The surface structure of the materials was observed using scanning electron microscopy (SEM) (Quanta FEG; Thermo Fisher Scientific Inc., Waltham, MA, USA). The phase analysis and molecular structure of anodes were characterized using X-ray diffraction (XRD) (Rigaku D/Max 2500 PC; Rigaku Corporation, Tokyo, Japan), Raman spectroscopy (Raman) (inVia-Reflex03040405; Renishaw, London, UK), and energy-dispersive spectroscopy (EDS) (Quanta FEG; Thermo Fisher Scientific Inc., Waltham, MA, USA). The element composition and content of N species of materials were obtained with X-ray photoelectron spectroscopy (XPS) using a K−Alpha anode (Thermo Scientific, Waltham, MA, USA). The morphology of biofilms was characterized via SEM. Before SEM observation, the bacteria were fixed by paraformaldehyde and dehydrated using various ethanol solutions. The survival status of the biofilms on anode were researched using a confocal laser scanning microscope (CLSM) (LSM 880 NLO with Fast Airyscan, Carl Zeiss AG, Oberkochen, Germany).
Quanta feg
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Quanta FEG is a field emission scanning electron microscope (FE-SEM) manufactured by Thermo Fisher Scientific. It is designed to provide high-resolution imaging and analysis of a wide range of sample types. The Quanta FEG utilizes a field emission electron gun to generate a focused electron beam, enabling detailed observation and characterization of samples at the nanoscale level.
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Lab products found in correlation
Malvern nano zs, by Malvern Panalytical (2 mentions)
Mastersizer 2000, by Malvern Panalytical (1 mentions)
P 2000, by Sutter Instruments (1 mentions)
Q100 70 7, by Sutter Instruments (1 mentions)
Sic paper, by Buehler (1 mentions)
Ultra plus sem, by Zeiss (1 mentions)
Hyperprobe jxa 8500f, by JEOL (1 mentions)
D8 advance, by Bruker (1 mentions)
Tem grid, by Electron Microscopy Sciences (1 mentions)
Xl30 sfeg, by Thermo Fisher Scientific (1 mentions)
Quanta 250 feg, by Thermo Fisher Scientific (1 mentions)
D max 2500 pc, by Rigaku (1 mentions)
13 protocols using quanta feg
1
Comprehensive Characterization of Anode Materials and Biofilms
2
Characterization of PLGA Nanoparticles and Microparticles
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The particle size, polydispersity (PDI) and zeta potential of the PLGA nanoparticles was determined using a Malvern nano ZS (Malvern PANalytical, Worcestershire, UK). Samples were previously diluted in filtered Tris buffer (10 mM, pH 7.4) to obtain a final concentration of 0.25 mg/mL in the cuvette (1/20 dilution). Malvern Dispersion Technology Software (DTS) v.7.12 was used for data analysis and collection. The particle size and size distribution (SPAN) of the PLGA microparticles was determined by laser diffraction analysis using a Mastersizer 2000 (Malvern PANalytical, Worcestershire, UK). Samples were dispersed in water into the sample dispersion cell unit while stirring at 2000 rpm until above 10% obscuration was obtained. PLGA refractive index was set at 1.43 and three measurements of each sample were recorded every 12 s. Scanning electron microscopy (SEM) was used for the morphological particle analysis and to compare the particle size and size distribution of the nano- and microparticles. This procedure was carried out externally by David McCarthy (DMmicroscopy). Images were taken on a FEI Quanta FEG, Eindhoven, The Netherlands. The voltage used is shown at the foot of each image, usually 5 or 8 KV.
3
Serial Block-Face Scanning Electron Microscopy of Optic Nerve Heads
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The ONHs were washed in cacodylate buffer for 2 h at 4°C and placed in cacodylate buffer containing 2% OsO4/1.5% potassium ferrocyanide for 3 h at RT. After several washing steps, the ONHs were dehydrated in a series of ice-cold ethanol solutions followed by ice-cold dry acetone for 10 min. The ONHs were placed in acetone at RT for 10 min and then infiltrated with an ascending series of Durcupan:acetone solutions. The ONHs were infiltrated with 100% Durcupan and then cured at 60°C for 2 days. The ONHs were trimmed to remove excess plastic and attached to an aluminum pin, grounded with silver paint, and sputter coated with gold–palladium before imaging. Specimens were imaged on a FEI Quanta FEG equipped with a 3View serial block-face scanning electron microscopy (SBEM) system (Gatan, Pleasanton, CA). Specimens were imaged at high vacuum with 2.5-kV beam current and 70-nm sectioning thickness. A 2D montage was collected at each Z plane to increase field of view. Volumes were processed and analyzed using IMOD software (http://bio3d.colorado.edu/imod/ ; Kremer et al., 1996 (link)) and stereology was performed using a custom plug-in for IMOD (Hatori et al., 2012 (link)).
4
Characterization of Polymer Nanoparticles
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The particle size and zeta potential of the polymer nanoparticles were determined by dynamic light scattering (DLS) using a Malvern nano ZS (Malvern PANalytical, Worcestershire, UK). Three measurements at 25 °C were conducted on the samples, which were previously diluted in filtered Tris buffer (10 mM, pH 7.4) to achieve the optimal particle concentration (0.25 mg/mL) with the optimum attenuator number (att. 6–7). To prove the applicability of the microfluidics method for continuous manufacturing, an AT-line Malvern sizer was used to measure the PLGA nanoparticles. The system was run at the following: 0.5 mL/min sample flow rate, 10 mL/min diluent flow rate and 90 s delay time between measurements. To consider morphology, scanning electron microscopy (SEM) was used to visualise the polymer nanoparticles. These were fixed and air dried onto a metal stub and then coated with gold and observed under the microscope. This procedure was carried out by David McCarthy from DMmicroscopy. Images were taken on a FEI Quanta FEG, Eindhoven, the Netherlands. The voltage used is shown at the foot of each image, usually 5 or 8 KV.
5
Quartz Glass Pipette Fabrication
6
Silver Nanoleakage Assessment of Resin-Dentin Interface
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Two resin-dentin sticks from each subgroup were assessed for silver nanoleakage according to the protocol of Tay et al. (2002) [25 (link)], using a 50% ammoniacal silver nitrate solution. Briefly, specimens were immersed in tracer silver solution for 24 h in darkness, rinsed with distilled water and immersed in photodeveloping solution for 8 h under fluorescent light. They were then embedded in epoxy resin and polished with SiC papers up to 4000-grit and 1-µm diamond paste (Buehler, Lake Bluff, IL, USA) in polishing cloths. The specimens were cleaned for 5 min in an ultrasonic bath after each polishing step and dehydrated for 24 h in a silica gel incubator at 37 °C. They were gold-sputter coated and analyzed using field-emission-gun scanning electron microscopy (Quanta FEG, FEI, Amsterdam, The Netherlands) in backscattered electron mode.
7
Scanning Electron Microscopy Analysis of Hair
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The ten hairs (numbers 1-10)of red colour [6] of Maria-Magdalena studied were loaded on sterile dedicated scotch-tapes (Figure 1). They were examined further by Scanning Electron Microscopy (SEM), for the SDs deposited on their hair surfaces. Some of the hairs were examined in confocal stereoscopic micrography. All the ten hairs were examined by the SEM apparatus FEI model Quanta FEG (an environmental electron microscope apparatus). Elemental analyses were achieved by using Energy Dispersive X-ray spectroscopy (EDX), the SEM microscope used being equipped with the probe model X-flash 6/30. Both LFD (Large Field Detector) and CBS (Circular Back Scattering) procedures were used, the last one to better detecting heavy elements.
Each elemental analysis is given in the form of a spectrum, with kiloelectrons / Volts (ke/V) on the abscissa and elemental peak heights (cps/eV) in ordinates. High resolution spectra are obtained by enhancing the cps/eV values along to the ordinates axis.
EDX-mapping were obtained (power : 20 kV ; distance : 9.9 mm ; acquisition time : 15 min.) for the main elements of the SDs : carbon, oxygen, sulphur, calcium and chlorine.
Each elemental analysis is given in the form of a spectrum, with kiloelectrons / Volts (ke/V) on the abscissa and elemental peak heights (cps/eV) in ordinates. High resolution spectra are obtained by enhancing the cps/eV values along to the ordinates axis.
EDX-mapping were obtained (power : 20 kV ; distance : 9.9 mm ; acquisition time : 15 min.) for the main elements of the SDs : carbon, oxygen, sulphur, calcium and chlorine.
8
FESEM Characterization of MNP-CLEA-Lipase
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Field Emission Scanning Electron Microscopy (FESEM) analyses were conducted to analyze the structure of MNP-CLEA-lipase. The appearance of the sample could either be spherical (Type 1) or lessstructured (Type 2). 29 MNP-CLEA-lipase and non-functionalized MNP samples were sent to Crest Nanosolutions (M) Sdn. Bhd., Puchong, Selangor, for FESEM analysis. The FESEM was operated at 10 kV using FEI Quanta FEG. The samples were dried and placed on an aluminium stab, then coated with gold particles before being scanned under vacuum.
9
Microscopy Analysis of Spinels
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Transmitted and reflected light microscopy on thin sections was performed on Leitz polarisation microscopes at German Research Centre for Geoscience (GFZ, Potsdam) and Karlsruhe Institute of Technology (KIT). Scanning electron microscopy (SEM), back-scatter electron (BSE) imaging with acceleration voltage of 20 kV (ZEISS Ultra Plus SEM), and initial mineral characterization by energydispersive X-ray (EDX) analysis and electron microprobe analysis (JEOL Hyperprobe JXA-8500F with 15 kV) were done at GFZ. For the latter, well-characterized natural and synthetic standards were used for calibration: chromia (Cr), diopside (Si, Mg), ferric oxide (Fe), gahnite (Al), ilmenite (Ti), nickel monoxide (Ni), rhodonite (Mn), and tugtupite (Na). Further investigations at KIT included BSE imaging (FEI Quanta FEG with 10 kV). Spinel formulae were calculated from cation and Fe 2 O 3 content assuming stoichiometric composition in relation to anions (cation/anion = 3/4).
10
Quantitative Elemental Analysis of Tetrahedrites
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The chemical compositions of the samples were determined by energy and wavelength dispersive X-ray spectroscopy (EDXS/WDXS) using a JEOL J7600F instrument. CuFeS2, ZnS, Co, Sb, Te were used as standards to measure the Cu, S, Co, Sb and Te concentrations, respectively. In average, 15 spots measured on the surface of each samples were collected.
The actual chemical compositions, listed in Table 1, were obtained by normalizing the S contents to 13 sulfur atoms. Hereafter, the actual Co and Co-Te contents will be used to label the samples of each series.
Phase purity and elemental mappings were conducted by powder X-ray diffraction (PXRD) and scanning electron microscopy (SEM). Phase purity of the samples was assessed by PXRD with a Bruker D8 Advance diffractometer using CuKα1 radiation ( = 1.54056 Å).
The room-temperature lattice parameters were determined by Rietveld refinements using the Fullprof software (Ref. 25) and are listed in Table 2. The chemical homogeneity of the samples was verified by SEM experiments using a Quanta FEG (FEI). In order to contrast impurity phases from the tetrahedrite phase, images of the sample's surface were collected in backscattered electron mode (BSE). The spatial distribution of the elements was determined by elemental X-ray mapping.
The actual chemical compositions, listed in Table 1, were obtained by normalizing the S contents to 13 sulfur atoms. Hereafter, the actual Co and Co-Te contents will be used to label the samples of each series.
Phase purity and elemental mappings were conducted by powder X-ray diffraction (PXRD) and scanning electron microscopy (SEM). Phase purity of the samples was assessed by PXRD with a Bruker D8 Advance diffractometer using CuKα1 radiation ( = 1.54056 Å).
The room-temperature lattice parameters were determined by Rietveld refinements using the Fullprof software (Ref. 25) and are listed in Table 2. The chemical homogeneity of the samples was verified by SEM experiments using a Quanta FEG (FEI). In order to contrast impurity phases from the tetrahedrite phase, images of the sample's surface were collected in backscattered electron mode (BSE). The spatial distribution of the elements was determined by elemental X-ray mapping.
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