Uv 1600 spectrometer

Fluorescence measurements were characterized using a F-97 fluorescence spectrophotometer (Shanghai Lengguang Technology, China). A JEM-2010 instrument (Jeol Ltd., Tokyo, Japan) equipped with an energy dispersive spectroscope (EDS) at 200 kV was used to investigate the transmission electron microscopy (TEM). Scanning electron microscopy (SEM) images were obtained using a Hitachi S-4800 FE-SEM instrument (Hitachi Chemical Company, Ltd., Tokyo, Japan). X-ray diffraction (XRD) measurements were investigated on a Bruker D8 FOCUS diffractometer using Cu Kα radiation (Billerica, MA, USA). UV-Vis spectroscopy was studied using a UV-1600 spectrometer (Shimadzu Scientific Instruments Inc., Columbia, MD, USA). Inductively coupled plasma mass spectrometry (ICP-MS) was studied by a Thermo Scientific instrument (Waltham, MA, USA).

The following instruments were used to obtain spectroscopic data: specific rotations, Horiba SEPA-300 digital polarimeter (l = 5 cm); UV spectra, Shimadzu UV-1600 spectrometer; IR spectra, Shimadzu FTIR-8100 spectrometer; FAB-MS and high-resolution MS, JEOL JMS-SX 102A mass spectrometer; ESIMS and HRESIMS, Exactive Plus mass spectrometer (Thermo Fisher Scientific Inc., MA, USA); ¹H-NMR spectra, JEOL JNM-ECA600 (600 MHz) and JNM-ESC400 (400 MHz) spectrometers; ¹³C-NMR spectra, JEOL JNM-ECA600 (150 MHz) and JNM-ESC400 (100 MHz) spectrometers, with tetramethylsilane as an internal standard; HPLC detector, Shimadzu SPD-10Avp UV-VIS detectors; and HPLC column, Cosmosil 5C₁₈-MS-II (Nacalai Tesque Inc.). The following experimental conditions were used for column chromatography (CC): ordinary-phase silica gel CC, silica gel 60N (Kanto Chemical Co., Tokyo, Japan; 63–210 mesh, spherical, neutral), normal-phase thin-layer chromatography (TLC), pre-coated TLC plates with silica gel 60F₂₅₄ (Merck, Darmstadt, Germany; 0.25 mm), with detection achieved by spraying with 1% Ce(SO₄)₂–10% aqueous H₂SO₄, and followed by heating.