We employed a magnetic force microscope, an MFP-3D-SA41 from Asylum Research (an Oxford Instruments company), and added a customized microwave probe station to this system. For MFM scanning, we used a standard cantilever for MFM measurements. Therefore, we had an MFM coating on the Olympus OMCL-AC240TS cantilever. In addition, to obtain a high-resolution MFM process, we fabricated a customized MFM probe using the process described in ref. 42 (link) with a length of 1 µm, a diameter of 150 nm, and a cone-shaped head.
Omcl ac240ts
Manufactured by Olympus
Sourced in Japan
The OMCL-AC240TS is a high-precision analytical centrifuge designed for use in laboratory settings. It features a temperature-controlled chamber and can accommodate a variety of rotor types to accommodate different sample sizes and applications.
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Lab products found in correlation
8 protocols using omcl ac240ts
1
Customized MFM Probe Fabrication
2
Atomic Force Microscopy of Peptides
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AFM analysis was performed on a Cypher microscope (Oxford Instruments, Santa Barbara, CA, USA) equipped with a scanner operating at XY scan range of 30/40 μm (closed/open loop). To prepare the samples, a 10 μL volume of peptide solution was dispensed on freshly cleaved muscovite mica (Ted Pella, Inc., Redding, CA, USA). After 5 min of incubation, samples were dried under a gentle N2 flow. Scan images in random areas of the samples were acquired in AC mode imaging in air by using Si cantilevers (OMCL-AC240TS, ~70 kHz, 2 N/m, Olympus, Tokyo, Japan). AFM images of height were analyzed using the free tool in the MFP-3DTM offline analysis software.
3
Cryo-microtomed PMMA–PDMS Triblock Copolymer Blend Morphology
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The cross-sectioned surfaces
of a cryo-microtomed PMMA–PDMS10–PMMA triblock
copolymer (10 wt %) PMMA blend film was investigated with atomic force
microscopy (AFM) in order to reveal its morphology. To this end, a
MultiMode 8 AFM instrument operated with a JV vertical engage scanner
and retrofitted with a NanoScope V controller (Bruker) was used in
the PeakForce Quantitative Nanomechanical Mapping (QNM) mode. Medium
soft (2 N/m nominal spring constant, 7 nm tip radius) cantilevers
(OMCL-AC240TS, Olympus) enabled performing both the indentation of
the sample surface as well as monitoring the relevant cantilever deflection
induced by the tip–sample contact in order to capture images
representing the surface mechanical compliance (elastic modulus) and
topology. Data were collected following a sine-wave sample-tip trajectory
with a frequency of 2 kHz and utilizing a peak-force amplitude value
of 150 nm with feedback loop control of 25. The ScanAsyst optimization
algorithm was set to “on” to acquire high-resolution
images at the lowest applied normal forces. Data were collected in
air at controlled temperature (21 °C) and relative humidity (∼40%).
Image processing and data analysis were conducted with the NanoScope
(ver. 9.10) and the NanoScope Analysis software (ver. 2.00), respectively.
of a cryo-microtomed PMMA–PDMS10–PMMA triblock
copolymer (10 wt %) PMMA blend film was investigated with atomic force
microscopy (AFM) in order to reveal its morphology. To this end, a
MultiMode 8 AFM instrument operated with a JV vertical engage scanner
and retrofitted with a NanoScope V controller (Bruker) was used in
the PeakForce Quantitative Nanomechanical Mapping (QNM) mode. Medium
soft (2 N/m nominal spring constant, 7 nm tip radius) cantilevers
(OMCL-AC240TS, Olympus) enabled performing both the indentation of
the sample surface as well as monitoring the relevant cantilever deflection
induced by the tip–sample contact in order to capture images
representing the surface mechanical compliance (elastic modulus) and
topology. Data were collected following a sine-wave sample-tip trajectory
with a frequency of 2 kHz and utilizing a peak-force amplitude value
of 150 nm with feedback loop control of 25. The ScanAsyst optimization
algorithm was set to “on” to acquire high-resolution
images at the lowest applied normal forces. Data were collected in
air at controlled temperature (21 °C) and relative humidity (∼40%).
Image processing and data analysis were conducted with the NanoScope
(ver. 9.10) and the NanoScope Analysis software (ver. 2.00), respectively.
4
Fibril Deposition and AFM Characterization
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First, 2-μM fibril solutions were deposited onto freshly cleaved mica surfaces. After 10 min of adsorption, the samples were washed with H2O and dried with a stream of N2. AFM studies were performed using a MultiMode Veeco microscope with a 125-μm lateral range and a 5-μm vertical range equipped with a J-scanner and a NanoScope IIIa controller, using rectangular cantilevers with tetrahedral tips for the dynamic mode in air (Olympus, OMCL-AC240TS)13 . The analysis was performed using WSxM (Nanotec).
5
AFM Imaging of Colloidal CPDs-PNM
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Imaging was performed
in AC mode in air on a commercial AFM instrument (Cypher, Oxford Instruments,
Santa Barbara, CA) equipped with a scanner at an XY scan range of
30/40 μm (closed/open loop). Silicon cantilevers (OMCL-AC240TS,
∼ 70 kHz, 2 N/m by Olympus, Japan) were used to acquire scan
images in random areas of the samples. To prepare the samples, 10
μL of a colloidal solution of CPDs-PNM (10 mg/mL) was dispensed
on freshly cleaved muscovite mica (Ted Pella, Inc., Redding, CA) and
left to dry at room temperature in a controlled laboratory environment.
AFM images of the height were analyzed using the free tool in MFP-3DTM
offline analysis software.
in AC mode in air on a commercial AFM instrument (Cypher, Oxford Instruments,
Santa Barbara, CA) equipped with a scanner at an XY scan range of
30/40 μm (closed/open loop). Silicon cantilevers (OMCL-AC240TS,
∼ 70 kHz, 2 N/m by Olympus, Japan) were used to acquire scan
images in random areas of the samples. To prepare the samples, 10
μL of a colloidal solution of CPDs-PNM (10 mg/mL) was dispensed
on freshly cleaved muscovite mica (Ted Pella, Inc., Redding, CA) and
left to dry at room temperature in a controlled laboratory environment.
AFM images of the height were analyzed using the free tool in MFP-3DTM
offline analysis software.
6
Atomic Force Microscopy Imaging Protocol
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The substrata were imaged using a combination of MFP-3D and Cypher ES Atomic Force Microscopes (Oxford Instrument, Asylum Research, Santa Barbara, CA, USA) at room temperature (25 °C). All images were obtained using amplitude modulated-AFM (AM-AFM) with OMCL-AC240TS cantilevers (Olympus Corporation, Japan, nominal spring constant kc = 2 N m−1). To minimize the imaging force, a set-point ratio (imaging amplitude (A)/free amplitude (A0)) of >0.7–0.8 was maintained during imaging. Each cantilever was calibrated using the thermal spectrum method, which produced a well-defined resonance peak, and the lever sensitivity was determined using force spectroscopy; the spring constant is resolved via the inverse optical lever sensitivity (InVOLS) using force curve measurements on the hard gold surface in air. The features of all images presented rotated as the scan angle was changed and scaled correctly with scan size, confirming they are not a consequence of imaging artefacts.
7
Characterization and Photothermal Efficiency of Gold Nanoparticles
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All reagents were purchased by Sigma-Aldrich and used as received. Optical absorption UV-Vis-NIR spectra were acquired by spectrophotometer PerkinElmer 365, a quartz cuvette with optical length of 10 mm was used. The particle size and surface charge were examined by using a combined dynamic light scattering and zeta-potential apparatus (DLS, Zetasizer Marvell). The ATR-FTIR spectra for SME and AuNPs-SME were recorded by a FTIR spectrometer equipped with ATR module, model Spectrum two (Perkin Elemer). Atomic Force Microscopy (AFM) imaging was performed in AC mode in air on a commercial AFM instrument (Cypher, Oxford Instruments, Santa Barbara, CA) equipped with a scanner at a XY scan range of 30/40 μm (closed/open loop). Silicon cantilevers (OMCL-AC240TS, ∼70 kHz, 2 N m−1 by Olympus, Japan) were used to acquire scan images in random areas of the samples. To prepare the samples, 10 μL of water dispersion of AuNPs-SME and SME (2.5 mg mL−1) were dispensed on freshly cleaved muscovite mica (Ted Pella, Inc., Redding, CA, USA) and left to dry at room temperature in controlled laboratory environment. AFM images of height were analyzed using the free tool in the MFP-3DTM offline analysis software. Photothermal conversion efficiency (η) was calculated according to equation introduced by Roper et al.42 eqn (1) .
8
Atomic Force Microscopy Imaging of INBs
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AFM was performed with a modified Bruker AXS Multimode NanoScope V at room temperature (23–25 °C). FM (Supplementary Fig. S7a ) and PF (Supplementary Fig. S7b ) modes were used. FM mode was used here because it achieves high force sensitivity in water and more accurately measures the surface profile of INBs and other fluid structures than other operation modes29 (link)51 (link); however, more time (10–20 min) is required to tune the imaging conditions before imaging can begin. In addition, stable operation in FM mode may not be achieved for certain tips. With PF mode, AFM can begin sooner (5–10 min) after water deposition and stable imaging can be achieved easily. However, care must be taken when interpreting topographic images acquired in PF mode29 (link). We used Si cantilevers (OMCL-AC240TS from Olympus) with a spring constant of 0.7~3.8 N/m, a nominal tip radius of ~10 nm, and a free resonance frequency of ~30 kHz in water. In FM mode, the oscillation amplitude was maintained at 1.0–1.5 nm; the set point was 13–20 Hz.
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