an acceleration voltage of 200 kV on a Gatan GIF Tridiem detector.
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