Icp oes
ICP-OES is an analytical technique used for the detection and quantification of trace elements in a variety of sample types. It utilizes an inductively coupled plasma as the excitation source and an optical emission spectrometer for the detection of the emitted light. ICP-OES provides multi-element analysis capabilities with high sensitivity and wide linear dynamic range.
Lab products found in correlation
7 protocols using icp oes
Centrifugation and Ion Concentration Analysis
Determination of Total and Active Iron
The concentration of active Fe was also analyzed by ICP-OES following extraction of 100 mg (±5) ground shoot sample in 10 mL of 1 N HCl for 2 h at 120 rpm (Takkar & Kaur 1984) (link).
Synthesis of Pt/Al2O3 Catalysts
Comprehensive Characterization of Material Samples
X-ray diffraction (XRD) of various samples was characterized on a
Miniflex600 (Rigaku, Japan) equipped with Cu Kα radiation
(40 kV, 15 mA), and the data were collected in the two-theta range
of 5–50° with a scan rate of 5°/min. Scanning electron
microscopy (SEM, Apreo S LoVac, Czech) was used for imaging the morphology
of the samples, with the acceleration voltage set to 2.0 kV. Fourier
transform infrared (FTIR) spectra were recorded on a Nicolet iS 50
FTIR instrument with a DTGS KBr detector, by averaging over 32 scans
with a data interval of 0.482 cm–1. Thermogravimetric
analysis (TGA) was conducted from room temperature to 800 °C
on a TGA/DSC-1 instrument (Mettler Toledo, Switzerland) in an Ar atmosphere
with a heating rate of 10 °C/min. The ratio between iron and
cerium in the sample was determined by inductively coupled plasma
optical emission spectrometry (ICP-OES, Horiba Jobin Yvon, France).
X-ray photoelectron spectroscopy (XPS) was performed on an AXIS SUPRA
(Kratos, UK) with an Al anode. The XPS data was analyzed by the XPSPEAK41
software.
Comprehensive Analytical Techniques for Nanoparticle Characterization
Seawater Evaporation Performance Evaluation
Characterization of Functionalized Semiconductor Nanocrystals
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