Atomic force microscopy (AFM) images were obtained with a Digital Instrument Nanoscope III microscope with a tapping mode. X-ray diffraction (XRD) patterns were recorded with a Rigaku RINT-1000 diffractometer (Mn-filtered FeKα radiation) operating at a voltage of 40 kV, and a current of 30 mA, with a scan speed of 2.00° min−1, and a step width of 0.02°. Inductively coupled plasma (ICP) emission spectrometry experiments were performed using of a Varian VISTA MPX CCD Simultaneous ICP OES instrument. Proton nuclear magnetic resonance (NMR) was performed with a JEOL JNM-ECX500. A sample was dissolved in deuterated chloroform and measured. Scanning electron microscopy (SEM) images were acquired with a JEOL IT-100 LA. Transmission electron microscopy (TEM) images were obtained with JEOL JEM-1011 microscope operating at 100 kV. The sample was dropped onto a carbon grid and vacuum dried. Thermogravimetry was performed with a Thermo plus 8120/EVO2 equipment in the range 20–800 °C at a heating rate of 10.0 °C min−1 under an air flow.
It 100 la
Manufactured by JEOL
The IT-100 LA is an electron beam lithography system designed for high-resolution nanoscale patterning. It features an electron beam column that delivers a focused electron beam for direct write lithography on various substrates. The core function of the IT-100 LA is to enable the precise and controlled exposure of resist materials for the fabrication of nanostructures and devices.
Automatically generated - may contain errors
Lab products found in correlation
2 protocols using it 100 la
1
Comprehensive Characterization of Novel Material
2
Characterization of Layered Double Hydroxides
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XRD patterns
were obtained
with a Rigaku Rint-2500 diffractometer under the following conditions:
40 kV, 30 mA, and Cu Kα radiation. The powder samples were recorded
with a step of 0.04°(2θ) in the range from 1.5 to 80°
with a scanning rate of 0.5°/min. FTIR spectra were obtained
with an FT/IR-460 Plus spectrometer (JASCO) using the KBr disk method.
The morphology of the LDH sheets was investigated using scanning electron
microscopy (SEM, JEOL IT-100 LA). TG analyses were determined using
a TG8120 thermobalance (Rigaku) with a heating rate of 10 °C/min
under air flow. The UV–vis absorption spectra of the solutions
were collected on a Shimadzu UV-3100PC spectrophotometer with the
measurement range between 190 and 320 nm. UV analyses on solid samples
(powder form) were performed on a Jasco V-750 spectrophotometer with
the wavelength range between 190 and 900 nm and the use of BaSO4 as a reference. The solution and solid-state fluorescence
spectra were recorded on a Jasco V-750 spectrophotometer with the
use of an excitation wavelength at 450 nm.
were obtained
with a Rigaku Rint-2500 diffractometer under the following conditions:
40 kV, 30 mA, and Cu Kα radiation. The powder samples were recorded
with a step of 0.04°(2θ) in the range from 1.5 to 80°
with a scanning rate of 0.5°/min. FTIR spectra were obtained
with an FT/IR-460 Plus spectrometer (JASCO) using the KBr disk method.
The morphology of the LDH sheets was investigated using scanning electron
microscopy (SEM, JEOL IT-100 LA). TG analyses were determined using
a TG8120 thermobalance (Rigaku) with a heating rate of 10 °C/min
under air flow. The UV–vis absorption spectra of the solutions
were collected on a Shimadzu UV-3100PC spectrophotometer with the
measurement range between 190 and 320 nm. UV analyses on solid samples
(powder form) were performed on a Jasco V-750 spectrophotometer with
the wavelength range between 190 and 900 nm and the use of BaSO4 as a reference. The solution and solid-state fluorescence
spectra were recorded on a Jasco V-750 spectrophotometer with the
use of an excitation wavelength at 450 nm.
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