Transmission electron microscopy (TEM; Talos F200S, Thermo Scientific, USA) was employed to determine the morphology and ultrastructure of HMS, PA@HMS, and E/PA@HMS. Scanning TEM equipped with energy dispersive spectroscopy (EDS) was used to examine the mapping patterns of elements. The crystallinity was identified by selected area electron diffraction (SAED). X-ray diffraction (XRD) analysis with small-angle and wide-angle patterns was performed using a PANalytical Empyrean diffractometer (the Netherlands). A Nicolet5700 spectrophotometer (Thermo Scientific, USA) with Fourier transform-infrared spectroscopy (FTIR) was conducted to detect typical functional groups. The pore size distribution and surface area calculated by the Brunauer–Emmett–Teller and Barrett–Joyner–Halenda (BET/BJH) methods were measured using an ASAP2020 analyzer (Micromeritics Corp., USA) with nitrogen adsorption–desorption. A Zetasizer Nano ZSP system (Malvern Instruments, UK) was used to monitor the size distribution and zeta potential. The loading efficiency was inspected using a STA449F3 thermogravimetric analyzer (NETZSCH, Germany) under an N2 environment at a heating rate of 10 °C/min by thermogravimetric analysis (TGA) and derivative thermogravimetry (DTG).
Sta 449f3 thermogravimetric analyzer
Manufactured by Netzsch
Sourced in Germany
The STA 449F3 is a thermogravimetric analyzer (TGA) designed to measure the change in the mass of a sample as a function of temperature or time in a controlled atmosphere. The instrument can be used to analyze a wide range of materials, including polymers, ceramics, and metals, and provides information about their thermal stability, composition, and phase changes.
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Lab products found in correlation
Talos f200, by Thermo Fisher Scientific (1 mentions)
Zetasizer nano zsp system, by Malvern Panalytical (1 mentions)
Nicolet 5700 spectrophotometer, by Thermo Fisher Scientific (1 mentions)
D8 discover diffractometer, by Bruker (1 mentions)
Jsm 6480lv, by JEOL (1 mentions)
D max 2500v pc, by Rigaku (1 mentions)
Tegramin 30, by Struers (1 mentions)
X act, by Oxford Instruments (1 mentions)
X pert pro mpd system, by Malvern Panalytical (1 mentions)
800 ft ir spectrometer, by Agilent Technologies (1 mentions)
Dimension edge microscope, by Bruker (1 mentions)
Miniflex 2, by Rigaku (1 mentions)
Spectrum 100 ftir spectrometer, by PerkinElmer (1 mentions)
6 protocols using sta 449f3 thermogravimetric analyzer
1
Characterization of Hybrid Nanomaterials
2
Characterization of Solidified Soft Soil
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A uniaxial unconfined compressive strength meter (Keji, Nanjing, China) was used to measure the strength of solidified soft soil. Three samples in each group were tested in parallel, and the average value was recorded as the unconfined compressive strength.
The composition was examined by XRD with Bruker D8-Discover diffractometer(Berlin, Germany) using graphite monochromatized high-intensity Cu Kα radiation (λ = 1.5406 Å). The scanning angle range was from 5° to 90° 2θ with the step at 0.2 s·step−1. TG/DTG analysis was obtained from the STA449 F3 thermogravimetric analyzer (Netzsch, Berlin, Germany). The analyses were carried out simultaneously in a nitrogen atmosphere at a heating rate of 10 °C·min−1 between room temperature and 1000 °C.
SEM (FEI Company, Amsterdam, The Netherlands) with a GENESIS 60S energy dispersive X-ray spectroscope (EDS) spectroscopy system and a magnification from 5000 to 10,000 was used to examine morphology and to measure the elemental compositions. The accelerating voltage and spot size of the secondary electron detector were 20 kV and 4.0, respectively. The sample was dried to constant weight in the oven, and it was sprayed with a layer of gold before analysis.
The composition was examined by XRD with Bruker D8-Discover diffractometer(Berlin, Germany) using graphite monochromatized high-intensity Cu Kα radiation (λ = 1.5406 Å). The scanning angle range was from 5° to 90° 2θ with the step at 0.2 s·step−1. TG/DTG analysis was obtained from the STA449 F3 thermogravimetric analyzer (Netzsch, Berlin, Germany). The analyses were carried out simultaneously in a nitrogen atmosphere at a heating rate of 10 °C·min−1 between room temperature and 1000 °C.
SEM (FEI Company, Amsterdam, The Netherlands) with a GENESIS 60S energy dispersive X-ray spectroscope (EDS) spectroscopy system and a magnification from 5000 to 10,000 was used to examine morphology and to measure the elemental compositions. The accelerating voltage and spot size of the secondary electron detector were 20 kV and 4.0, respectively. The sample was dried to constant weight in the oven, and it was sprayed with a layer of gold before analysis.
3
Characterization of CuCl2-based Adsorbents
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The surface properties, structure and composition of synthesized CuCl2-based adsorbents were analyzed by using X-ray diffraction (XRD). XRD analysis was performed using an X-Ray diffractometer system Dmax-2500V/PC, Rigaku, Tokyo, (Japan) operated at 45 kV and 40 mA. All diffractograms were recorded from 10° to 80° 2θ range with Cu Kα radiation as the X-ray source at 1.54 Å wavelength. Temperature programmed reduction (H2-TPR) was used to test the reducibility of the catalysts and was measured on a ChemBET Pulsar TPR/TPD (Quantachrome Instruments, Boynton Beach, FL, USA) equipped with a TCD detector.
The TGA experiment was conducted using NETZSCH STA 449F3 thermogravimetric analyzer (NETZSCH, Selb, Germany). Sample (i-Cu(II)/θ-Al2O3 precursor) was loaded in an Al2O3 crucible and heated to 1000 °C with 5 °C/min ramping rate in 100 mL/min of N2.
To obtain a cross-sectional image of the sample, the sample was first heated to 180 degrees Celsius using Struers pronto press-30. A cross-section of the sample was exposed by polishing the cake with diamond suspension in Struers Tegramin-30, which was located in the middle of the transparent polymer cake. The sample was imaged by SEM and EDS using (SEM, JSM-6480LV; Jeol, Tokyo, Japan) and (EDS; X-act, Oxford Instruments, Oxford, UK), respectively.
The TGA experiment was conducted using NETZSCH STA 449F3 thermogravimetric analyzer (NETZSCH, Selb, Germany). Sample (i-Cu(II)/θ-Al2O3 precursor) was loaded in an Al2O3 crucible and heated to 1000 °C with 5 °C/min ramping rate in 100 mL/min of N2.
To obtain a cross-sectional image of the sample, the sample was first heated to 180 degrees Celsius using Struers pronto press-30. A cross-section of the sample was exposed by polishing the cake with diamond suspension in Struers Tegramin-30, which was located in the middle of the transparent polymer cake. The sample was imaged by SEM and EDS using (SEM, JSM-6480LV; Jeol, Tokyo, Japan) and (EDS; X-act, Oxford Instruments, Oxford, UK), respectively.
4
Synthesis and Characterization of Pyridine-based Dye
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(pyridin-3-yl)methyl 4-(2-(4-((pyridin-3-yl)methoxy)phenyl)diazenyl)benzoate (L1) was prepared according to the literature method [55 (link)]. All other chemicals and reagents were obtained from commercial sources and used as received. Infrared (IR) spectra were recorded with a Varian 800 FT-IR spectrometer (Varian, Inc., Palo Alto, USA) (4000–400 cm−1). Powder X-ray diffraction (PXRD) was performed using a PANalytical X’Pert PRO MPD system (PANalytical B.V., Almelo, Holland).) (PW3040/60). Field emission scanning electron micrographs (SEM) were obtained with a JSM 6701F microscope (Japan Electronics Co., Ltd, Tokyo, Japan). Atomic force microscopy (AFM) images were obtained on a dimension edge microscope (Bruker Nano Inc., Santa Barbara, CA, USA) equipped with a tapping mode. Thermal analyses were performed with a Netzsch STA-449F3 thermogravimetric analyzer (Netzsch, Co., Selb, Germany) at a heating rate of 10 °C min−1 and a flow rate of 20 cm3·min−1 (N2). Simultaneous inductively coupled plasma optical emission spectrometry (ICP-OES) on a PerkinElmer Optima 8000 instrument (PerkinElmer Inc., Waltham, USA) was used for simultaneous determination of the target elements.
5
Characterization of Functionalized Materials
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The swelling degree of materials was performed according to Caetano et al. [17 (link)].
Acid capacities of material were determined by acid–base titration, according to Caetano et al. [17 (link)].
The FTIR spectra were recorded in a Perkin Elmer Spectrum 100 FTIR spectrometer (PerkinElmer, Shelton, WA, USA).
CHNS Elemental Analyzer 1112 series (Thermo Finnigan, San Jose, CA, USA) was used to determine the Sulphur.
NETZSCH STA 449F3 thermogravimetric analyzer (NETZSCH, Selb, Germany) was used to study the thermal stability CH and 4–CH-SO3H.
Zeiss Auriga equipment (Zeiss, Oberkochen, Germany) was used to obtain SEM images.
X-ray diffraction was recorded in a RIGAKU Miniflex II (RIGAKU, Neu-Isenburg, Germany).
Acid capacities of material were determined by acid–base titration, according to Caetano et al. [17 (link)].
The FTIR spectra were recorded in a Perkin Elmer Spectrum 100 FTIR spectrometer (PerkinElmer, Shelton, WA, USA).
CHNS Elemental Analyzer 1112 series (Thermo Finnigan, San Jose, CA, USA) was used to determine the Sulphur.
NETZSCH STA 449F3 thermogravimetric analyzer (NETZSCH, Selb, Germany) was used to study the thermal stability CH and 4–CH-SO3H.
Zeiss Auriga equipment (Zeiss, Oberkochen, Germany) was used to obtain SEM images.
X-ray diffraction was recorded in a RIGAKU Miniflex II (RIGAKU, Neu-Isenburg, Germany).
6
Thermal Analysis of Purified NRFPs
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Thermogravimetric (TG) and differential scanning calorimetry (DSC) of purified NRFPs (2.0 mg) were conducted on an STA-449-F3 thermogravimetric analyzer (Netzsch, Bavaria, Germany) under a protective nitrogen atmosphere (50 mL/min). The heating was carried out ranging from 25 °C to 700 °C with a gradient of 10 °C/min.
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