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Pixis 400b

Manufactured by Teledyne

The Pixis 400B is a scientific instrument designed for imaging and spectroscopy applications. It features a back-illuminated, scientific-grade CCD sensor with a resolution of 1340 x 400 pixels. The device is capable of capturing images with high sensitivity and low noise levels, making it suitable for a variety of experimental and research settings.

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10 protocols using pixis 400b

1

Dark-field spectroscopy for nanomaterial analysis

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We used our custom-built dark-field spectroscope, in which optical microscope (Nikon Eclipse), imaging spectrometer (IsoPlane, Princeton Instruments), and a CCD camera (PIXIS-400B, Princeton Instruments) are integrated. The incident angle of the broadband light source was 64°; the polarizations were controlled to be s- or p-pol by a polarizer (Thorlabs Inc.). The scattered light was collected using an objective lens with a numerical aperture of 0.9 and was then analyzed with an imaging spectrometer and CCD.
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2

Fluorescence Imaging of Organic Photovoltaics

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The fluorescence from the Structure I was collected by an objective lens (60×, N.A.:0.7, LUCPlanFLN, Olympus) and passed through a confocal pinhole (100 μm) and suitable filters. To detect the fluorescence of the BP, a 405 nm laser was used as an excitation source, and a long-pass filter (LP02-442RU, Semrock) and a short-pass filter (FF01-650/SP, Semrock) were used to cut the excitation laser beam and fluorescence from PC61BM, respectively. The detected fluorescence was split into two paths by a 50/50 beam splitter, and the two paths were detected using a spectrometer (SpectraPro2358, Acton Research Corporation) with a cooled CCD camera (PIXIS400B, Princeton Instruments) and an avalanche single-photon counting module (APD: SPCM-AQR-14, PerkinElmer). The signal from the APD was connected to a time-correlated single-photon counting board (SPC-630, Becker & Hickl) for the fluorescence images.
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3

Structural and Optical Characterization of Thin Films

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All the samples were first characterized by X-ray diffraction (XRD) measurements. The XRD patterns were collected using a Bruker-AXS D8 Advance X-ray diffractometer equipped with Cu Kα ( λ  = 1.5418 Å) X-ray source. The measurement was performed in 2 θ mode between 10° and 50° with step size of 0.02° and the integration time of 1 s per step. The surface morphology and thickness of the films were measured using AFM (Bruker Bioscope Resolve) working in a contact mode. Temperature-dependent absorption measurement was conducted by directing the white light beam generated through a quartz-tungsten-halogen lamp on the films that were kept in a cryostat cooled by liquid nitrogen. The transmitted light was collected by a pair of lenses via an optical fiber coupled by a spectrometer (Acton, Spectra Pro 2500i) and charge coupled device (CCD) (Princeton Instruments, Pixis 400B). For each measurement, transmitted light of a fused silica was collected under the same conditions, that served as a reference.
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4

Photoluminescence characterization of semiconductors

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(Time-integrated) photoluminescence measurements were conducted by directing the excitation laser pulses to SCs or thin films. The laser pulses were generated by a 1-kHz regenerative amplifier (Coherent Libra, 800 nm, 50 fs, 4 mJ). A mode-locked Ti-sapphire oscillator (Coherent Vitesse, 80 MHz) was used for the amplifier. For 800 nm pump, the laser from the regenerative amplifier was directly used. For 400 nm, a BBO crystal was used to double the frequency of 800 nm. The photoluminescence was collected at a backscattering angle by a spectrometer (Acton, Spectra Pro 2500i) and CCD (Princeton Instruments, Pixis 400B). For circular-polarized pump and circular-polarized PL measurements, a quarter-waveplate and polarizer were placed in the path of the excitation beam and another pair of quarter-waveplate and polarizer were placed at the PL detection path. Time-resolved photoluminescence was collected using a streak camera system (Optronis Optoscope), which has an ultimate temporal resolution of 6 ps. For the temperature-dependent PL and TRPL measurements, the crystals were adhered to the cryostat (Janis) copper sample mount with silver paste. The temperature was cooled down using liquid nitrogen.
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5

Raman Imaging Spectroscopy with Nd:YVO4 Laser

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A CW frequency-doubled Nd:YVO4 laser (532 nm, Spectra-Physics, Millenia) was used as a light source for all the experiments. An imaging spectrophotometer (Bunko Keiki, MK-300) equipped with a cooled CCD camera (Princeton Instruments, PIXIS400B) was used for detecting Raman spectra. A total of 400 Raman spectra were measured simultaneously in one exposure. Two edge filters (Semrock, LPD01-532RU-25) were used to separate the laser and the Raman scattering light before the spectrophotometer. A commercial inverted microscope (Nikon, ECLIPSE Ti) was used for mounting the objective lens and sample, and a focus stabilization system (Nikon, Perfect Focus System) was used to keep the focal plane in the sample constant during the measurement. In all Raman imaging experiments, the slit width was set to the Airy size with the centre wavelength (591 nm) detected in the spectrophotometer, which corresponds to a spectral resolution of 3.1 cm−1 at the centre wavelength.
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6

Steady-State Fluorescence Spectroscopy

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The steady-state
fluorescence
spectra and the fluorescence decays were measured using a sample-scanning
inverted confocal microscope (IX-71, Olympus) in combination with
a ps-pulsed laser excitation at 470 nm (10.0 MHz, 90 ps FWHM, PicoQuant).
The laser beam was introduced to the inverted microscope and focused
on the sample by an objective lens (40×, NA 0.75, Olympus). The
fluorescence from the sample was collected by the same objective lens
and passed through a confocal pinhole (100 μm) and a long-pass
filter (LP02-514RU, Semrock) to remove the excitation laser. Subsequently,
half of the fluorescence was detected by a spectrometer (SpectraPro2358,
Acton Research Corporation) equipped with a cooled CCD camera (PIXIS400B,
Princeton Instruments) to measure the fluorescence spectra. The remaining
half of the fluorescence was detected by an avalanche single-photon
counting module (APD: SPCM-AQR-14, PerkinElmer). The signal from the
APD was connected to a time-correlated single-photon counting (TCSPC)
PC board (SPC630, Becker & Hickl) to measure the fluorescence
decays.
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7

Quantum Yield and Lifetime Measurements

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Quantum yield and lifetime measurements were conducted as previously reported.25 (link) Briefly, for quantum yield measurements a MDL-III-980/2W laser from Changchun New Industries was used to excite each sample. The laser was guided into a Labsphere integrating sphere containing the sample. Diffuse emitted light was collected from the sample and led into a Princeton Instruments SP2300 spectrometer and imaged using a Princeton Instruments PIXIS 400B silicon charge-coupled device.
Lifetime measurements were performed using an Edinburgh Instruments FLS980 spectrometer. Emission from various states was monitored using a Hamamatsu R2658P photomultiplier tube. An Opotek HE 355 LD optical parametric oscillator tunable laser operated at 20 Hz was used as the excitation source for all lifetime measurements.
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8

Time-Resolved Photoluminescence Measurement

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Time-integrated photoluminescence measurement was conducted by directing the excitation laser pulses to thin films. The photoluminescence was measured at a backscattering angle of 145° by a pair of two lenses via an optical fiber coupled by a spectrometer (Acton, Spectra Pro 2500i) and CCD (Princeton Instruments, Pixis 400B). Time-resolved photoluminescence was collected using an Optronis Optoscope streak camera system with an ultimate temporal resolution of 10 ps.
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9

Femtosecond Spectroscopy of Thin Films

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For femtosecond optical spectroscopy, the laser source was a Coherent Libra regenerative amplifier (50 fs, 1 KHz, 800 nm) seeded by a Coherent Vitesse oscillator (50 fs, 80 MHz). 800 nm wavelength laser pulses were from the regenerative amplifier while 400 nm wavelength laser pulses were obtained with a BBO doubling crystal. 650-nm laser pulses were generated from a Coherent OPerA-Solo optical parametric amplifier. The laser pulses (circular spot, diameter 2 mm) were directed to the films. The emission from the samples was collected at a backscattering angle of 150° by a pair of lenses into an optical fiber that was coupled to a spectrometer (Acton, Spectra Pro 2500i) and detected by a charge coupled device (Princeton Instruments, Pixis 400B). TRPL was collected using an Optronis Optoscope streak camera system which has an ultimate temporal resolution of around 10 ps.
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10

Steady-State and Time-Resolved PL Analysis

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Time-integrated steady-state PL from the samples was collected at the edge of the film by using a pair of lenses into an optical fiber that was coupled to a spectrometer (Acton, Spectra Pro 2500i) and detected by a charge-coupled device (Princeton Instruments, Pixis 400B). TRPL was measured using an Optronis Optoscope streak camera system.
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