2450 spectrometer

The UV-Visible absorption spectra were recorded using a Shimadzu 2450 – SHIMADZU spectrometer. The sample was diluted with deionized water and it was introduced into a UV-Visible Shimadzu 2450 – SHIMADZU spectrometer for characterization of a sample. X-ray diffraction (XRD) patterns were recorded using a PANalytical X'pert pro diffractometer at 0.020 s⁻¹ scan rate with Cu-kα radiation (1.5406 Å, 45 kV, 40 mA) and 2θ ranging from 10° to 90°. The powder samples were thoroughly mixed with KBr and pressed into thin pellets for measuring the Fourier transform-infrared (FTIR) spectra of the samples. The readings were recorded over the range of 400–4000 cm⁻¹. Transmission electron microscopy images were obtained at an accelerating voltage of 200 kV (transmission electron microscope from JEOL, Japan). Scanning electron microscopy (Hitachi – scanning electron microscope S-3700N) images were acquired with an electron probe analyzer.

The UV-Visible (UV-Vis) absorption spectra were recorded using a Shimadzu 2450 – SHIMADZU spectrometer. Fourier transform-infrared (FTIR) spectra were recorded over the range of 400–4000 cm⁻¹ using a SHIMADZU-IR PRESTIGE-2 Spectrometer. Powder samples were mixed thoroughly with KBr and pressed into thin pellets. X-ray diffraction (XRD) patterns were recorded by PANalytical X'pert pro diffractometer at 0.02 degree per s scan rate using Cu-K_α1 radiation (1.5406 A0, 45 kV, 40 mA). Transmission electron microscopy images were obtained (TEM model FEI TECNAI G2 S-Twin) at an accelerating voltage of 120 and 200 kV. The morphologies of the samples were characterized using field emission scanning electron microscopy (FESEM, Zeiss Ultra-60) equipped with X-ray energy dispersive spectroscopy (EDS).