Jem 3200fs

The high-resolution transmission electron microscopy images of LR-LMO and LMO were obtained from a FEI Titan 80-300ST (with a spherical and chromatic aberration imaging corrector and a JEM-3200FS, JEOL), an aberration-corrected STEM (JEOL ARM 200CF) and an Argonne Chromatic Aberration-corrected TEM (ACAT) (an FEI Titan 80-300ST with an image aberration corrector to compensate for both spherical and chromatic aberrations) at an accelerating voltage of 200 kV.

To visualize ginseng and Arabidopsis exosomes, transmission electron microscopy (TEM) was used. Isolated exosome samples were fixed in 4% paraformaldehyde for one hour, and 5 μL of fixed samples were placed on the carbon support film of a nickel grid and incubated to allow the sample to be adsorbed to the grid. Grids were washed with 60 μL of 2% uranyl acetate. TEM observation was performed using a JEM-2100F Field Emission Transmission Electron Microscope (JEOL Ltd., Japan) at 200 kV and images were captured using an UltraScan 4000 CCD camera (Gatan Inc. USA.). For cryo-transmission electron microscopy observation (Cryo-TEM), 5 μL of the isolated exosome samples were loaded onto copper Quantifoil grids with a 1.2 μm diameter hole and an inter-hole distance of 1.3 μm (Electron Microscopy Sciences, USA). Prior to freezing, the grids were glow discharged for 45 sec on each side. Grids were frozen using a Vitrobot, and the frozen samples were observed using the JEM 3200FS (JEOL Ltd., Japan) transmission electron microscope at 120 kV.

Elution fractions of the recombinant hPER2c were diluted to 0.05mg/ml using the same buffer as in SEC prior to negative staining. For each diluted elution, 4μl of sample was added onto an ultrathin carbon film on Lacey 400 mesh grid (Ted Pella Inc., cat #1824), which was glow discharged using Emitech K950 carbon coater with K350 glow discharge unit for 1.5min with a current of 15mA. The sample was incubated on the grid for 3min while the grid rested about 2.5cm above ice. The excess sample was then blotted using filter paper and stained with 4% Thulium Acetate (Sigma-Aldrich, cat # 367702) for 1.5 mins. The stained sample was then imaged at 300 kV with a 120,000x nominal magnification (calibrated as 137,800x) on a JEOL JEM-3200FS transmission electron microscope equipped with a field emission gun and an in-column omega filter. The micrographs were recorded on a Gatan 4k x 4k UltraScan US4000 CCD camera with defocus values at approximately 2μm. Such TEM analysis were also carried out on the sample treated with DTT for 36hrs for the purpose of visualizing the effects of a reducing environment on the oligomerization of hPER2c.

Structures and elemental compositions of the tungsten oxide nanowires and the as-prepared small-diameter WS₂ nanotubes were evaluated by TEM with EDS (JEM-3200FS, JEM2100F, and JEM2010F, JEOL Ltd.), FESEM (JSM-7100F JEOL Ltd.), XRD (Rigaku SmartLab) with Cu K_α1 (1.5406 Å) radiation, XPS (JPS-9010, JEOL Ltd.) and Raman spectroscopy (532 nm excitation, WItec).

The topographies and thicknesses of exfoliated nanosheets (InSe, graphene, h-BN) and films of PMMA and Al₂O₃ were identified by an optical microscope (Nikon Y-IDP) and AFM (Dimension ICON system, Bruker, Billerica, MA, USA). Raman and PL spectra of InSe nanosheets were collected by using a WITec Alpha 300R (Oxford Instruments, Abingdon, UK) confocal microscope spectrometer with an excitation laser of 532 nm. TEM sample was prepared by using the focused ion beam (FIB) system (FEI, Scios, Hopewell Township, NJ, USA). To protect the selected region from ion damage, a layer of 500 nm Pt and another layer of 2 μm Pt were successively deposited on the h-BN/InSe/h-BN heterostructure before FIB milling. The prepared cross-sectional slice was then transferred and attached to a TEM grid. TEM and EDS mapping images were performed on a JEOL JEM-3200FS operated at an accelerating voltage of 300 kV and equipped with an EDS detector.
The electrical properties of the InSe devices were measured in a probe station (Lakeshore, TTPX, Thebarton, Australia) in vacuum, using a Keithley (4200-SCS, Cleveland, OH, USA) semiconductor parameter analyzer. Photo-response was triggered by a supercontinuum white-light laser source (SC400-8, Fianium Ltd., Southampton, UK) coupled with a monochromator. The laser intensity was measured with a commercial Thorlabs power meter.

The micro-structural properties and morphologies of the synthesized products were observed by X-ray diffraction (XRD, D/MAX-Ultima, Cu Kα source, 2° min⁻¹ scanning rate and the scanning angle from 10° to 80° as well as the power was 40 kV and 40 mA, Rigaku, Tokyo, Japan), scanning electron microscopy (SEM, ZEISS Gemini 500, Carl Zeiss AG, Oberkochen, Germany), transmission electron microscopy (TEM, JEM-3200FS, JEOL, Tokyo, Japan), high-resolution transmission electron microscopy (HRTEM, JEM-2100F, JEOL, Tokyo, Japan). Besides, X-ray photoelectron spectroscopy and Brunauer–Emmett–Teller analysis were carried out using XPS, ESCALAB 250XI, Thermo Fisher Scientific, Waltham, MA, USA and BET, ASAP2010C instrument, Norcross GA, USA, respectively.