The eyes were enucleated and fixed with 2.5% glutaraldehyde and 2.5% paraformaldehyde (in 0.1 M cacodylate buffer, pH 7.4) for TEM. The anterior segment and vitreous humor were removed. The eyecups with the retina, RPE, and choroid were fixed with 1% osmium tetroxide in a 0.1 M cacodylate buffer (pH 7.4). The fixed eyecups were dehydrated with gradient alcohols and embedded in Poly/Bed 812 resin. Next, 70-nanometer ultrathin sections were cut with a Leica EM UC 7 microtome and stained with uranyl acetate and lead citrate. The stained specimens were analyzed with a Hitachi H-7600 TEM instrument (Hitachi Co. Ltd., Tokyo, Japan).
H 7600 tem instrument
Manufactured by Hitachi
Sourced in Japan
The H-7600 TEM instrument is a transmission electron microscope (TEM) designed and manufactured by Hitachi. The core function of the H-7600 TEM is to provide high-resolution imaging and analysis of samples at the nanoscale level.
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Lab products found in correlation
3 protocols using h 7600 tem instrument
1
Ultrastructural Analysis of Retinal Tissues
2
Ultrastructural Analysis of Retina
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Eyes were enucleated and fixed with 2.5% glutaraldehyde and 2.5% paraformaldehyde (in 0.1M cacodylate buffer, pH 7.4) for TEM. The anterior segment and vitreous humor were removed. The eyecups with the retina, RPE and choroid were fixed with 1% osmium tetroxide in 0.1M cacodylate buffer (pH7.4). The fixed eyecups were dehydrated with gradient alcohols and embedded in Poly/Bed 812 resin. 70-nanometer ultrathin sections were cut with a Leica EM UC 7 microtome and stained with uranyl acetate and lead citrate. The stained specimens were analyzed with a Hitachi H-7600 TEM instrument (Hitachi Co. Ltd., Tokyo, Japan).
3
Nanoparticle Characterization via TEM
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Transmission
electron microscopy (TEM) images were collected with a Hitachi H-7600
TEM instrument at 100 kV. CF300-copper grids and Fontax #16 tweezers
obtained from Electron Microscope Sciences were washed in IPA immediately
prior to use. A nanoparticle colloid (5 μL) was added to a copper
carbon mesh grid followed by 3 μL of IPA to break the surface
tension. The tweezers, holding the grid, were then placed in a vacuum
chamber for 15 min. The sample was then removed from the chamber and
allowed to dry for an additional 30 min at room temperature before
use in the TEM. The analysis of the particle and corona layer size
was performed using the ImageJ analyze particle function.
electron microscopy (TEM) images were collected with a Hitachi H-7600
TEM instrument at 100 kV. CF300-copper grids and Fontax #16 tweezers
obtained from Electron Microscope Sciences were washed in IPA immediately
prior to use. A nanoparticle colloid (5 μL) was added to a copper
carbon mesh grid followed by 3 μL of IPA to break the surface
tension. The tweezers, holding the grid, were then placed in a vacuum
chamber for 15 min. The sample was then removed from the chamber and
allowed to dry for an additional 30 min at room temperature before
use in the TEM. The analysis of the particle and corona layer size
was performed using the ImageJ analyze particle function.
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