Em 2010 microscope
The EM-2010 is a high-resolution electron microscope produced by JEOL. It is designed to provide detailed imaging and analysis of a wide range of samples at the nanoscale level. The EM-2010 utilizes advanced electron optics and detectors to deliver high-quality images and data.
Lab products found in correlation
4 protocols using em 2010 microscope
Multitechnique Nanomaterial Characterization
Synthesis and Characterization of Fucoidan-Coated MnO2 Nanoparticles
Characterization of Magnetic Nanoparticles
Comprehensive Nanoparticle Characterization Protocol
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